DE69724681D1 - Vorrichtung und Verfahren zur Analyse von Kristallstruktur - Google Patents

Vorrichtung und Verfahren zur Analyse von Kristallstruktur

Info

Publication number
DE69724681D1
DE69724681D1 DE69724681T DE69724681T DE69724681D1 DE 69724681 D1 DE69724681 D1 DE 69724681D1 DE 69724681 T DE69724681 T DE 69724681T DE 69724681 T DE69724681 T DE 69724681T DE 69724681 D1 DE69724681 D1 DE 69724681D1
Authority
DE
Germany
Prior art keywords
crystal structure
analyzing crystal
analyzing
crystal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69724681T
Other languages
English (en)
Other versions
DE69724681T2 (de
Inventor
Ichiro Nagano
Yuichiro Murakami
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Heavy Industries Ltd
Original Assignee
Mitsubishi Heavy Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Heavy Industries Ltd filed Critical Mitsubishi Heavy Industries Ltd
Application granted granted Critical
Publication of DE69724681D1 publication Critical patent/DE69724681D1/de
Publication of DE69724681T2 publication Critical patent/DE69724681T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials

Landscapes

  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Complex Calculations (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
DE69724681T 1996-03-08 1997-03-10 Vorrichtung und Verfahren zur Analyse von Kristallstruktur Expired - Fee Related DE69724681T2 (de)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP5144896 1996-03-08
JP5144896 1996-03-08
JP28977996 1996-10-31
JP8289779A JPH09297112A (ja) 1996-03-08 1996-10-31 構造パラメータ解析装置及び解析方法

Publications (2)

Publication Number Publication Date
DE69724681D1 true DE69724681D1 (de) 2003-10-16
DE69724681T2 DE69724681T2 (de) 2004-04-08

Family

ID=26391983

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69724681T Expired - Fee Related DE69724681T2 (de) 1996-03-08 1997-03-10 Vorrichtung und Verfahren zur Analyse von Kristallstruktur

Country Status (4)

Country Link
US (1) US6081579A (de)
EP (1) EP0794426B1 (de)
JP (1) JPH09297112A (de)
DE (1) DE69724681T2 (de)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3301729B2 (ja) * 1998-07-31 2002-07-15 理学電機工業株式会社 定量分析による蛍光ｘ線分析方法および装置
JP4633311B2 (ja) * 1999-06-14 2011-02-16 パナリティカル ビー ヴィ 測定スペクトルから真のスペクトルを決定する方法
FR2798195B1 (fr) * 1999-09-02 2001-11-16 St Microelectronics Sa Caracterisation de zones de silicium-germanium sur silicium
JP2001331476A (ja) * 2000-05-23 2001-11-30 Ono Sokki Co Ltd 曲線適合方法、曲線適合装置、曲線適合プログラム記憶媒体、および損失係数測定装置
GB0115714D0 (en) * 2001-06-27 2001-08-22 Imperial College Structure determination of macromolecules
JP3717115B2 (ja) * 2002-06-12 2005-11-16 株式会社リガク 伝播線を用いた解析方法及びその装置
JP4148799B2 (ja) * 2003-03-04 2008-09-10 京セラ株式会社 電子回折パターンの解析方法及び解析装置
JP4452807B2 (ja) * 2005-09-06 2010-04-21 独立行政法人産業技術総合研究所 薄膜結晶の極性の判定方法
UA89318C2 (ru) * 2008-08-12 2010-01-11 Институт Сцинтилляционных Материалов Нан Украины Рентгенографический способ распознавания материалов и устройство для его осуществления
JP5709106B2 (ja) * 2011-03-16 2015-04-30 大学共同利用機関法人 高エネルギー加速器研究機構 情報処理装置、情報処理方法及びプログラム
JP5790468B2 (ja) * 2011-12-09 2015-10-07 新日鐵住金株式会社 焼結鉱の構造評価方法
JP5612014B2 (ja) * 2012-03-29 2014-10-22 株式会社東芝 モデル学習装置、モデル学習方法、及びプログラム
CN104303259B (zh) * 2012-05-18 2016-12-14 Dh科技发展私人贸易有限公司 高动态范围检测器校正算法
JP6013950B2 (ja) * 2013-03-14 2016-10-25 株式会社リガク 結晶相同定方法、結晶相同定装置、及び結晶相同定プログラム
JP6796858B2 (ja) * 2017-03-06 2020-12-09 国立研究開発法人物質・材料研究機構 ３次元ラマン分光方法
KR102589616B1 (ko) 2018-06-05 2023-10-13 라이트엘리전스 피티이. 리미티드 광전자 컴퓨팅 시스템
CN109034378B (zh) * 2018-09-04 2023-03-31 腾讯科技（深圳）有限公司 神经网络的网络表示生成方法、装置、存储介质和设备
JP7178725B2 (ja) * 2020-11-30 2022-11-28 株式会社リガク 蛍光ｘ線分析装置
JP2024042539A (ja) * 2022-09-15 2024-03-28 株式会社東芝 結晶相情報抽出装置、方法及びプログラム

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB9226552D0 (en) * 1992-12-21 1993-02-17 Philips Electronics Uk Ltd A method of determining a given characteristic of a material sample
US5483960A (en) * 1994-01-03 1996-01-16 Hologic, Inc. Morphometric X-ray absorptiometry (MXA)

Also Published As

Publication number Publication date
DE69724681T2 (de) 2004-04-08
EP0794426A2 (de) 1997-09-10
EP0794426B1 (de) 2003-09-10
US6081579A (en) 2000-06-27
EP0794426A3 (de) 1998-04-22
JPH09297112A (ja) 1997-11-18

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8364 No opposition during term of opposition
8328 Change in the person/name/address of the agent

Representative=s name: BOECK, TAPPE, KIRSCHNER RECHTSANWAELTE PATENTANWAELTE

8339 Ceased/non-payment of the annual fee