DE69316823D1 - Anwendungsspezifische Integrierte Schaltung mit einem Mikroprozessor und Prüfmitteln - Google Patents

Anwendungsspezifische Integrierte Schaltung mit einem Mikroprozessor und Prüfmitteln

Info

Publication number
DE69316823D1
DE69316823D1 DE69316823T DE69316823T DE69316823D1 DE 69316823 D1 DE69316823 D1 DE 69316823D1 DE 69316823 T DE69316823 T DE 69316823T DE 69316823 T DE69316823 T DE 69316823T DE 69316823 D1 DE69316823 D1 DE 69316823D1
Authority
DE
Germany
Prior art keywords
microprocessor
asic
output
functional
application
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69316823T
Other languages
English (en)
Other versions
DE69316823T2 (de
Inventor
Patrick Darnault
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sagem SA
Original Assignee
Sagem SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sagem SA filed Critical Sagem SA
Publication of DE69316823D1 publication Critical patent/DE69316823D1/de
Application granted granted Critical
Publication of DE69316823T2 publication Critical patent/DE69316823T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2236—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Microcomputers (AREA)
  • Storage Device Security (AREA)
  • Communication Control (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
DE69316823T 1992-10-22 1993-10-13 Anwendungsspezifische Integrierte Schaltung mit einem Mikroprozessor und Prüfmitteln Expired - Lifetime DE69316823T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR9212647A FR2697356B1 (fr) 1992-10-22 1992-10-22 Circuit intégré à la demande à microprocesseur.

Publications (2)

Publication Number Publication Date
DE69316823D1 true DE69316823D1 (de) 1998-03-12
DE69316823T2 DE69316823T2 (de) 1998-09-10

Family

ID=9434781

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69316823T Expired - Lifetime DE69316823T2 (de) 1992-10-22 1993-10-13 Anwendungsspezifische Integrierte Schaltung mit einem Mikroprozessor und Prüfmitteln

Country Status (9)

Country Link
EP (1) EP0594478B1 (de)
JP (1) JPH06208478A (de)
AT (1) ATE163100T1 (de)
CA (1) CA2108824A1 (de)
DE (1) DE69316823T2 (de)
DK (1) DK0594478T3 (de)
ES (1) ES2115036T3 (de)
FR (1) FR2697356B1 (de)
GR (1) GR3026763T3 (de)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5724502A (en) * 1995-08-07 1998-03-03 International Business Machines Corporation Test mode matrix circuit for an embedded microprocessor core

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1990013043A1 (en) * 1989-04-18 1990-11-01 Vlsi Technology, Inc. Method for automatic isolation of functional blocks within integrated circuits
DE9000825U1 (de) * 1990-01-25 1990-03-29 Siemens AG, 1000 Berlin und 8000 München Integrierter Schaltkreis
JP2619112B2 (ja) * 1990-05-16 1997-06-11 株式会社東芝 情報処理装置のテスト容易化回路

Also Published As

Publication number Publication date
ES2115036T3 (es) 1998-06-16
GR3026763T3 (en) 1998-07-31
EP0594478A1 (de) 1994-04-27
FR2697356B1 (fr) 1994-12-09
EP0594478B1 (de) 1998-02-04
CA2108824A1 (fr) 1994-04-23
FR2697356A1 (fr) 1994-04-29
DE69316823T2 (de) 1998-09-10
DK0594478T3 (da) 1998-09-23
JPH06208478A (ja) 1994-07-26
ATE163100T1 (de) 1998-02-15

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition