DE68923099D1 - Überprüfung von Leiterplatten mit Mehrfachmustern. - Google Patents

Überprüfung von Leiterplatten mit Mehrfachmustern.

Info

Publication number
DE68923099D1
DE68923099D1 DE68923099T DE68923099T DE68923099D1 DE 68923099 D1 DE68923099 D1 DE 68923099D1 DE 68923099 T DE68923099 T DE 68923099T DE 68923099 T DE68923099 T DE 68923099T DE 68923099 D1 DE68923099 D1 DE 68923099D1
Authority
DE
Germany
Prior art keywords
printed circuit
circuit boards
multiple patterns
checking printed
checking
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE68923099T
Other languages
English (en)
Other versions
DE68923099T2 (de
Inventor
Frank Henning Blitchington
Edwin Arthur Chandross
Lloyd Shepherd
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AT&T Corp
Original Assignee
AT&T Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by AT&T Corp filed Critical AT&T Corp
Publication of DE68923099D1 publication Critical patent/DE68923099D1/de
Application granted granted Critical
Publication of DE68923099T2 publication Critical patent/DE68923099T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G01R31/309—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of printed or hybrid circuits or circuit substrates
    • C—CHEMISTRY; METALLURGY
    • C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
    • C09K11/00—Luminescent, e.g. electroluminescent, chemiluminescent materials
    • C09K11/06—Luminescent, e.g. electroluminescent, chemiluminescent materials containing organic luminescent materials
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/0266—Marks, test patterns or identification means
    • H05K1/0269—Marks, test patterns or identification means for visual or optical inspection
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/03—Use of materials for the substrate
    • H05K1/0313—Organic insulating material
    • H05K1/0353—Organic insulating material consisting of two or more materials, e.g. two or more polymers, polymer + filler, + reinforcement
    • H05K1/0373—Organic insulating material consisting of two or more materials, e.g. two or more polymers, polymer + filler, + reinforcement containing additives, e.g. fillers
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/12—Using specific substances
    • H05K2203/122—Organic non-polymeric compounds, e.g. oil, wax, thiol
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/16—Inspection; Monitoring; Aligning
    • H05K2203/161—Using chemical substances, e.g. colored or fluorescent, for facilitating optical or visual inspection
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S428/00—Stock material or miscellaneous articles
    • Y10S428/901—Printed circuit
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T428/00—Stock material or miscellaneous articles
    • Y10T428/31504—Composite [nonstructural laminate]
    • Y10T428/31511—Of epoxy ether
    • Y10T428/31529—Next to metal

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Chemical & Material Sciences (AREA)
  • Electromagnetism (AREA)
  • Organic Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Materials Engineering (AREA)
  • Toxicology (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing Of Printed Wiring (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Luminescent Compositions (AREA)
  • Epoxy Resins (AREA)
  • Reinforced Plastic Materials (AREA)
DE68923099T 1988-01-19 1989-01-11 Überprüfung von Leiterplatten mit Mehrfachmustern. Expired - Fee Related DE68923099T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/144,763 US4965208A (en) 1983-07-29 1988-01-19 Inspection of multipattern circuit boards

Publications (2)

Publication Number Publication Date
DE68923099D1 true DE68923099D1 (de) 1995-07-27
DE68923099T2 DE68923099T2 (de) 1996-05-15

Family

ID=22510025

Family Applications (1)

Application Number Title Priority Date Filing Date
DE68923099T Expired - Fee Related DE68923099T2 (de) 1988-01-19 1989-01-11 Überprüfung von Leiterplatten mit Mehrfachmustern.

Country Status (7)

Country Link
US (1) US4965208A (de)
EP (1) EP0325355B1 (de)
JP (1) JPH01198093A (de)
KR (1) KR970006228B1 (de)
CA (1) CA1335625C (de)
DE (1) DE68923099T2 (de)
HK (1) HK100496A (de)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW203675B (de) * 1991-08-28 1993-04-11 Mitsubishi Gas Chemical Co
ES2281979T5 (es) † 1998-12-11 2010-04-28 Isola Usa Corp. Tinte fluorescente y visible que contiene materiales laminados.
JP3695407B2 (ja) * 2002-02-25 2005-09-14 ソニーケミカル株式会社 硬化性接着剤組成物の硬化物の硬化レベルの非破壊検査方法及び電子装置の製造方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3617744A (en) * 1969-07-01 1971-11-02 Bell Telephone Labor Inc Method and apparatus for circuit module testing by comparison of a fluorescent image with a standard pattern
US4152723A (en) * 1977-12-19 1979-05-01 Sperry Rand Corporation Method of inspecting circuit boards and apparatus therefor
US4774188A (en) * 1983-07-29 1988-09-27 American Telephone And Telegraph Company, At&T Bell Laboratories Control of circuit board quality
CA1215615A (en) * 1983-07-29 1986-12-23 Edwin A. Chandross Control of circuit board quality

Also Published As

Publication number Publication date
CA1335625C (en) 1995-05-23
US4965208A (en) 1990-10-23
EP0325355B1 (de) 1995-06-21
HK100496A (en) 1996-06-14
JPH0577354B2 (de) 1993-10-26
EP0325355A1 (de) 1989-07-26
DE68923099T2 (de) 1996-05-15
KR970006228B1 (en) 1997-04-24
JPH01198093A (ja) 1989-08-09

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Legal Events

Date Code Title Description
8332 No legal effect for de
8370 Indication of lapse of patent is to be deleted
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee