DE68917521T2 - Hoch-empfindlicher Positivresist mit hohem Auflösungsvermögen für Elektronenstrahlen. - Google Patents
Hoch-empfindlicher Positivresist mit hohem Auflösungsvermögen für Elektronenstrahlen.Info
- Publication number
- DE68917521T2 DE68917521T2 DE68917521T DE68917521T DE68917521T2 DE 68917521 T2 DE68917521 T2 DE 68917521T2 DE 68917521 T DE68917521 T DE 68917521T DE 68917521 T DE68917521 T DE 68917521T DE 68917521 T2 DE68917521 T2 DE 68917521T2
- Authority
- DE
- Germany
- Prior art keywords
- electron beams
- highly sensitive
- positive resist
- resolving power
- high resolving
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/039—Macromolecular compounds which are photodegradable, e.g. positive electron resists
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Photosensitive Polymer And Photoresist Processing (AREA)
- Materials For Photolithography (AREA)
- Electron Beam Exposure (AREA)
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12616488A JPH0328851A (ja) | 1988-05-24 | 1988-05-24 | 電子ビームレジストのパターン形成方法 |
JP63267507A JP2598492B2 (ja) | 1988-10-24 | 1988-10-24 | ポジ型電子線レジストパターンの形成方法 |
JP8556989A JP2525891B2 (ja) | 1989-04-03 | 1989-04-03 | ポジ型電子線レジストの現像方法 |
JP1087703A JPH0823697B2 (ja) | 1989-04-06 | 1989-04-06 | ポジ型電子線レジスト |
Publications (2)
Publication Number | Publication Date |
---|---|
DE68917521D1 DE68917521D1 (de) | 1994-09-22 |
DE68917521T2 true DE68917521T2 (de) | 1994-12-22 |
Family
ID=27467129
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE68917521T Expired - Fee Related DE68917521T2 (de) | 1988-05-24 | 1989-05-23 | Hoch-empfindlicher Positivresist mit hohem Auflösungsvermögen für Elektronenstrahlen. |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP0343603B1 (de) |
KR (1) | KR900018743A (de) |
DE (1) | DE68917521T2 (de) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7867688B2 (en) | 2006-05-30 | 2011-01-11 | Eastman Kodak Company | Laser ablation resist |
US7745101B2 (en) | 2006-06-02 | 2010-06-29 | Eastman Kodak Company | Nanoparticle patterning process |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
AU4719279A (en) * | 1978-05-22 | 1979-11-29 | Western Electric Co. Inc. | Lithographic resist and device processing utilizing same |
-
1989
- 1989-05-22 KR KR1019890006845A patent/KR900018743A/ko not_active Application Discontinuation
- 1989-05-23 EP EP89109284A patent/EP0343603B1/de not_active Expired - Lifetime
- 1989-05-23 DE DE68917521T patent/DE68917521T2/de not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP0343603A3 (en) | 1990-08-22 |
EP0343603A2 (de) | 1989-11-29 |
EP0343603B1 (de) | 1994-08-17 |
KR900018743A (ko) | 1990-12-22 |
DE68917521D1 (de) | 1994-09-22 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |