DE69132461D1 - Verfahren und vorrichtung zur spurenanalyse - Google Patents

Verfahren und vorrichtung zur spurenanalyse

Info

Publication number
DE69132461D1
DE69132461D1 DE69132461T DE69132461T DE69132461D1 DE 69132461 D1 DE69132461 D1 DE 69132461D1 DE 69132461 T DE69132461 T DE 69132461T DE 69132461 T DE69132461 T DE 69132461T DE 69132461 D1 DE69132461 D1 DE 69132461D1
Authority
DE
Germany
Prior art keywords
track analysis
track
analysis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69132461T
Other languages
English (en)
Other versions
DE69132461T2 (de
Inventor
L Lee
Hang Sin
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Brigham Young University
Original Assignee
Brigham Young University
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Brigham Young University filed Critical Brigham Young University
Publication of DE69132461D1 publication Critical patent/DE69132461D1/de
Application granted granted Critical
Publication of DE69132461T2 publication Critical patent/DE69132461T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/40—Time-of-flight spectrometers
    • H01J49/401—Time-of-flight spectrometers characterised by orthogonal acceleration, e.g. focusing or selecting the ions, pusher electrode
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/40—Time-of-flight spectrometers

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
DE69132461T 1990-08-29 1991-08-28 Verfahren und vorrichtung zur spurenanalyse Expired - Fee Related DE69132461T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US07574638 US5070240B1 (en) 1990-08-29 1990-08-29 Apparatus and methods for trace component analysis
PCT/US1991/006153 WO1992004728A1 (en) 1990-08-29 1991-08-28 Apparatus and methods for trace component analysis

Publications (2)

Publication Number Publication Date
DE69132461D1 true DE69132461D1 (de) 2000-12-07
DE69132461T2 DE69132461T2 (de) 2001-05-10

Family

ID=24296972

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69132461T Expired - Fee Related DE69132461T2 (de) 1990-08-29 1991-08-28 Verfahren und vorrichtung zur spurenanalyse

Country Status (8)

Country Link
US (1) US5070240B1 (de)
EP (1) EP0546097B1 (de)
JP (1) JP3176918B2 (de)
KR (1) KR100232430B1 (de)
CA (1) CA2090616C (de)
DE (1) DE69132461T2 (de)
TW (1) TW234741B (de)
WO (1) WO1992004728A1 (de)

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US5157260A (en) * 1991-05-17 1992-10-20 Finnian Corporation Method and apparatus for focusing ions in viscous flow jet expansion region of an electrospray apparatus
EP0615655B1 (de) * 1991-12-03 1997-05-07 Graseby Dynamics Limited Coronaentladung-ionenquelle
US5306910A (en) * 1992-04-10 1994-04-26 Millipore Corporation Time modulated electrified spray apparatus and process
GB9304462D0 (en) * 1993-03-04 1993-04-21 Kore Tech Ltd Mass spectrometer
DE4322102C2 (de) * 1993-07-02 1995-08-17 Bergmann Thorald Flugzeit-Massenspektrometer mit Gasphasen-Ionenquelle
GB9324213D0 (en) * 1993-11-25 1994-01-12 Kore Tech Ltd Vacuum inlet
JP3671354B2 (ja) * 1994-02-28 2005-07-13 アナリチカ オブ ブランフォード，インコーポレーテッド 質量分析用の多重極イオンガイド
DE19511333C1 (de) * 1995-03-28 1996-08-08 Bruker Franzen Analytik Gmbh Verfahren und Vorrichtung für orthogonalen Einschuß von Ionen in ein Flugzeit-Massenspektrometer
US5625184A (en) * 1995-05-19 1997-04-29 Perseptive Biosystems, Inc. Time-of-flight mass spectrometry analysis of biomolecules
US6002127A (en) * 1995-05-19 1999-12-14 Perseptive Biosystems, Inc. Time-of-flight mass spectrometry analysis of biomolecules
US5572023A (en) * 1995-05-30 1996-11-05 Board Of Regents, The University Of Texas System Electrospray methods and apparatus for trace analysis
US5825025A (en) * 1995-11-08 1998-10-20 Comstock, Inc. Miniaturized time-of-flight mass spectrometer
US5744797A (en) * 1995-11-22 1998-04-28 Bruker Analytical Instruments, Inc. Split-field interface
US5808299A (en) * 1996-04-01 1998-09-15 Syagen Technology Real-time multispecies monitoring by photoionization mass spectrometry
US5945678A (en) * 1996-05-21 1999-08-31 Hamamatsu Photonics K.K. Ionizing analysis apparatus
AU3594097A (en) * 1996-07-03 1998-01-21 Analytica Of Branford, Inc. A time-of-flight mass spectrometer with first and second order longitudinal focusing
US6316768B1 (en) * 1997-03-14 2001-11-13 Leco Corporation Printed circuit boards as insulated components for a time of flight mass spectrometer
GB2324906B (en) 1997-04-29 2002-01-09 Masslab Ltd Ion source for a mass analyser and method of providing a source of ions for analysis
US5905258A (en) * 1997-06-02 1999-05-18 Advanced Research & Techology Institute Hybrid ion mobility and mass spectrometer
US6323482B1 (en) 1997-06-02 2001-11-27 Advanced Research And Technology Institute, Inc. Ion mobility and mass spectrometer
US6960761B2 (en) 1997-06-02 2005-11-01 Advanced Research & Technology Institute Instrument for separating ions in time as functions of preselected ion mobility and ion mass
US6498342B1 (en) 1997-06-02 2002-12-24 Advanced Research & Technology Institute Ion separation instrument
US6040573A (en) * 1997-09-25 2000-03-21 Indiana University Advanced Research & Technology Institute Inc. Electric field generation for charged particle analyzers
EP0970505B1 (de) 1998-01-23 2003-07-23 Micromass Limited Flugzeitmassenspektrometer und detektor dafür und spektrometrieverfahren
JP2939540B2 (ja) * 1998-01-30 1999-08-25 科学技術庁金属材料技術研究所長 パルス励起原子線とパルス紫外光の生成方法およびその装置
DE19822674A1 (de) 1998-05-20 1999-12-09 Gsf Forschungszentrum Umwelt Gaseinlaß für eine Ionenquelle
US6849847B1 (en) 1998-06-12 2005-02-01 Agilent Technologies, Inc. Ambient pressure matrix-assisted laser desorption ionization (MALDI) apparatus and method of analysis
US7119342B2 (en) * 1999-02-09 2006-10-10 Syagen Technology Interfaces for a photoionization mass spectrometer
US7109476B2 (en) 1999-02-09 2006-09-19 Syagen Technology Multiple ion sources involving atmospheric pressure photoionization
US6630664B1 (en) * 1999-02-09 2003-10-07 Syagen Technology Atmospheric pressure photoionizer for mass spectrometry
US6211516B1 (en) 1999-02-09 2001-04-03 Syagen Technology Photoionization mass spectrometer
US6326615B1 (en) 1999-08-30 2001-12-04 Syagen Technology Rapid response mass spectrometer system
FR2801674B1 (fr) * 1999-11-29 2002-02-01 Air Liquide Dispositif d'ionisation d'un gaz pour l'analyse d'impuretes presentes a l'etat de trace dans ce gaz et procede d'ionisation utilisant un tel dispositif
US6998605B1 (en) * 2000-05-25 2006-02-14 Agilent Technologies, Inc. Apparatus for delivering ions from a grounded electrospray assembly to a vacuum chamber
US6737642B2 (en) 2002-03-18 2004-05-18 Syagen Technology High dynamic range analog-to-digital converter
CA2470452C (en) 2003-06-09 2017-10-03 Ionics Mass Spectrometry Group, Inc. Mass spectrometer interface
US7385187B2 (en) * 2003-06-21 2008-06-10 Leco Corporation Multi-reflecting time-of-flight mass spectrometer and method of use
US7442919B2 (en) * 2004-02-27 2008-10-28 Japan Science And Technology Agency Supercritical fluid jet method and supercritical fluid jet mass analysis method and device
GB0424426D0 (en) 2004-11-04 2004-12-08 Micromass Ltd Mass spectrometer
US20090108090A1 (en) * 2005-01-14 2009-04-30 Cooper Environmental Services Llc Quantitative aerosol generator (qag)
US20080296400A1 (en) * 2005-01-14 2008-12-04 John Arthur Cooper Quantitative aerosol generator (QAG) method and apparatus
US7385189B2 (en) * 2005-06-29 2008-06-10 Agilent Technologies, Inc. Nanospray ionization device and method
US20100078553A1 (en) * 2008-09-30 2010-04-01 Advion Biosciences, Inc. Atmospheric pressure ionization (api) interface structures for a mass spectrometer
KR101766637B1 (ko) * 2011-05-13 2017-08-23 한국표준과학연구원 비행시간 기반 질량 분석을 위한 펄싱 클러스터 가스 이온건
JP6346567B2 (ja) * 2011-12-28 2018-06-20 マイクロマス・ユーケー・リミテッド 液相試料の急速蒸発イオン化を行うためのシステムおよび方法
CN105304451B (zh) * 2015-10-23 2017-06-16 浙江好创生物技术有限公司 一种应用于质谱仪的电喷雾离子源及质谱分析方法
EP3660504A1 (de) * 2018-11-30 2020-06-03 Thermo Fisher Scientific (Bremen) GmbH Systeme und verfahren zum bestimmen der masse einer ionenart
CN111665103B (zh) * 2020-05-13 2023-08-18 中国科学院微电子研究所 一种低真空痕量气体的快速无损采样分析装置和方法
CN114256054B (zh) * 2021-12-28 2023-07-04 广州禾信仪器股份有限公司 一种飞行时间质谱仪及检测系统

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3621240A (en) * 1969-05-27 1971-11-16 Franklin Gro Corp Apparatus and methods for detecting and identifying trace gases
US4072862A (en) * 1975-07-22 1978-02-07 Mamyrin Boris Alexandrovich Time-of-flight mass spectrometer
US4390784A (en) * 1979-10-01 1983-06-28 The Bendix Corporation One piece ion accelerator for ion mobility detector cells
US4755344A (en) * 1980-04-11 1988-07-05 The United States Of America As Represented By The United States Department Of Energy Method and apparatus for the production of cluster ions
US4458149A (en) * 1981-07-14 1984-07-03 Patrick Luis Muga Time-of-flight mass spectrometer
US4667100A (en) * 1985-04-17 1987-05-19 Lagna William M Methods and apparatus for mass spectrometric analysis of fluids
DE3524536A1 (de) * 1985-07-10 1987-01-22 Bruker Analytische Messtechnik Flugzeit-massenspektrometer mit einem ionenreflektor
JPH07118295B2 (ja) * 1985-10-30 1995-12-18 株式会社日立製作所 質量分析計

Also Published As

Publication number Publication date
KR930702775A (ko) 1993-09-09
JP3176918B2 (ja) 2001-06-18
KR100232430B1 (ko) 1999-12-01
US5070240A (en) 1991-12-03
DE69132461T2 (de) 2001-05-10
TW234741B (de) 1994-11-21
EP0546097A4 (en) 1995-04-19
CA2090616C (en) 2002-07-09
WO1992004728A1 (en) 1992-03-19
US5070240B1 (en) 1996-09-10
CA2090616A1 (en) 1992-03-01
EP0546097B1 (de) 2000-11-02
JPH06501130A (ja) 1994-01-27
EP0546097A1 (de) 1993-06-16

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee