DE69204872D1 - Verfahren und Einrichtung zur spektroskopischen Analyse. - Google Patents

Verfahren und Einrichtung zur spektroskopischen Analyse.

Info

Publication number
DE69204872D1
DE69204872D1 DE69204872T DE69204872T DE69204872D1 DE 69204872 D1 DE69204872 D1 DE 69204872D1 DE 69204872 T DE69204872 T DE 69204872T DE 69204872 T DE69204872 T DE 69204872T DE 69204872 D1 DE69204872 D1 DE 69204872D1
Authority
DE
Germany
Prior art keywords
spectroscopic analysis
spectroscopic
analysis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69204872T
Other languages
English (en)
Other versions
DE69204872T2 (de
Inventor
Isao Fukui
Naoki Imamura
Takao Miyama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Application granted granted Critical
Publication of DE69204872D1 publication Critical patent/DE69204872D1/de
Publication of DE69204872T2 publication Critical patent/DE69204872T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
    • G01N21/67—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence using electric arcs or discharges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/718—Laser microanalysis, i.e. with formation of sample plasma
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/30—Measuring the intensity of spectral lines directly on the spectrum itself
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/443—Emission spectrometry

Landscapes

  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Plasma & Fusion (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
DE69204872T 1991-03-22 1992-03-20 Verfahren und Einrichtung zur spektroskopischen Analyse. Expired - Fee Related DE69204872T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3083524A JPH0750033B2 (ja) 1991-03-22 1991-03-22 発光分光分析方法

Publications (2)

Publication Number Publication Date
DE69204872D1 true DE69204872D1 (de) 1995-10-26
DE69204872T2 DE69204872T2 (de) 1996-05-15

Family

ID=13804872

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69204872T Expired - Fee Related DE69204872T2 (de) 1991-03-22 1992-03-20 Verfahren und Einrichtung zur spektroskopischen Analyse.

Country Status (5)

Country Link
US (1) US5303025A (de)
EP (1) EP0504933B1 (de)
JP (1) JPH0750033B2 (de)
CN (1) CN1077288C (de)
DE (1) DE69204872T2 (de)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2697462B2 (ja) * 1992-03-26 1998-01-14 株式会社島津製作所 発光分光分析方法およびその装置
WO1995003536A1 (fr) * 1993-07-26 1995-02-02 Kawasaki Steel Corporation Procede et appareil d'analyse spectrale d'une emission
US6034768A (en) * 1997-09-26 2000-03-07 Physical Sciences Inc. Induced breakdown spectroscopy detector system with controllable delay time
DE19753348A1 (de) * 1997-12-03 1999-06-10 Spectro Analytical Instr Gmbh Vorrichtung zur Erfassung und Quantifizierung von Element-Konzentrationsverteilungen in Feststoffen
BR9906406A (pt) 1998-04-28 2000-09-26 Kawasaki Steel Co "processo de análise de oxigênio e óxidos em material metálico"
GB2340598A (en) * 1998-08-07 2000-02-23 British Steel Plc Determining composition of galvanised metal coating
WO2002071036A1 (en) * 2001-03-06 2002-09-12 Nsk Ltd. Method for measuring particle size of inclusion in metal by emission spectrum intensity of element constituting inclusion in metal, and method for forming particle size distribution of inclusion in metal, and apparatus for executing that method
EP1351049A3 (de) * 2002-04-01 2004-02-25 Central Iron & Steel Research Institute Analysator für Metall
FR2838827B3 (fr) * 2002-04-19 2004-04-02 Central Iron & Steel Res Inst Methode d'analyse de distribution statistique de position originale pour un metal
CN101105456B (zh) * 2007-08-13 2010-07-21 攀钢集团攀枝花钢铁研究院 一种合金钢样品夹杂含量快速测定的分析方法
US11093869B2 (en) * 2014-02-13 2021-08-17 Brewmetrix Inc. Analytical system with iterative method of analyzing data in web-based data processor with results display designed for non-experts
CN104596901B (zh) * 2015-01-09 2017-09-19 江苏省沙钢钢铁研究院有限公司 一种测量奥氏体晶粒尺寸的方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5377582A (en) * 1976-12-20 1978-07-10 Shimadzu Corp Leght emission analyzing method
JPS5941534B2 (ja) * 1978-09-29 1984-10-08 株式会社島津製作所 発光分光分析装置
JPS5961759A (ja) * 1982-09-30 1984-04-09 Shimadzu Corp 発光分光分析装置
FR2581192B1 (fr) * 1985-04-25 1988-10-07 Siderurgie Fse Inst Rech Procede de determination par spectrometrie d'emission optique de la teneur d'un acier en un element, tel que l'aluminium, dissous et precipite.
JPH0348751A (ja) * 1989-07-17 1991-03-01 Kawasaki Steel Corp 発光分光分析法による介在物組成の評価方法
JPH0660877B2 (ja) * 1989-10-24 1994-08-10 株式会社島津製作所 発光分光分析法

Also Published As

Publication number Publication date
CN1077288C (zh) 2002-01-02
DE69204872T2 (de) 1996-05-15
EP0504933A3 (en) 1993-03-31
JPH04294258A (ja) 1992-10-19
US5303025A (en) 1994-04-12
JPH0750033B2 (ja) 1995-05-31
EP0504933A2 (de) 1992-09-23
CN1065337A (zh) 1992-10-14
EP0504933B1 (de) 1995-09-20

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee