FR2798195B1 - Caracterisation de zones de silicium-germanium sur silicium - Google Patents
Caracterisation de zones de silicium-germanium sur siliciumInfo
- Publication number
- FR2798195B1 FR2798195B1 FR9911142A FR9911142A FR2798195B1 FR 2798195 B1 FR2798195 B1 FR 2798195B1 FR 9911142 A FR9911142 A FR 9911142A FR 9911142 A FR9911142 A FR 9911142A FR 2798195 B1 FR2798195 B1 FR 2798195B1
- Authority
- FR
- France
- Prior art keywords
- silicon
- characterization
- germanium
- zones
- germanium zones
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 229910000577 Silicon-germanium Inorganic materials 0.000 title 1
- LEVVHYCKPQWKOP-UHFFFAOYSA-N [Si].[Ge] Chemical compound [Si].[Ge] LEVVHYCKPQWKOP-UHFFFAOYSA-N 0.000 title 1
- 238000012512 characterization method Methods 0.000 title 1
- 229910052710 silicon Inorganic materials 0.000 title 1
- 239000010703 silicon Substances 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR9911142A FR2798195B1 (fr) | 1999-09-02 | 1999-09-02 | Caracterisation de zones de silicium-germanium sur silicium |
US09/652,682 US6238941B1 (en) | 1999-09-02 | 2000-08-31 | Characterizing of silicon-germanium areas on silicon |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR9911142A FR2798195B1 (fr) | 1999-09-02 | 1999-09-02 | Caracterisation de zones de silicium-germanium sur silicium |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2798195A1 FR2798195A1 (fr) | 2001-03-09 |
FR2798195B1 true FR2798195B1 (fr) | 2001-11-16 |
Family
ID=9549579
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR9911142A Expired - Fee Related FR2798195B1 (fr) | 1999-09-02 | 1999-09-02 | Caracterisation de zones de silicium-germanium sur silicium |
Country Status (2)
Country | Link |
---|---|
US (1) | US6238941B1 (fr) |
FR (1) | FR2798195B1 (fr) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6498078B2 (en) * | 2000-09-05 | 2002-12-24 | The Regents Of The University Of California | Method for enhancing the solubility of boron and indium in silicon |
US20060084919A1 (en) * | 2004-10-18 | 2006-04-20 | Shaw Thomas J | Fixed-dose syringe with limited aspiration |
WO2012038853A1 (fr) | 2010-09-22 | 2012-03-29 | Koninklijke Philips Electronics N.V. | Procédé de production d'oxyde nitrique |
US10319872B2 (en) | 2012-05-10 | 2019-06-11 | International Business Machines Corporation | Cost-efficient high power PECVD deposition for solar cells |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB9226552D0 (en) * | 1992-12-21 | 1993-02-17 | Philips Electronics Uk Ltd | A method of determining a given characteristic of a material sample |
US5530732A (en) | 1994-05-24 | 1996-06-25 | Mitsubishi Denki Kabushiki Kaisha | Method and apparatus for evaluating thin-film multilayer structure |
JPH09297112A (ja) * | 1996-03-08 | 1997-11-18 | Mitsubishi Heavy Ind Ltd | 構造パラメータ解析装置及び解析方法 |
-
1999
- 1999-09-02 FR FR9911142A patent/FR2798195B1/fr not_active Expired - Fee Related
-
2000
- 2000-08-31 US US09/652,682 patent/US6238941B1/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
FR2798195A1 (fr) | 2001-03-09 |
US6238941B1 (en) | 2001-05-29 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |
Effective date: 20090529 |