DE69308326T2 - Verfahren zur herstellung eines entwicklers mit niedrigem metallionengehalt - Google Patents
Verfahren zur herstellung eines entwicklers mit niedrigem metallionengehaltInfo
- Publication number
- DE69308326T2 DE69308326T2 DE69308326T DE69308326T DE69308326T2 DE 69308326 T2 DE69308326 T2 DE 69308326T2 DE 69308326 T DE69308326 T DE 69308326T DE 69308326 T DE69308326 T DE 69308326T DE 69308326 T2 DE69308326 T2 DE 69308326T2
- Authority
- DE
- Germany
- Prior art keywords
- developer
- producing
- metal ion
- ion content
- low metal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/30—Imagewise removal using liquid means
- G03F7/32—Liquid compositions therefor, e.g. developers
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Photosensitive Polymer And Photoresist Processing (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US07/996,925 US5286606A (en) | 1992-12-29 | 1992-12-29 | Process for producing a developer having a low metal ion level |
PCT/US1993/012405 WO1994015262A1 (en) | 1992-12-29 | 1993-12-20 | Process for producing a developer having a low metal ion level |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69308326D1 DE69308326D1 (de) | 1997-04-03 |
DE69308326T2 true DE69308326T2 (de) | 1998-01-15 |
Family
ID=25543432
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69308326T Expired - Fee Related DE69308326T2 (de) | 1992-12-29 | 1993-12-20 | Verfahren zur herstellung eines entwicklers mit niedrigem metallionengehalt |
Country Status (8)
Country | Link |
---|---|
US (1) | US5286606A (de) |
EP (1) | EP0677183B1 (de) |
JP (1) | JP3381922B2 (de) |
KR (1) | KR100280757B1 (de) |
DE (1) | DE69308326T2 (de) |
HK (1) | HK70897A (de) |
SG (1) | SG47545A1 (de) |
WO (1) | WO1994015262A1 (de) |
Families Citing this family (26)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5580949A (en) * | 1991-12-18 | 1996-12-03 | Hoechst Celanese Corporation | Metal ion reduction in novolak resins and photoresists |
KR100231655B1 (ko) * | 1991-12-18 | 1999-11-15 | 마이클 에이. 카푸토 | 노볼락 수지중의 금속 이온 감소 방법 |
EP0635145B1 (de) * | 1992-03-06 | 1998-08-19 | Clariant Finance (BVI) Limited | Photoresists mit einem niedrigem grad metallionen |
US5830990A (en) * | 1992-07-10 | 1998-11-03 | Clariant Finance (Bvi) Limited | Low metals perfluorooctanoic acid and top anti-reflective coatings for photoresists |
SG52770A1 (en) * | 1992-07-10 | 1998-09-28 | Hoechst Celanese Corp | Metal ion reduction in top anti-reflective coatings for photoresists |
WO1994012912A1 (en) * | 1992-11-25 | 1994-06-09 | Hoechst Celanese Corporation | Metal ion reduction in bottom anti-reflective coatings for photoresists |
US5476750A (en) * | 1992-12-29 | 1995-12-19 | Hoechst Celanese Corporation | Metal ion reduction in the raw materials and using a Lewis base to control molecular weight of novolak resin to be used in positive photoresists |
US5614349A (en) * | 1992-12-29 | 1997-03-25 | Hoechst Celanese Corporation | Using a Lewis base to control molecular weight of novolak resins |
DE4419166A1 (de) * | 1994-06-01 | 1995-12-07 | Hoechst Ag | Entwickler für Photoresistschichten |
GB9418743D0 (en) * | 1994-09-16 | 1994-11-02 | Dupont Uk Limited | Fount solutions for printing processes |
US5521052A (en) * | 1994-12-30 | 1996-05-28 | Hoechst Celanese Corporation | Metal ion reduction in novolak resin using an ion exchange catalyst in a polar solvent and photoresists compositions therefrom |
US5614352A (en) * | 1994-12-30 | 1997-03-25 | Hoechst Celanese Corporation | Metal ion reduction in novolak resins solution in PGMEA by chelating ion exchange resin |
US5837417A (en) * | 1994-12-30 | 1998-11-17 | Clariant Finance (Bvi) Limited | Quinone diazide compositions containing low metals p-cresol oligomers and process of producing the composition |
US5693749A (en) * | 1995-09-20 | 1997-12-02 | Hoechst Celanese Corporation | Fractionation of phenol formaldehyde condensate and photoresist compositions produced therefrom |
US5750031A (en) * | 1995-09-26 | 1998-05-12 | Clariant Finance (Bvi) Limited | Process for producing surfactant having a low metal ion level and developer produced therefrom |
US5656413A (en) * | 1995-09-28 | 1997-08-12 | Hoechst Celanese Corporation | Low metal ion containing 4,4'-[1-[4-[1-(4-Hydroxyphenyl)-1-methylethyl]phenyl]ethylidene]bisphe nol and photoresist compositions therefrom |
US5962183A (en) * | 1995-11-27 | 1999-10-05 | Clariant Finance (Bvi) Limited | Metal ion reduction in photoresist compositions by chelating ion exchange resin |
US5665517A (en) * | 1996-01-11 | 1997-09-09 | Hoechst Celanese Corporation | Acidic ion exchange resin as a catalyst to synthesize a novolak resin and photoresist composition therefrom |
JP3029571B2 (ja) * | 1996-06-18 | 2000-04-04 | ナガセ電子化学株式会社 | フォトレジスト剥離剤からNaイオンを除去する方法 |
US6174501B1 (en) * | 1997-10-31 | 2001-01-16 | The Board Of Regents Of The University Of Nebraska | System and process for producing biodiesel fuel with reduced viscosity and a cloud point below thirty-two (32) degrees fahrenheit |
US5936071A (en) * | 1998-02-02 | 1999-08-10 | Clariant Finance (Bvi) Limited | Process for making a photoactive compound and photoresist therefrom |
WO2002023598A2 (en) * | 2000-09-15 | 2002-03-21 | Infineon Technologies North America Corp. | A method to reduce post-development defects without sacrificing throughput |
US6531267B2 (en) * | 2001-04-11 | 2003-03-11 | Clariant Finance (Bvi) Limited | Process for producing acid sensitive liquid composition containing a carbonate |
CN1934233B (zh) * | 2003-10-28 | 2015-02-04 | 塞克姆公司 | 清洁溶液和蚀刻剂及其使用方法 |
KR20050101458A (ko) * | 2004-04-19 | 2005-10-24 | 주식회사 하이닉스반도체 | 포토레지스트 세정액 조성물 및 이를 이용한 패턴 형성방법 |
JP6703098B2 (ja) * | 2016-03-31 | 2020-06-03 | 富士フイルム株式会社 | 半導体製造用処理液、及び、パターン形成方法 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH063549B2 (ja) * | 1984-12-25 | 1994-01-12 | 株式会社東芝 | ポジ型フォトレジスト現像液組成物 |
US4784937A (en) * | 1985-08-06 | 1988-11-15 | Tokyo Ohka Kogyo Co., Ltd. | Developing solution for positive-working photoresist comprising a metal ion free organic base and an anionic surfactant |
JPS6232453A (ja) * | 1985-08-06 | 1987-02-12 | Tokyo Ohka Kogyo Co Ltd | ポジ型ホトレジスト用現像液 |
JPS6472155A (en) * | 1987-09-12 | 1989-03-17 | Tama Kagaku Kogyo Kk | Developing solution for positive type photoresist |
US5175078A (en) * | 1988-10-20 | 1992-12-29 | Mitsubishi Gas Chemical Company, Inc. | Positive type photoresist developer |
KR100231655B1 (ko) * | 1991-12-18 | 1999-11-15 | 마이클 에이. 카푸토 | 노볼락 수지중의 금속 이온 감소 방법 |
EP0635145B1 (de) * | 1992-03-06 | 1998-08-19 | Clariant Finance (BVI) Limited | Photoresists mit einem niedrigem grad metallionen |
-
1992
- 1992-12-29 US US07/996,925 patent/US5286606A/en not_active Expired - Lifetime
-
1993
- 1993-12-20 JP JP51536594A patent/JP3381922B2/ja not_active Expired - Fee Related
- 1993-12-20 WO PCT/US1993/012405 patent/WO1994015262A1/en active IP Right Grant
- 1993-12-20 SG SG1996002731A patent/SG47545A1/en unknown
- 1993-12-20 EP EP94903683A patent/EP0677183B1/de not_active Expired - Lifetime
- 1993-12-20 DE DE69308326T patent/DE69308326T2/de not_active Expired - Fee Related
- 1993-12-20 KR KR1019950702667A patent/KR100280757B1/ko not_active IP Right Cessation
-
1997
- 1997-05-29 HK HK70897A patent/HK70897A/xx not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
DE69308326D1 (de) | 1997-04-03 |
SG47545A1 (en) | 1998-04-17 |
KR960700464A (ko) | 1996-01-20 |
KR100280757B1 (ko) | 2001-03-02 |
JPH08505241A (ja) | 1996-06-04 |
JP3381922B2 (ja) | 2003-03-04 |
EP0677183B1 (de) | 1997-02-26 |
HK70897A (en) | 1997-06-06 |
WO1994015262A1 (en) | 1994-07-07 |
US5286606A (en) | 1994-02-15 |
EP0677183A1 (de) | 1995-10-18 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8332 | No legal effect for de | ||
8370 | Indication related to discontinuation of the patent is to be deleted | ||
8364 | No opposition during term of opposition | ||
8327 | Change in the person/name/address of the patent owner |
Owner name: CLARIANT FINANCE (BVI) LTD., ROAD TOWN, TORTOLA, V |
|
8328 | Change in the person/name/address of the agent |
Free format text: SPOTT WEINMILLER & PARTNER, 80336 MUENCHEN |
|
8327 | Change in the person/name/address of the patent owner |
Owner name: AZ ELECTRONIC MATERIALS USA CORP. (N.D.GES.D. STAA |
|
8328 | Change in the person/name/address of the agent |
Representative=s name: PATENTANWAELTE ISENBRUCK BOESL HOERSCHLER WICHMANN HU |
|
8339 | Ceased/non-payment of the annual fee |