JP2837367B2
(ja)
*
|
1995-02-16 |
1998-12-16 |
日新製鋼株式会社 |
連続熱処理炉、連続真空蒸着設備等の区画出入口のシール装置
|
US5668709A
(en)
*
|
1995-03-02 |
1997-09-16 |
International Business Machine Corporation |
Switched capacitor current source
|
JP3424549B2
(ja)
*
|
1998-04-10 |
2003-07-07 |
横河電機株式会社 |
スイッチトキャパシタ回路
|
US6333674B1
(en)
|
2001-03-15 |
2001-12-25 |
Kim Dao |
Feedback stabilization apparatus and methods
|
GB2393055B
(en)
*
|
2002-09-10 |
2006-08-30 |
Wolfson Ltd |
Transconductance amplifiers
|
US6883936B2
(en)
*
|
2002-10-15 |
2005-04-26 |
Delaware Capital Formation, Inc. |
Shutter apparatus, curing lamp housing incorporating same, and method of shutter replacement
|
US7161419B2
(en)
|
2003-11-12 |
2007-01-09 |
Seiko Npc Corporation |
Sensor device and a signal amplification device of a small detection signal provided by the sensor
|
JP2006303601A
(ja)
*
|
2005-04-15 |
2006-11-02 |
Sony Corp |
相関二重サンプリング回路およびこれを用いた固体撮像装置
|
US7365597B2
(en)
*
|
2005-08-19 |
2008-04-29 |
Micron Technology, Inc. |
Switched capacitor amplifier with higher gain and improved closed-loop gain accuracy
|
US7466194B2
(en)
*
|
2006-05-18 |
2008-12-16 |
Cirrus Logic, Inc. |
DC offset mitigation in a single-supply amplifier
|
FI20065861A0
(fi)
*
|
2006-06-30 |
2006-12-28 |
Nokia Corp |
Signaalien passiivinen vahvistus
|
FI20065862A0
(fi)
*
|
2006-06-30 |
2006-12-28 |
Nokia Corp |
Monitoiminen passiivinen taajuussekoitin
|
FI20065464A0
(fi)
*
|
2006-06-30 |
2006-06-30 |
Nokia Corp |
Monitoiminen passiivinen taajuussekoitin
|
TW200805878A
(en)
*
|
2006-07-12 |
2008-01-16 |
Sunplus Technology Co Ltd |
Programmable gain amplifier
|
KR100794310B1
(ko)
|
2006-11-21 |
2008-01-11 |
삼성전자주식회사 |
스위치드 커패시터 회로 및 그것의 증폭 방법
|
JP4887189B2
(ja)
*
|
2007-03-19 |
2012-02-29 |
オンセミコンダクター・トレーディング・リミテッド |
電池電圧検出回路
|
US8349167B2
(en)
|
2006-12-14 |
2013-01-08 |
Life Technologies Corporation |
Methods and apparatus for detecting molecular interactions using FET arrays
|
CA2672315A1
(en)
|
2006-12-14 |
2008-06-26 |
Ion Torrent Systems Incorporated |
Methods and apparatus for measuring analytes using large scale fet arrays
|
US11339430B2
(en)
|
2007-07-10 |
2022-05-24 |
Life Technologies Corporation |
Methods and apparatus for measuring analytes using large scale FET arrays
|
US8262900B2
(en)
*
|
2006-12-14 |
2012-09-11 |
Life Technologies Corporation |
Methods and apparatus for measuring analytes using large scale FET arrays
|
US8094223B1
(en)
*
|
2007-05-30 |
2012-01-10 |
On Semiconductor Trading Ltd. |
Bus driving in an image sensor
|
JP4881819B2
(ja)
*
|
2007-09-07 |
2012-02-22 |
オンセミコンダクター・トレーディング・リミテッド |
電池電圧検出回路
|
FR2932335B1
(fr)
*
|
2008-06-06 |
2011-06-03 |
Dolphin Integration Sa |
Circuit a capacites commutees a consommation reduite
|
US20100137143A1
(en)
|
2008-10-22 |
2010-06-03 |
Ion Torrent Systems Incorporated |
Methods and apparatus for measuring analytes
|
US20100301398A1
(en)
|
2009-05-29 |
2010-12-02 |
Ion Torrent Systems Incorporated |
Methods and apparatus for measuring analytes
|
JP5470823B2
(ja)
*
|
2008-12-03 |
2014-04-16 |
セイコーエプソン株式会社 |
基準電圧生成回路、集積回路装置、電気光学装置、及び電子機器
|
JP2010134107A
(ja)
*
|
2008-12-03 |
2010-06-17 |
Seiko Epson Corp |
集積回路装置、電気光学装置、及び電子機器
|
US20120261274A1
(en)
|
2009-05-29 |
2012-10-18 |
Life Technologies Corporation |
Methods and apparatus for measuring analytes
|
US8673627B2
(en)
|
2009-05-29 |
2014-03-18 |
Life Technologies Corporation |
Apparatus and methods for performing electrochemical reactions
|
US8776573B2
(en)
|
2009-05-29 |
2014-07-15 |
Life Technologies Corporation |
Methods and apparatus for measuring analytes
|
KR20110091380A
(ko)
*
|
2010-02-05 |
2011-08-11 |
삼성전자주식회사 |
터치 패널의 노이즈 보상 방법 및 장치
|
JP2011166419A
(ja)
*
|
2010-02-09 |
2011-08-25 |
Renesas Electronics Corp |
スイッチドキャパシタ回路
|
KR20110112128A
(ko)
*
|
2010-04-06 |
2011-10-12 |
삼성전자주식회사 |
터치 패널의 기생 커패시턴스 보상 방법 및 장치
|
JP2013533482A
(ja)
|
2010-06-30 |
2013-08-22 |
ライフ テクノロジーズ コーポレーション |
イオン感応性電荷蓄積回路および方法
|
CN106449632B
(zh)
|
2010-06-30 |
2019-09-20 |
生命科技公司 |
阵列列积分器
|
CN106932456B
(zh)
|
2010-06-30 |
2020-02-21 |
生命科技公司 |
用于测试isfet阵列的方法和装置
|
US11307166B2
(en)
|
2010-07-01 |
2022-04-19 |
Life Technologies Corporation |
Column ADC
|
JP5876044B2
(ja)
|
2010-07-03 |
2016-03-02 |
ライフ テクノロジーズ コーポレーション |
低濃度ドープドレインを有する化学的感応性センサ
|
EP2617061B1
(de)
|
2010-09-15 |
2021-06-30 |
Life Technologies Corporation |
Verfahren und vorrichtung zur analytmessung
|
WO2012039812A1
(en)
|
2010-09-24 |
2012-03-29 |
Life Technologies Corporation |
Matched pair transistor circuits
|
JP5152310B2
(ja)
*
|
2010-12-03 |
2013-02-27 |
株式会社デンソー |
組電池の電圧検出装置
|
KR20120138876A
(ko)
*
|
2011-06-16 |
2012-12-27 |
삼성전기주식회사 |
오프셋 전압 보상 기능을 갖는 발광 다이오드 구동 장치
|
US9970984B2
(en)
|
2011-12-01 |
2018-05-15 |
Life Technologies Corporation |
Method and apparatus for identifying defects in a chemical sensor array
|
EP2845447B1
(de)
*
|
2012-05-04 |
2019-07-10 |
Signify Holding B.V. |
Offsetkompensation in schaltkreisen
|
US8786331B2
(en)
|
2012-05-29 |
2014-07-22 |
Life Technologies Corporation |
System for reducing noise in a chemical sensor array
|
US9080968B2
(en)
|
2013-01-04 |
2015-07-14 |
Life Technologies Corporation |
Methods and systems for point of use removal of sacrificial material
|
US9841398B2
(en)
|
2013-01-08 |
2017-12-12 |
Life Technologies Corporation |
Methods for manufacturing well structures for low-noise chemical sensors
|
US8963216B2
(en)
|
2013-03-13 |
2015-02-24 |
Life Technologies Corporation |
Chemical sensor with sidewall spacer sensor surface
|
US9835585B2
(en)
|
2013-03-15 |
2017-12-05 |
Life Technologies Corporation |
Chemical sensor with protruded sensor surface
|
US9154089B2
(en)
*
|
2013-03-15 |
2015-10-06 |
Hae-Seung Lee |
Buffer amplifier circuit
|
EP2972281B1
(de)
|
2013-03-15 |
2023-07-26 |
Life Technologies Corporation |
Chemische vorrichtung mit dünnem leitenden element
|
EP2972280B1
(de)
|
2013-03-15 |
2021-09-29 |
Life Technologies Corporation |
Chemischer sensor mit stetigen sensoroberflächen
|
US20140336063A1
(en)
|
2013-05-09 |
2014-11-13 |
Life Technologies Corporation |
Windowed Sequencing
|
US10458942B2
(en)
|
2013-06-10 |
2019-10-29 |
Life Technologies Corporation |
Chemical sensor array having multiple sensors per well
|
EP3234576B1
(de)
|
2014-12-18 |
2023-11-22 |
Life Technologies Corporation |
Integrierte schaltung mit hoher datenrate und mit transmitterkonfiguration
|
US10077472B2
(en)
|
2014-12-18 |
2018-09-18 |
Life Technologies Corporation |
High data rate integrated circuit with power management
|
CN111505087A
(zh)
|
2014-12-18 |
2020-08-07 |
生命科技公司 |
使用大规模 fet 阵列测量分析物的方法和装置
|
US9941852B1
(en)
|
2016-09-28 |
2018-04-10 |
Nxp Usa, Inc. |
Operation amplifiers with offset cancellation
|
JP6981774B2
(ja)
|
2017-05-09 |
2021-12-17 |
ラピスセミコンダクタ株式会社 |
スイッチトキャパシタ増幅回路、電圧増幅方法及び赤外線センサ装置
|