DE69213269D1 - Metall-Basisplatte wie Wärmesenke für eine Plastikumhüllte Halbleiteranordnung mit erhöhten Teilen zum Löten von Erdschluss-Verbindungsdrähten - Google Patents

Metall-Basisplatte wie Wärmesenke für eine Plastikumhüllte Halbleiteranordnung mit erhöhten Teilen zum Löten von Erdschluss-Verbindungsdrähten

Info

Publication number
DE69213269D1
DE69213269D1 DE69213269T DE69213269T DE69213269D1 DE 69213269 D1 DE69213269 D1 DE 69213269D1 DE 69213269 T DE69213269 T DE 69213269T DE 69213269 T DE69213269 T DE 69213269T DE 69213269 D1 DE69213269 D1 DE 69213269D1
Authority
DE
Germany
Prior art keywords
soldering
plastic
semiconductor device
base plate
heat sink
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69213269T
Other languages
English (en)
Other versions
DE69213269T2 (de
Inventor
Bosca Pietro Della
Angelo Massironi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics SRL
Original Assignee
SGS Thomson Microelectronics SRL
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SGS Thomson Microelectronics SRL filed Critical SGS Thomson Microelectronics SRL
Application granted granted Critical
Publication of DE69213269D1 publication Critical patent/DE69213269D1/de
Publication of DE69213269T2 publication Critical patent/DE69213269T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/42Wire connectors; Manufacturing methods related thereto
    • H01L24/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L24/49Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/34Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
    • H01L23/42Fillings or auxiliary members in containers or encapsulations selected or arranged to facilitate heating or cooling
    • H01L23/433Auxiliary members in containers characterised by their shape, e.g. pistons
    • H01L23/4334Auxiliary members in encapsulations
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    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/495Lead-frames or other flat leads
    • H01L23/49568Lead-frames or other flat leads specifically adapted to facilitate heat dissipation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
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    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02Bonding areas; Manufacturing methods related thereto
    • H01L2224/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
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    • H01L2224/0554External layer
    • H01L2224/0555Shape
    • H01L2224/05552Shape in top view
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    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/31Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L2224/32Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • H01L2224/321Disposition
    • H01L2224/32151Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/32221Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/32245Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
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    • H01L2224/451Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
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    • H01L2224/48247Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
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    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
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    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48257Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a die pad of the item
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    • H01L2224/732Location after the connecting process
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    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/181Encapsulation

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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
DE69213269T 1991-01-31 1992-01-24 Metall-Basisplatte wie Wärmesenke für eine Plastikumhüllte Halbleiteranordnung mit erhöhten Teilen zum Löten von Erdschluss-Verbindungsdrähten Expired - Fee Related DE69213269T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT91VA2 IT1250405B (it) 1991-01-31 1991-01-31 Piastrina metallica di dissipazione del calore di un dispositivo a semiconduttore di potenza incapsulato in resina fornita di rilievi per la saldatura dei fili di massa

Publications (2)

Publication Number Publication Date
DE69213269D1 true DE69213269D1 (de) 1996-10-10
DE69213269T2 DE69213269T2 (de) 1997-01-23

Family

ID=11423105

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69213269T Expired - Fee Related DE69213269T2 (de) 1991-01-31 1992-01-24 Metall-Basisplatte wie Wärmesenke für eine Plastikumhüllte Halbleiteranordnung mit erhöhten Teilen zum Löten von Erdschluss-Verbindungsdrähten

Country Status (5)

Country Link
US (1) US5229918A (de)
EP (1) EP0497744B1 (de)
JP (1) JP3178618B2 (de)
DE (1) DE69213269T2 (de)
IT (1) IT1250405B (de)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT1252136B (it) * 1991-11-29 1995-06-05 St Microelectronics Srl Struttura di dispositivo a semiconduttore con dissipatore metallico e corpo in plastica, con mezzi per una connessione elettrica al dissipatore di alta affidabilita'
US5328079A (en) * 1993-03-19 1994-07-12 National Semiconductor Corporation Method of and arrangement for bond wire connecting together certain integrated circuit components
EP0698922B1 (de) * 1994-08-12 2001-06-06 STMicroelectronics S.r.l. Leiterrahmen für integrierte Schaltungsanordnungen
US5696405A (en) * 1995-10-13 1997-12-09 Lucent Technologies Inc. Microelectronic package with device cooling
US5825625A (en) * 1996-05-20 1998-10-20 Hewlett-Packard Company Heat conductive substrate mounted in PC board for transferring heat from IC to heat sink
DE19625384A1 (de) * 1996-06-25 1998-01-02 Siemens Ag Zusammengesetzter Leiterrahmen
DE69627643D1 (de) * 1996-06-28 2003-05-28 St Microelectronics Srl Verfahren zur Herstellung einer Plastikpackung für eine elektronische Anordnung mit vollständig isolierter Wärmesenke
JP2907186B2 (ja) * 1997-05-19 1999-06-21 日本電気株式会社 半導体装置、その製造方法
FR2764114B1 (fr) * 1997-06-02 2003-04-25 Sgs Thomson Microelectronics Dispositif semi-conducteur muni d'un dissipateur thermique
US5960535A (en) * 1997-10-28 1999-10-05 Hewlett-Packard Company Heat conductive substrate press-mounted in PC board hole for transferring heat from IC to heat sink
US6005776A (en) * 1998-01-05 1999-12-21 Intel Corporation Vertical connector based packaging solution for integrated circuits
US6476481B2 (en) 1998-05-05 2002-11-05 International Rectifier Corporation High current capacity semiconductor device package and lead frame with large area connection posts and modified outline
EP0987747A1 (de) * 1998-09-17 2000-03-22 STMicroelectronics S.r.l. Verfahren zur Verbesserung der Adhäsion zwischen Metal und Kunststoff in Packungsstrukturen für elektronische Halbleiteranordnungen
CA2353338A1 (en) * 2000-07-21 2002-01-21 Ats Automation Tooling Systems Inc. Folded-fin heat sink manufacturing method and apparatus
JP2013135022A (ja) * 2011-12-26 2013-07-08 Toyota Motor Corp 半導体装置
KR200494343Y1 (ko) * 2019-08-05 2021-09-17 민정호 기능성 안전모 및 기능성 안전모 사고방지 시스템
JP2022063589A (ja) * 2020-10-12 2022-04-22 株式会社マキタ 作業機

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4132856A (en) * 1977-11-28 1979-01-02 Burroughs Corporation Process of forming a plastic encapsulated molded film carrier CML package and the package formed thereby
JPS55113349A (en) * 1979-02-23 1980-09-01 Hitachi Ltd Semiconductor device
JPH064595Y2 (ja) * 1988-02-24 1994-02-02 日本電気株式会社 ハイブリッドic

Also Published As

Publication number Publication date
JP3178618B2 (ja) 2001-06-25
ITVA910002A0 (it) 1991-01-31
US5229918A (en) 1993-07-20
DE69213269T2 (de) 1997-01-23
EP0497744B1 (de) 1996-09-04
JPH0823055A (ja) 1996-01-23
IT1250405B (it) 1995-04-07
ITVA910002A1 (it) 1992-08-01
EP0497744A1 (de) 1992-08-05

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