DE68906982D1 - Adapterrahmen zum pruefen von gedruckten schaltungen hoher dichte. - Google Patents
Adapterrahmen zum pruefen von gedruckten schaltungen hoher dichte.Info
- Publication number
- DE68906982D1 DE68906982D1 DE8989401942T DE68906982T DE68906982D1 DE 68906982 D1 DE68906982 D1 DE 68906982D1 DE 8989401942 T DE8989401942 T DE 8989401942T DE 68906982 T DE68906982 T DE 68906982T DE 68906982 D1 DE68906982 D1 DE 68906982D1
- Authority
- DE
- Germany
- Prior art keywords
- high density
- adapter frame
- testing printed
- density circuits
- printed high
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2805—Bare printed circuit boards
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
- G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/03—Use of materials for the substrate
- H05K1/0393—Flexible materials
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/14—Structural association of two or more printed circuits
- H05K1/141—One or more single auxiliary printed circuits mounted on a main printed circuit, e.g. modules, adapters
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/325—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by abutting or pinching, i.e. without alloying process; mechanical auxiliary parts therefor
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Measuring Leads Or Probes (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR8809306A FR2634025B1 (fr) | 1988-07-08 | 1988-07-08 | Adaptateur de brochage pour le test de circuits imprimes de haute densite |
Publications (2)
Publication Number | Publication Date |
---|---|
DE68906982D1 true DE68906982D1 (de) | 1993-07-15 |
DE68906982T2 DE68906982T2 (de) | 1993-09-16 |
Family
ID=9368256
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE1989606982 Expired - Fee Related DE68906982T2 (de) | 1988-07-08 | 1989-07-06 | Adapterrahmen zum pruefen von gedruckten schaltungen hoher dichte. |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP0354080B1 (de) |
DE (1) | DE68906982T2 (de) |
FR (1) | FR2634025B1 (de) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2660072B1 (fr) * | 1990-03-21 | 1992-07-24 | Int Market Dev | Appareil de test de circuit imprime. |
IT1266653B1 (it) * | 1993-11-02 | 1997-01-09 | Circuit Line Spa | Macchina per eseguire il test elettrico simultaneo, sulle due facce di una piastra con circuiti stampati |
JP3099873B2 (ja) * | 1996-12-05 | 2000-10-16 | 日本電産リード株式会社 | プリント基板検査装置およびユニバーサル型プリント基板検査装置の使用方法 |
DE19907727A1 (de) * | 1999-02-23 | 2000-08-24 | Test Plus Electronic Gmbh | Testadapter zur Kontaktierung von bestückten Leiterplatinen |
US7009381B2 (en) | 2002-03-21 | 2006-03-07 | Agilent Technologies, Inc. | Adapter method and apparatus for interfacing a tester with a device under test |
CN113540843B (zh) * | 2020-04-16 | 2023-01-06 | 富联精密电子(天津)有限公司 | 电路板模组及电子装置 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3866119A (en) * | 1973-09-10 | 1975-02-11 | Probe Rite Inc | Probe head-probing machine coupling adaptor |
US4427250A (en) * | 1981-01-19 | 1984-01-24 | Everett/Charles Test Equipment, Inc. | Printed circuit board test fixture with compliant platen |
DK291184D0 (da) * | 1984-06-13 | 1984-06-13 | Boeegh Petersen Allan | Fremgangsmaade og indretning til test af kredsloebsplader |
-
1988
- 1988-07-08 FR FR8809306A patent/FR2634025B1/fr not_active Expired - Lifetime
-
1989
- 1989-07-06 EP EP89401942A patent/EP0354080B1/de not_active Expired - Lifetime
- 1989-07-06 DE DE1989606982 patent/DE68906982T2/de not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP0354080B1 (de) | 1993-06-09 |
FR2634025B1 (fr) | 1990-11-09 |
FR2634025A1 (fr) | 1990-01-12 |
EP0354080A1 (de) | 1990-02-07 |
DE68906982T2 (de) | 1993-09-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |