DE69102770D1 - Hochgeschwindigkeitstester und Verfahren zur Erzeugung aufeinanderfolgender Schleifen von Datensignalen einer bestimmten Taktrate. - Google Patents

Hochgeschwindigkeitstester und Verfahren zur Erzeugung aufeinanderfolgender Schleifen von Datensignalen einer bestimmten Taktrate.

Info

Publication number
DE69102770D1
DE69102770D1 DE69102770T DE69102770T DE69102770D1 DE 69102770 D1 DE69102770 D1 DE 69102770D1 DE 69102770 T DE69102770 T DE 69102770T DE 69102770 T DE69102770 T DE 69102770T DE 69102770 D1 DE69102770 D1 DE 69102770D1
Authority
DE
Germany
Prior art keywords
data
high speed
test
cache
data signals
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69102770T
Other languages
English (en)
Other versions
DE69102770T2 (de
Inventor
Richard Bogholtz
Louis Bosch
Thomas Mitchell
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of DE69102770D1 publication Critical patent/DE69102770D1/de
Application granted granted Critical
Publication of DE69102770T2 publication Critical patent/DE69102770T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31919—Storing and outputting test patterns

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Memory System Of A Hierarchy Structure (AREA)
DE69102770T 1990-10-19 1991-02-27 Hochgeschwindigkeitstester und Verfahren zur Erzeugung aufeinanderfolgender Schleifen von Datensignalen einer bestimmten Taktrate. Expired - Fee Related DE69102770T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US07/602,433 US5195097A (en) 1990-10-19 1990-10-19 High speed tester
PCT/US1991/001364 WO1992007322A1 (en) 1990-10-19 1991-02-27 High speed tester

Publications (2)

Publication Number Publication Date
DE69102770D1 true DE69102770D1 (de) 1994-08-11
DE69102770T2 DE69102770T2 (de) 1995-01-05

Family

ID=24411337

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69102770T Expired - Fee Related DE69102770T2 (de) 1990-10-19 1991-02-27 Hochgeschwindigkeitstester und Verfahren zur Erzeugung aufeinanderfolgender Schleifen von Datensignalen einer bestimmten Taktrate.

Country Status (5)

Country Link
US (1) US5195097A (de)
EP (1) EP0553080B1 (de)
JP (1) JPH07122855B2 (de)
DE (1) DE69102770T2 (de)
WO (1) WO1992007322A1 (de)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5260946A (en) * 1991-06-03 1993-11-09 Hughes Missile Systems Company Self-testing and self-configuration in an integrated circuit
US5805794A (en) * 1996-03-28 1998-09-08 Cypress Semiconductor Corp. CPLD serial programming with extra read register
US5768288A (en) * 1996-03-28 1998-06-16 Cypress Semiconductor Corp. Method and apparatus for programming a programmable logic device having verify logic for comparing verify data read from a memory location with program data
US5815510A (en) * 1996-03-28 1998-09-29 Cypress Semiconductor Corp. Serial programming of instruction codes in different numbers of clock cycles
US5835503A (en) * 1996-03-28 1998-11-10 Cypress Semiconductor Corp. Method and apparatus for serially programming a programmable logic device
JP3833341B2 (ja) * 1997-05-29 2006-10-11 株式会社アドバンテスト Ｉｃ試験装置のテストパターン発生回路
US6859901B2 (en) * 2000-12-27 2005-02-22 Winbond Electronics Corp. Method for testing memories with seamless data input/output by interleaving seamless bank commands
ITRM20030354A1 (it) * 2003-07-17 2005-01-18 Micron Technology Inc Unita' di controllo per dispositivo di memoria.
US8103924B2 (en) * 2008-01-29 2012-01-24 Globalfoundries Inc. Test access mechanism for multi-core processor or other integrated circuit
US9559987B1 (en) * 2008-09-26 2017-01-31 Tellabs Operations, Inc Method and apparatus for improving CAM learn throughput using a cache
US9262292B2 (en) * 2012-06-11 2016-02-16 New York University Test access system, method and computer-accessible medium for chips with spare identical cores

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3806888A (en) * 1972-12-04 1974-04-23 Ibm Hierarchial memory system
US4323968A (en) * 1978-10-26 1982-04-06 International Business Machines Corporation Multilevel storage system having unitary control of data transfers
DE3023699A1 (de) * 1980-06-25 1982-01-14 Ibm Deutschland Gmbh, 7000 Stuttgart Verfahren und anordnung zur erzeugung von impulsen vorgegebener zeitrelation innerhalb vorgegebener impulsintervalle mit hoher zeitlicher aufloesung
US4451918A (en) * 1981-10-09 1984-05-29 Teradyne, Inc. Test signal reloader
JPS5990067A (ja) * 1982-11-15 1984-05-24 Advantest Corp 論理回路試験用パタ−ン発生装置
US4598245B1 (en) * 1983-06-13 1993-11-16 Circuit tester having indirect counters
US4696005A (en) * 1985-06-03 1987-09-22 International Business Machines Corporation Apparatus for reducing test data storage requirements for high speed VLSI circuit testing
US4682330A (en) * 1985-10-11 1987-07-21 International Business Machines Corporation Hierarchical test system architecture
US4796222A (en) * 1985-10-28 1989-01-03 International Business Machines Corporation Memory structure for nonsequential storage of block bytes in multi-bit chips
US4931723A (en) * 1985-12-18 1990-06-05 Schlumberger Technologies, Inc. Automatic test system having a "true tester-per-pin" architecture
US4994732A (en) * 1985-12-18 1991-02-19 Schlumberger Technologies, Inc. Automatic test system having a "true tester-per-pin" architecture
DE3613896A1 (de) * 1986-04-24 1987-10-29 Siemens Ag Einrichtung und verfahren fuer die ein- oder ausgabe binaerer daten, insbesondere testdaten digitaler prueflinge
US4730318A (en) * 1986-11-24 1988-03-08 International Business Machines Corporation Modular organized storage tester

Also Published As

Publication number Publication date
EP0553080A1 (de) 1993-08-04
EP0553080B1 (de) 1994-07-06
JPH07122855B2 (ja) 1995-12-25
DE69102770T2 (de) 1995-01-05
JPH05507163A (ja) 1993-10-14
US5195097A (en) 1993-03-16
WO1992007322A1 (en) 1992-04-30

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee