DE69520265D1 - Ferroelektrische Speicherzelle und ihre Lese- und Schreibeverfahren - Google Patents

Ferroelektrische Speicherzelle und ihre Lese- und Schreibeverfahren

Info

Publication number
DE69520265D1
DE69520265D1 DE69520265T DE69520265T DE69520265D1 DE 69520265 D1 DE69520265 D1 DE 69520265D1 DE 69520265 T DE69520265 T DE 69520265T DE 69520265 T DE69520265 T DE 69520265T DE 69520265 D1 DE69520265 D1 DE 69520265D1
Authority
DE
Germany
Prior art keywords
reading
memory cell
ferroelectric memory
writing processes
writing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69520265T
Other languages
English (en)
Other versions
DE69520265T2 (de
Inventor
Atsushi Yamashita
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Publication of DE69520265D1 publication Critical patent/DE69520265D1/de
Application granted granted Critical
Publication of DE69520265T2 publication Critical patent/DE69520265T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/22Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/56Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
    • G11C11/5657Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using ferroelectric storage elements

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Dram (AREA)
  • Semiconductor Memories (AREA)
  • Read Only Memory (AREA)
DE69520265T 1994-12-27 1995-12-27 Ferroelektrische Speicherzelle und ihre Lese- und Schreibeverfahren Expired - Fee Related DE69520265T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP32344494A JPH08180673A (ja) 1994-12-27 1994-12-27 強誘電体メモリセル及びそのアクセス装置

Publications (2)

Publication Number Publication Date
DE69520265D1 true DE69520265D1 (de) 2001-04-12
DE69520265T2 DE69520265T2 (de) 2001-09-27

Family

ID=18154741

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69520265T Expired - Fee Related DE69520265T2 (de) 1994-12-27 1995-12-27 Ferroelektrische Speicherzelle und ihre Lese- und Schreibeverfahren

Country Status (5)

Country Link
US (1) US5668754A (de)
EP (1) EP0720172B1 (de)
JP (1) JPH08180673A (de)
KR (1) KR0182813B1 (de)
DE (1) DE69520265T2 (de)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100270147B1 (ko) * 1996-03-01 2000-10-16 니시무로 타이죠 액정표시장치
DE19830569C1 (de) * 1998-07-08 1999-11-18 Siemens Ag FeRAM-Anordnung
JP3239109B2 (ja) 1998-08-28 2001-12-17 株式会社半導体理工学研究センター 強誘電体不揮発性メモリとその読み出し方法
JP3377762B2 (ja) 1999-05-19 2003-02-17 株式会社半導体理工学研究センター 強誘電体不揮発性メモリ
DE10010288C1 (de) * 2000-02-25 2001-09-20 Infineon Technologies Ag Verfahren zur Herstellung einer ferroelektrischen Kondensatoranordnung
JP2002083495A (ja) * 2000-06-30 2002-03-22 Seiko Epson Corp 半導体集積回路の情報記憶方法、半導体集積回路、その半導体集積回路を多数備えた半導体装置、及びその半導体装置を用いた電子機器
KR100382546B1 (ko) * 2000-12-04 2003-05-09 주식회사 하이닉스반도체 불휘발성 강유전체 메모리 장치 및 그를 이용한 불량셀검출방법
JP2002269973A (ja) 2000-12-28 2002-09-20 Seiko Epson Corp 強誘電体メモリ装置およびその駆動方法
TW571403B (en) * 2001-06-22 2004-01-11 Matsushita Electric Ind Co Ltd Semiconductor device and the driving method
JP2003233984A (ja) * 2001-12-04 2003-08-22 Sanyo Electric Co Ltd メモリ装置
KR100487417B1 (ko) * 2001-12-13 2005-05-03 주식회사 하이닉스반도체 불휘발성 강유전체 메모리 장치 및 그를 이용한멀티플-비트 데이타의 라이트 및 리드 방법
DE10219396A1 (de) * 2002-04-30 2003-11-20 Infineon Technologies Ag Speicherzelle, Halbleiterspeichereinrichtung sowie Verfahren für deren Betrieb
KR100487920B1 (ko) * 2002-09-06 2005-05-06 주식회사 하이닉스반도체 불휘발성 강유전체 메모리 장치
US7035439B2 (en) * 2003-07-30 2006-04-25 Xerox Corporation System and method for measuring and quantizing document quality
US6953974B2 (en) * 2003-08-26 2005-10-11 Texas Instruments Incorporated EEPROM device and method for providing lower programming voltage
US7196924B2 (en) * 2004-04-06 2007-03-27 Macronix International Co., Ltd. Method of multi-level cell FeRAM
DE102005008392B4 (de) * 2005-02-24 2008-07-31 Infineon Technologies Ag FeRAM-Speicherzelle, FeRAM-Speicherschaltung und Verfahren zum Speichern eines Datumwertes in einer FeRAM-Speicherzelle
JP2007123528A (ja) * 2005-10-27 2007-05-17 Sanyo Electric Co Ltd メモリ
US7936597B2 (en) * 2008-03-25 2011-05-03 Seagate Technology Llc Multilevel magnetic storage device
US8098520B2 (en) * 2008-04-25 2012-01-17 Seagate Technology Llc Storage device including a memory cell having multiple memory layers
US9219225B2 (en) 2013-10-31 2015-12-22 Micron Technology, Inc. Multi-bit ferroelectric memory device and methods of forming the same
DE102015015854B4 (de) * 2015-12-03 2021-01-28 Namlab Ggmbh Integrierte Schaltung mit einer ferroelektrischen Speicherzelle und Verwendung der integrierten Schaltung
US11586885B2 (en) * 2019-04-01 2023-02-21 Taiwan Semiconductor Manufacturing Company, Ltd. Synapse-inspired memory element for neuromorphic computing

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3913080A (en) * 1973-04-16 1975-10-14 Electronic Memories & Magnetic Multi-bit core storage
CA1340340C (en) * 1987-06-02 1999-01-26 Joseph T. Evans, Jr. Non-volatile memory circuit using ferroelectric capacitor storage element
JP3169599B2 (ja) * 1990-08-03 2001-05-28 株式会社日立製作所 半導体装置、その駆動方法、その読み出し方法
US5530667A (en) * 1991-03-01 1996-06-25 Olympus Optical Co., Ltd. Ferroelectric memory device
JPH07122661A (ja) * 1993-10-27 1995-05-12 Olympus Optical Co Ltd 強誘電体メモリ装置

Also Published As

Publication number Publication date
JPH08180673A (ja) 1996-07-12
KR960025722A (ko) 1996-07-20
EP0720172B1 (de) 2001-03-07
KR0182813B1 (ko) 1999-04-15
EP0720172A2 (de) 1996-07-03
DE69520265T2 (de) 2001-09-27
US5668754A (en) 1997-09-16
EP0720172A3 (de) 1998-06-10

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee