DE69204872D1 - Verfahren und Einrichtung zur spektroskopischen Analyse. - Google Patents
Verfahren und Einrichtung zur spektroskopischen Analyse.Info
- Publication number
- DE69204872D1 DE69204872D1 DE69204872T DE69204872T DE69204872D1 DE 69204872 D1 DE69204872 D1 DE 69204872D1 DE 69204872 T DE69204872 T DE 69204872T DE 69204872 T DE69204872 T DE 69204872T DE 69204872 D1 DE69204872 D1 DE 69204872D1
- Authority
- DE
- Germany
- Prior art keywords
- spectroscopic analysis
- spectroscopic
- analysis
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000000034 method Methods 0.000 title 1
- 238000004611 spectroscopical analysis Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
- G01N21/67—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence using electric arcs or discharges
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
- G01N21/718—Laser microanalysis, i.e. with formation of sample plasma
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/30—Measuring the intensity of spectral lines directly on the spectrum itself
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/443—Emission spectrometry
Landscapes
- Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- Biochemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Engineering & Computer Science (AREA)
- Optics & Photonics (AREA)
- Plasma & Fusion (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3083524A JPH0750033B2 (ja) | 1991-03-22 | 1991-03-22 | 発光分光分析方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69204872D1 true DE69204872D1 (de) | 1995-10-26 |
DE69204872T2 DE69204872T2 (de) | 1996-05-15 |
Family
ID=13804872
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69204872T Expired - Fee Related DE69204872T2 (de) | 1991-03-22 | 1992-03-20 | Verfahren und Einrichtung zur spektroskopischen Analyse. |
Country Status (5)
Country | Link |
---|---|
US (1) | US5303025A (de) |
EP (1) | EP0504933B1 (de) |
JP (1) | JPH0750033B2 (de) |
CN (1) | CN1077288C (de) |
DE (1) | DE69204872T2 (de) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2697462B2 (ja) * | 1992-03-26 | 1998-01-14 | 株式会社島津製作所 | 発光分光分析方法およびその装置 |
US5699155A (en) * | 1993-07-26 | 1997-12-16 | Kawasaki Steel Corporation | Emission spectral analysis method and instrument therefor |
US6034768A (en) * | 1997-09-26 | 2000-03-07 | Physical Sciences Inc. | Induced breakdown spectroscopy detector system with controllable delay time |
DE19753348A1 (de) * | 1997-12-03 | 1999-06-10 | Spectro Analytical Instr Gmbh | Vorrichtung zur Erfassung und Quantifizierung von Element-Konzentrationsverteilungen in Feststoffen |
KR20010014124A (ko) * | 1998-04-28 | 2001-02-26 | 에모토 간지 | 금속재료 중의 산소 및 산화물의 분석방법 |
GB2340598A (en) * | 1998-08-07 | 2000-02-23 | British Steel Plc | Determining composition of galvanised metal coating |
JPWO2002071036A1 (ja) * | 2001-03-06 | 2004-07-02 | 日本精工株式会社 | 金属中介在物構成元素の発光スペクトル強度による金属中介在物の粒径測定方法、及び金属中介在物の粒径分布作成方法、並びに該方法を実行する装置 |
EP1351049A3 (de) * | 2002-04-01 | 2004-02-25 | Central Iron & Steel Research Institute | Analysator für Metall |
FR2838827B3 (fr) * | 2002-04-19 | 2004-04-02 | Central Iron & Steel Res Inst | Methode d'analyse de distribution statistique de position originale pour un metal |
CN101105456B (zh) * | 2007-08-13 | 2010-07-21 | 攀钢集团攀枝花钢铁研究院 | 一种合金钢样品夹杂含量快速测定的分析方法 |
US11093869B2 (en) * | 2014-02-13 | 2021-08-17 | Brewmetrix Inc. | Analytical system with iterative method of analyzing data in web-based data processor with results display designed for non-experts |
CN104596901B (zh) * | 2015-01-09 | 2017-09-19 | 江苏省沙钢钢铁研究院有限公司 | 一种测量奥氏体晶粒尺寸的方法 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5377582A (en) * | 1976-12-20 | 1978-07-10 | Shimadzu Corp | Leght emission analyzing method |
JPS5941534B2 (ja) * | 1978-09-29 | 1984-10-08 | 株式会社島津製作所 | 発光分光分析装置 |
JPS5961759A (ja) * | 1982-09-30 | 1984-04-09 | Shimadzu Corp | 発光分光分析装置 |
FR2581192B1 (fr) * | 1985-04-25 | 1988-10-07 | Siderurgie Fse Inst Rech | Procede de determination par spectrometrie d'emission optique de la teneur d'un acier en un element, tel que l'aluminium, dissous et precipite. |
JPH0348751A (ja) * | 1989-07-17 | 1991-03-01 | Kawasaki Steel Corp | 発光分光分析法による介在物組成の評価方法 |
JPH0660877B2 (ja) * | 1989-10-24 | 1994-08-10 | 株式会社島津製作所 | 発光分光分析法 |
-
1991
- 1991-03-22 JP JP3083524A patent/JPH0750033B2/ja not_active Expired - Fee Related
-
1992
- 1992-03-20 US US07/854,842 patent/US5303025A/en not_active Expired - Lifetime
- 1992-03-20 EP EP92104905A patent/EP0504933B1/de not_active Expired - Lifetime
- 1992-03-20 DE DE69204872T patent/DE69204872T2/de not_active Expired - Fee Related
- 1992-03-21 CN CN92102131.3A patent/CN1077288C/zh not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
CN1065337A (zh) | 1992-10-14 |
JPH0750033B2 (ja) | 1995-05-31 |
EP0504933A3 (en) | 1993-03-31 |
EP0504933B1 (de) | 1995-09-20 |
DE69204872T2 (de) | 1996-05-15 |
CN1077288C (zh) | 2002-01-02 |
EP0504933A2 (de) | 1992-09-23 |
JPH04294258A (ja) | 1992-10-19 |
US5303025A (en) | 1994-04-12 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |