TW234741B - - Google Patents

Info

Publication number
TW234741B
TW234741B TW080105971A TW80105971A TW234741B TW 234741 B TW234741 B TW 234741B TW 080105971 A TW080105971 A TW 080105971A TW 80105971 A TW80105971 A TW 80105971A TW 234741 B TW234741 B TW 234741B
Authority
TW
Taiwan
Application number
TW080105971A
Original Assignee
Univ Brigham Young
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Univ Brigham Young filed Critical Univ Brigham Young
Application granted granted Critical
Publication of TW234741B publication Critical patent/TW234741B/zh

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/40—Time-of-flight spectrometers
    • H01J49/401—Time-of-flight spectrometers characterised by orthogonal acceleration, e.g. focusing or selecting the ions, pusher electrode
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/40—Time-of-flight spectrometers
TW080105971A 1990-08-29 1991-07-31 TW234741B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07574638 US5070240B1 (en) 1990-08-29 1990-08-29 Apparatus and methods for trace component analysis

Publications (1)

Publication Number Publication Date
TW234741B true TW234741B (zh) 1994-11-21

Family

ID=24296972

Family Applications (1)

Application Number Title Priority Date Filing Date
TW080105971A TW234741B (zh) 1990-08-29 1991-07-31

Country Status (8)

Country Link
US (1) US5070240B1 (zh)
EP (1) EP0546097B1 (zh)
JP (1) JP3176918B2 (zh)
KR (1) KR100232430B1 (zh)
CA (1) CA2090616C (zh)
DE (1) DE69132461T2 (zh)
TW (1) TW234741B (zh)
WO (1) WO1992004728A1 (zh)

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US5157260A (en) * 1991-05-17 1992-10-20 Finnian Corporation Method and apparatus for focusing ions in viscous flow jet expansion region of an electrospray apparatus
JP3096986B2 (ja) * 1991-12-03 2000-10-10 グレイズビー ダイナミックス リミテッド コロナ放電イオン源
US5306910A (en) * 1992-04-10 1994-04-26 Millipore Corporation Time modulated electrified spray apparatus and process
GB9304462D0 (en) * 1993-03-04 1993-04-21 Kore Tech Ltd Mass spectrometer
DE4322102C2 (de) * 1993-07-02 1995-08-17 Bergmann Thorald Flugzeit-Massenspektrometer mit Gasphasen-Ionenquelle
GB9324213D0 (en) * 1993-11-25 1994-01-12 Kore Tech Ltd Vacuum inlet
EP0748249B1 (en) * 1994-02-28 2009-07-08 Analytica Of Branford, Inc. Multipole ion guide for mass spectrometry
DE19511333C1 (de) * 1995-03-28 1996-08-08 Bruker Franzen Analytik Gmbh Verfahren und Vorrichtung für orthogonalen Einschuß von Ionen in ein Flugzeit-Massenspektrometer
US6002127A (en) 1995-05-19 1999-12-14 Perseptive Biosystems, Inc. Time-of-flight mass spectrometry analysis of biomolecules
US5625184A (en) * 1995-05-19 1997-04-29 Perseptive Biosystems, Inc. Time-of-flight mass spectrometry analysis of biomolecules
US5572023A (en) * 1995-05-30 1996-11-05 Board Of Regents, The University Of Texas System Electrospray methods and apparatus for trace analysis
US5825025A (en) * 1995-11-08 1998-10-20 Comstock, Inc. Miniaturized time-of-flight mass spectrometer
US5744797A (en) * 1995-11-22 1998-04-28 Bruker Analytical Instruments, Inc. Split-field interface
US5808299A (en) * 1996-04-01 1998-09-15 Syagen Technology Real-time multispecies monitoring by photoionization mass spectrometry
US5945678A (en) * 1996-05-21 1999-08-31 Hamamatsu Photonics K.K. Ionizing analysis apparatus
WO1998000224A1 (en) * 1996-07-03 1998-01-08 Analytica Of Branford, Inc. A time-of-flight mass spectrometer with first and second order longitudinal focusing
US6316768B1 (en) * 1997-03-14 2001-11-13 Leco Corporation Printed circuit boards as insulated components for a time of flight mass spectrometer
GB2324906B (en) 1997-04-29 2002-01-09 Masslab Ltd Ion source for a mass analyser and method of providing a source of ions for analysis
US6498342B1 (en) 1997-06-02 2002-12-24 Advanced Research & Technology Institute Ion separation instrument
US6323482B1 (en) 1997-06-02 2001-11-27 Advanced Research And Technology Institute, Inc. Ion mobility and mass spectrometer
US6960761B2 (en) * 1997-06-02 2005-11-01 Advanced Research & Technology Institute Instrument for separating ions in time as functions of preselected ion mobility and ion mass
US5905258A (en) * 1997-06-02 1999-05-18 Advanced Research & Techology Institute Hybrid ion mobility and mass spectrometer
US6040573A (en) * 1997-09-25 2000-03-21 Indiana University Advanced Research & Technology Institute Inc. Electric field generation for charged particle analyzers
EP0970504B1 (en) 1998-01-23 2004-11-17 Micromass UK Limited Time of flight mass spectrometer and dual gain detector therefor
JP2939540B2 (ja) * 1998-01-30 1999-08-25 科学技術庁金属材料技術研究所長 パルス励起原子線とパルス紫外光の生成方法およびその装置
DE19822674A1 (de) * 1998-05-20 1999-12-09 Gsf Forschungszentrum Umwelt Gaseinlaß für eine Ionenquelle
US6849847B1 (en) 1998-06-12 2005-02-01 Agilent Technologies, Inc. Ambient pressure matrix-assisted laser desorption ionization (MALDI) apparatus and method of analysis
US7109476B2 (en) 1999-02-09 2006-09-19 Syagen Technology Multiple ion sources involving atmospheric pressure photoionization
US7119342B2 (en) * 1999-02-09 2006-10-10 Syagen Technology Interfaces for a photoionization mass spectrometer
US6630664B1 (en) * 1999-02-09 2003-10-07 Syagen Technology Atmospheric pressure photoionizer for mass spectrometry
US6211516B1 (en) 1999-02-09 2001-04-03 Syagen Technology Photoionization mass spectrometer
US6326615B1 (en) 1999-08-30 2001-12-04 Syagen Technology Rapid response mass spectrometer system
FR2801674B1 (fr) * 1999-11-29 2002-02-01 Air Liquide Dispositif d'ionisation d'un gaz pour l'analyse d'impuretes presentes a l'etat de trace dans ce gaz et procede d'ionisation utilisant un tel dispositif
US6998605B1 (en) * 2000-05-25 2006-02-14 Agilent Technologies, Inc. Apparatus for delivering ions from a grounded electrospray assembly to a vacuum chamber
US6737642B2 (en) 2002-03-18 2004-05-18 Syagen Technology High dynamic range analog-to-digital converter
CA2470452C (en) * 2003-06-09 2017-10-03 Ionics Mass Spectrometry Group, Inc. Mass spectrometer interface
US7385187B2 (en) * 2003-06-21 2008-06-10 Leco Corporation Multi-reflecting time-of-flight mass spectrometer and method of use
WO2005083417A1 (ja) * 2004-02-27 2005-09-09 Japan Science And Technology Agency 超臨界流体ジェット法及び超臨界流体ジェット質量分析方法と装置
GB0424426D0 (en) 2004-11-04 2004-12-08 Micromass Ltd Mass spectrometer
US20080296400A1 (en) * 2005-01-14 2008-12-04 John Arthur Cooper Quantitative aerosol generator (QAG) method and apparatus
US20090108090A1 (en) * 2005-01-14 2009-04-30 Cooper Environmental Services Llc Quantitative aerosol generator (qag)
US7385189B2 (en) * 2005-06-29 2008-06-10 Agilent Technologies, Inc. Nanospray ionization device and method
US20100078553A1 (en) * 2008-09-30 2010-04-01 Advion Biosciences, Inc. Atmospheric pressure ionization (api) interface structures for a mass spectrometer
KR101766637B1 (ko) * 2011-05-13 2017-08-23 한국표준과학연구원 비행시간 기반 질량 분석을 위한 펄싱 클러스터 가스 이온건
JP6346567B2 (ja) * 2011-12-28 2018-06-20 マイクロマス・ユーケー・リミテッド 液相試料の急速蒸発イオン化を行うためのシステムおよび方法
CN105304451B (zh) * 2015-10-23 2017-06-16 浙江好创生物技术有限公司 一种应用于质谱仪的电喷雾离子源及质谱分析方法
EP3660504A1 (en) * 2018-11-30 2020-06-03 Thermo Fisher Scientific (Bremen) GmbH Systems and methods for determining mass of an ion species
CN111665103B (zh) * 2020-05-13 2023-08-18 中国科学院微电子研究所 一种低真空痕量气体的快速无损采样分析装置和方法
CN114256054B (zh) * 2021-12-28 2023-07-04 广州禾信仪器股份有限公司 一种飞行时间质谱仪及检测系统

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US3621240A (en) * 1969-05-27 1971-11-16 Franklin Gro Corp Apparatus and methods for detecting and identifying trace gases
US4072862A (en) * 1975-07-22 1978-02-07 Mamyrin Boris Alexandrovich Time-of-flight mass spectrometer
US4390784A (en) * 1979-10-01 1983-06-28 The Bendix Corporation One piece ion accelerator for ion mobility detector cells
US4755344A (en) * 1980-04-11 1988-07-05 The United States Of America As Represented By The United States Department Of Energy Method and apparatus for the production of cluster ions
US4458149A (en) * 1981-07-14 1984-07-03 Patrick Luis Muga Time-of-flight mass spectrometer
US4667100A (en) * 1985-04-17 1987-05-19 Lagna William M Methods and apparatus for mass spectrometric analysis of fluids
DE3524536A1 (de) * 1985-07-10 1987-01-22 Bruker Analytische Messtechnik Flugzeit-massenspektrometer mit einem ionenreflektor
JPH07118295B2 (ja) * 1985-10-30 1995-12-18 株式会社日立製作所 質量分析計

Also Published As

Publication number Publication date
EP0546097B1 (en) 2000-11-02
DE69132461T2 (de) 2001-05-10
US5070240A (en) 1991-12-03
EP0546097A1 (en) 1993-06-16
EP0546097A4 (en) 1995-04-19
JP3176918B2 (ja) 2001-06-18
CA2090616A1 (en) 1992-03-01
DE69132461D1 (de) 2000-12-07
WO1992004728A1 (en) 1992-03-19
US5070240B1 (en) 1996-09-10
KR930702775A (ko) 1993-09-09
KR100232430B1 (ko) 1999-12-01
JPH06501130A (ja) 1994-01-27
CA2090616C (en) 2002-07-09

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