DE68922695D1 - Diagnostika einer Leiterplatte mit einer Mehrzahl elektronischer Hybridbauelemente. - Google Patents
Diagnostika einer Leiterplatte mit einer Mehrzahl elektronischer Hybridbauelemente.Info
- Publication number
- DE68922695D1 DE68922695D1 DE68922695T DE68922695T DE68922695D1 DE 68922695 D1 DE68922695 D1 DE 68922695D1 DE 68922695 T DE68922695 T DE 68922695T DE 68922695 T DE68922695 T DE 68922695T DE 68922695 D1 DE68922695 D1 DE 68922695D1
- Authority
- DE
- Germany
- Prior art keywords
- diagnostics
- circuit board
- printed circuit
- hybrid components
- electronic hybrid
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/261—Functional testing by simulating additional hardware, e.g. fault simulation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318544—Scanning methods, algorithms and patterns
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318566—Comparators; Diagnosing the device under test
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/273—Tester hardware, i.e. output processing circuits
- G06F11/2733—Test interface between tester and unit under test
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US07/267,409 US4963824A (en) | 1988-11-04 | 1988-11-04 | Diagnostics of a board containing a plurality of hybrid electronic components |
Publications (2)
Publication Number | Publication Date |
---|---|
DE68922695D1 true DE68922695D1 (de) | 1995-06-22 |
DE68922695T2 DE68922695T2 (de) | 1996-01-25 |
Family
ID=23018645
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE68922695T Expired - Fee Related DE68922695T2 (de) | 1988-11-04 | 1989-10-24 | Diagnostika einer Leiterplatte mit einer Mehrzahl elektronischer Hybridbauelemente. |
Country Status (4)
Country | Link |
---|---|
US (1) | US4963824A (de) |
EP (1) | EP0367710B1 (de) |
JP (1) | JP2505049B2 (de) |
DE (1) | DE68922695T2 (de) |
Families Citing this family (27)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5068603A (en) * | 1987-10-07 | 1991-11-26 | Xilinx, Inc. | Structure and method for producing mask-programmed integrated circuits which are pin compatible substitutes for memory-configured logic arrays |
JP2561164B2 (ja) * | 1990-02-26 | 1996-12-04 | 三菱電機株式会社 | 半導体集積回路 |
JPH0454607A (ja) * | 1990-06-22 | 1992-02-21 | Fanuc Ltd | 数値制御装置の分線プリント板 |
US5498972A (en) * | 1990-08-15 | 1996-03-12 | Telefonaktiebolaget Lm Ericsson | Device for monitoring the supply voltage on integrated circuits |
US5198759A (en) * | 1990-11-27 | 1993-03-30 | Alcatel N.V. | Test apparatus and method for testing digital system |
US5321277A (en) * | 1990-12-31 | 1994-06-14 | Texas Instruments Incorporated | Multi-chip module testing |
US5132635A (en) * | 1991-03-05 | 1992-07-21 | Ast Research, Inc. | Serial testing of removable circuit boards on a backplane bus |
DE4110551C1 (de) * | 1991-03-30 | 1992-07-23 | Ita Ingenieurbuero Fuer Testaufgaben Gmbh, 2000 Hamburg, De | |
US5323107A (en) * | 1991-04-15 | 1994-06-21 | Hitachi America, Ltd. | Active probe card |
FI89223C (fi) * | 1991-10-03 | 1993-08-25 | Nokia Mobile Phones Ltd | Digitalt audiointerface i gsm-anordning |
US5410551A (en) * | 1992-01-02 | 1995-04-25 | Andahl Corporation | Net verification method and apparatus |
US5260649A (en) * | 1992-01-03 | 1993-11-09 | Hewlett-Packard Company | Powered testing of mixed conventional/boundary-scan logic |
US5448166A (en) * | 1992-01-03 | 1995-09-05 | Hewlett-Packard Company | Powered testing of mixed conventional/boundary-scan logic |
TW253097B (de) * | 1992-03-02 | 1995-08-01 | At & T Corp | |
GB9212646D0 (en) * | 1992-06-15 | 1992-07-29 | Marconi Instruments Ltd | A method of and equipment for testing the electrical conductivity of a connection |
GB9217728D0 (en) * | 1992-08-20 | 1992-09-30 | Texas Instruments Ltd | Method of testing interconnections between integrated circuits in a circuit |
US5390194A (en) * | 1993-11-17 | 1995-02-14 | Grumman Aerospace Corporation | ATG test station |
DE59500064D1 (de) * | 1995-03-16 | 1997-01-23 | Siemens Ag | Platine mit eingebauter Kontaktfühlerprüfung für integrierte Schaltungen |
US5818251A (en) * | 1996-06-11 | 1998-10-06 | National Semiconductor Corporation | Apparatus and method for testing the connections between an integrated circuit and a printed circuit board |
US5841788A (en) * | 1996-10-18 | 1998-11-24 | Lucent Technologies Inc. | Methods for backplane interconnect testing |
JPH10150514A (ja) * | 1996-11-18 | 1998-06-02 | Brother Ind Ltd | 画像読取装置、およびこの画像読取装置が備える光電変換部の調整装置 |
US20030115502A1 (en) * | 2001-12-14 | 2003-06-19 | Smiths Industries Aerospace & Defense Systems, Inc. | Method of restoring encapsulated integrated circuit devices |
JP2004108872A (ja) * | 2002-09-17 | 2004-04-08 | Sanyo Electric Co Ltd | 半導体パッケージ内部の結線テスト方法 |
US7265534B2 (en) * | 2004-10-20 | 2007-09-04 | Freescale Semiconductor, Inc. | Test system for device characterization |
US7350124B2 (en) * | 2005-10-18 | 2008-03-25 | International Business Machines Corporation | Method and apparatus for accelerating through-the pins LBIST simulation |
US9400311B1 (en) * | 2015-03-31 | 2016-07-26 | Cadence Design Systems, Inc. | Method and system of collective failure diagnosis for multiple electronic circuits |
KR102471771B1 (ko) * | 2020-11-20 | 2022-11-29 | 주식회사 에스디에이 | 고속 신호 특성 검증을 위한 지능형 프로브 카드 |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3924181A (en) * | 1973-10-16 | 1975-12-02 | Hughes Aircraft Co | Test circuitry employing a cyclic code generator |
US4055806A (en) * | 1976-01-23 | 1977-10-25 | Patel Harshad M | Integrated circuit substitution device |
US4475169A (en) * | 1982-02-01 | 1984-10-02 | Analog Devices, Incorporated | High-accuracy sine-function generator |
US4465972A (en) * | 1982-04-05 | 1984-08-14 | Allied Corporation | Connection arrangement for printed circuit board testing apparatus |
FR2531230A1 (fr) * | 1982-07-27 | 1984-02-03 | Rank Xerox Sa | Ensemble destine au test automatique centralise de circuits imprimes et procede de test de circuits a microprocesseur faisant application de cet ensemble |
US4519078A (en) * | 1982-09-29 | 1985-05-21 | Storage Technology Corporation | LSI self-test method |
US4513418A (en) * | 1982-11-08 | 1985-04-23 | International Business Machines Corporation | Simultaneous self-testing system |
DE3682305D1 (de) * | 1985-03-23 | 1991-12-12 | Int Computers Ltd | Integrierte digitale schaltungen. |
US4687988A (en) * | 1985-06-24 | 1987-08-18 | International Business Machines Corporation | Weighted random pattern testing apparatus and method |
US4745355A (en) * | 1985-06-24 | 1988-05-17 | International Business Machines Corporation | Weighted random pattern testing apparatus and method |
US4709366A (en) * | 1985-07-29 | 1987-11-24 | John Fluke Mfg. Co., Inc. | Computer assisted fault isolation in circuit board testing |
US4701696A (en) * | 1985-11-25 | 1987-10-20 | Tektronix, Inc. | Retargetable buffer probe |
FR2622711A1 (fr) * | 1987-11-04 | 1989-05-05 | Trt Telecom Radio Electr | Dispositif destine a remplacer un circuit integre comportant sur la meme puce un processeur de signal et un ensemble de memoire contenant des informations figees |
-
1988
- 1988-11-04 US US07/267,409 patent/US4963824A/en not_active Expired - Fee Related
-
1989
- 1989-10-20 JP JP1271888A patent/JP2505049B2/ja not_active Expired - Lifetime
- 1989-10-24 DE DE68922695T patent/DE68922695T2/de not_active Expired - Fee Related
- 1989-10-24 EP EP89480167A patent/EP0367710B1/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
DE68922695T2 (de) | 1996-01-25 |
JP2505049B2 (ja) | 1996-06-05 |
US4963824A (en) | 1990-10-16 |
EP0367710B1 (de) | 1995-05-17 |
EP0367710A2 (de) | 1990-05-09 |
EP0367710A3 (de) | 1991-09-04 |
JPH02171668A (ja) | 1990-07-03 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
DE68922695T2 (de) | Diagnostika einer Leiterplatte mit einer Mehrzahl elektronischer Hybridbauelemente. | |
DE68928150T2 (de) | Herstellungsverfahren von einer mehrschichtigen Leiterplatte | |
DE3677937D1 (de) | Modul mit zwei gedruckten schaltungsplatten. | |
DE68907089T2 (de) | Leiterplatten mit niedriger Dielektrizitätskonstante. | |
DE68915973D1 (de) | Elektrischer Verbinder unter Verwendung einer Leiterplatte. | |
DE3669431D1 (de) | Gedruckte schaltungsplatte mit hoher dichte. | |
IT1181918B (it) | Scheda a circuiti stampati | |
DE69020204T2 (de) | Mehrschichtige gedruckte Leiterplatte. | |
KR900702760A (ko) | 인쇄회로기판 | |
DE69206534D1 (de) | Musterstruktur einer Leiterplatte. | |
DE68906129T2 (de) | Führung für gedruckte Schaltungsplatten. | |
DE3483488D1 (de) | Elektronische anordnung mit einer mehrschichtigen verdrahtungsstruktur. | |
FR2607609B1 (fr) | Carte a circuits integres | |
DE3887054T2 (de) | Herstellung einer mehrschichtigen gedruckten Schaltungsplatte. | |
TR26976A (tr) | Bir baski devre plakasina lehim yapma suretiyle tesbit edilen bir pim. | |
DE3872865D1 (de) | Gedruckte leiterkarte. | |
DE69022017D1 (de) | Spannungskontrollierter Oszillator auf einer laminierten Leiterplatte. | |
DE3784634D1 (de) | Gedruckte schaltungsplatte. | |
DE59300799D1 (de) | Leiterkarte für eine Leistungshalbleiter aufweisende Leistungselektronikschaltung. | |
DE58905591D1 (de) | Drucktastenanordnung in einer Leiterplatte. | |
DE3689881D1 (de) | Mit kupfer kaschierte biegsame gedruckte schaltungsplatte. | |
DE3688008D1 (de) | Gegossenes produkt mit einer gedruckten schaltungsplatte. | |
DE58904371D1 (de) | Elektronische schaltungsanordnung. | |
DE68923099D1 (de) | Überprüfung von Leiterplatten mit Mehrfachmustern. | |
DE3676822D1 (de) | Mehrschichtige gedruckte verdrahtungsplatte. |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |