DE3771555D1 - Apparat zum testen von halbleiterelementen. - Google Patents

Apparat zum testen von halbleiterelementen.

Info

Publication number
DE3771555D1
DE3771555D1 DE8787303105T DE3771555T DE3771555D1 DE 3771555 D1 DE3771555 D1 DE 3771555D1 DE 8787303105 T DE8787303105 T DE 8787303105T DE 3771555 T DE3771555 T DE 3771555T DE 3771555 D1 DE3771555 D1 DE 3771555D1
Authority
DE
Germany
Prior art keywords
semiconductor elements
testing semiconductor
testing
elements
semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE8787303105T
Other languages
English (en)
Inventor
Kazuhiko Inamura
Yoji Tashita
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Oki Electric Industry Co Ltd
Original Assignee
Oki Electric Industry Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP5361086U external-priority patent/JPS62165573U/ja
Priority claimed from JP61082394A external-priority patent/JPH0711556B2/ja
Application filed by Oki Electric Industry Co Ltd filed Critical Oki Electric Industry Co Ltd
Application granted granted Critical
Publication of DE3771555D1 publication Critical patent/DE3771555D1/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
    • G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
    • G01R31/1263—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation
    • G01R31/129—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation of components or parts made of semiconducting materials; of LV components or parts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
DE8787303105T 1986-04-11 1987-04-09 Apparat zum testen von halbleiterelementen. Expired - Fee Related DE3771555D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP5361086U JPS62165573U (de) 1986-04-11 1986-04-11
JP61082394A JPH0711556B2 (ja) 1986-04-11 1986-04-11 静電耐圧試験方法及びその装置

Publications (1)

Publication Number Publication Date
DE3771555D1 true DE3771555D1 (de) 1991-08-29

Family

ID=26394320

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8787303105T Expired - Fee Related DE3771555D1 (de) 1986-04-11 1987-04-09 Apparat zum testen von halbleiterelementen.

Country Status (3)

Country Link
US (1) US4806857A (de)
EP (1) EP0243045B1 (de)
DE (1) DE3771555D1 (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2566426B2 (ja) * 1987-11-12 1996-12-25 三菱電機株式会社 半導体装置の静電気破壊試験方法およびその装置
JP2836676B2 (ja) * 1996-02-09 1998-12-14 日本電気株式会社 半導体要素の試験方法及び装置
DE19744925B4 (de) * 1997-10-10 2006-08-10 Deutsche Telekom Ag Verfahren zum Erkennen unerwünschter offener Verbindungen
DE19845108B4 (de) * 1998-09-30 2004-08-26 Infineon Technologies Ag Verfahren zur Ermittlung von CDM-Testdaten
EP2056117B1 (de) * 2007-10-30 2010-07-07 ISMECA Semiconductor Holding SA Prüfstand zum Prüfen des Kriechstroms durch das Isoliergehäuse von leistungselektronischen Bauteilen und entsprechendes Verfahren
CN106019150B (zh) * 2016-06-16 2018-08-31 凯工电气（苏州）有限公司 发电机试验夹紧装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59231458A (ja) * 1983-06-15 1984-12-26 Hitachi Micro Comput Eng Ltd 半導体装置の静電破壊試験方法
JPS6073375A (ja) * 1983-09-30 1985-04-25 Oki Electric Ind Co Ltd 半導体装置の試験方法
US4677375A (en) * 1985-06-14 1987-06-30 Hanwa Electronic Co., Ltd. Apparatus for testing integrated circuit

Also Published As

Publication number Publication date
US4806857A (en) 1989-02-21
EP0243045B1 (de) 1991-07-24
EP0243045A1 (de) 1987-10-28

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee