DE3686100D1 - Apparat zur pruefung von objekten. - Google Patents

Apparat zur pruefung von objekten.

Info

Publication number
DE3686100D1
DE3686100D1 DE8686303693T DE3686100T DE3686100D1 DE 3686100 D1 DE3686100 D1 DE 3686100D1 DE 8686303693 T DE8686303693 T DE 8686303693T DE 3686100 T DE3686100 T DE 3686100T DE 3686100 D1 DE3686100 D1 DE 3686100D1
Authority
DE
Germany
Prior art keywords
testing objects
testing
objects
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE8686303693T
Other languages
English (en)
Other versions
DE3686100T2 (de
Inventor
Michael Stephen Martin
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Soudronic AG
Original Assignee
Soudronic AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Soudronic AG filed Critical Soudronic AG
Application granted granted Critical
Publication of DE3686100D1 publication Critical patent/DE3686100D1/de
Publication of DE3686100T2 publication Critical patent/DE3686100T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/024—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of diode-array scanning
DE8686303693T 1985-05-22 1986-05-15 Apparat zur pruefung von objekten. Expired - Fee Related DE3686100T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB8512979A GB2175396B (en) 1985-05-22 1985-05-22 Apparatus for examining objects

Publications (2)

Publication Number Publication Date
DE3686100D1 true DE3686100D1 (de) 1992-08-27
DE3686100T2 DE3686100T2 (de) 1993-01-07

Family

ID=10579534

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8686303693T Expired - Fee Related DE3686100T2 (de) 1985-05-22 1986-05-15 Apparat zur pruefung von objekten.

Country Status (6)

Country Link
US (1) US4858156A (de)
EP (1) EP0206501B1 (de)
JP (1) JPS61271442A (de)
DE (1) DE3686100T2 (de)
GB (1) GB2175396B (de)
IE (1) IE58985B1 (de)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63265108A (ja) * 1986-12-12 1988-11-01 Toyo Seikan Kaisha Ltd 缶の検査方法およびその装置
EP0332376A3 (de) * 1988-03-07 1990-10-10 Sentinel Vision Inc. Apparat zur Inspektion von Umbördelungen bei Blechdosen und ähnlichem
US5164995A (en) * 1989-11-27 1992-11-17 General Motors Corporation Signature analysis apparatus
DE4042465C2 (de) * 1989-11-27 1995-03-02 Gen Motors Corp Kennform-Analysevorrichtung
WO1992003364A1 (en) * 1990-08-25 1992-03-05 Intelligent Automation Systems, Inc. Programmable reconfigurable parts feeder
US5233328A (en) * 1990-09-17 1993-08-03 Fmc Corporation Method for processing compacted data
US5157486A (en) * 1990-09-21 1992-10-20 Fmc Corporation High resolution camera sensor having a linear pixel array
US5142591A (en) * 1990-09-21 1992-08-25 Fmc Corporation High resolution camera with hardware data compaction
GB2248934B (en) * 1990-09-17 1994-11-30 Fmc Corp Automatic windowing for article recognition
US5103304A (en) * 1990-09-17 1992-04-07 Fmc Corporation High-resolution vision system for part inspection
WO1992017287A2 (en) * 1991-03-29 1992-10-15 Csx Transportation, Inc. Device to uniquely recognize travelling containers
US5369713A (en) * 1992-07-09 1994-11-29 Schwartz; Nira Inspection method using area of interest (AOI) analysis
KR940005104A (ko) * 1992-08-31 1994-03-16 김광호 Ccd형 카메라의 스미어 제거방법
US5387768A (en) * 1993-09-27 1995-02-07 Otis Elevator Company Elevator passenger detector and door control system which masks portions of a hall image to determine motion and court passengers
US5286980A (en) * 1992-10-30 1994-02-15 Oms-Optical Measuring Systems Product discrimination system and method therefor
US5410149A (en) * 1993-07-14 1995-04-25 Otis Elevator Company Optical obstruction detector with light barriers having planes of light for controlling automatic doors
JPH08225279A (ja) * 1995-02-23 1996-09-03 Otis Elevator Co エレベーターのドア安全装置
US5892808A (en) * 1996-06-28 1999-04-06 Techne Systems, Inc. Method and apparatus for feature detection in a workpiece
US6175415B1 (en) 1997-02-19 2001-01-16 United Technologies Corporation Optical profile sensor
US6272437B1 (en) 1998-04-17 2001-08-07 Cae Inc. Method and apparatus for improved inspection and classification of attributes of a workpiece
US6400833B1 (en) 1998-06-19 2002-06-04 Oms-Optical Measuring Systems Method and apparatus for discrimination of product units from spread spectrum images of thin portions of product units

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1048585A (en) * 1962-07-20 1966-11-16 North Atlantic Res Products Lt Apparatus for the automatic dimensional inspection of an object
US3389789A (en) * 1965-12-10 1968-06-25 Moore Vue Inc Detecting and sorting means for sheets having flaws
GB1213983A (en) * 1967-02-24 1970-11-25 Raleigh Industries Ltd A method of testing components and apparatus therefor
GB1238310A (de) * 1967-09-11 1971-07-07
US3812376A (en) * 1972-02-18 1974-05-21 Agency Ind Science Techn Device for controlling dimensional accuracy during machining of a cylindrical workpiece
SE7308776L (de) * 1973-06-21 1974-12-23 Platmanufaktur Ab
US4115803A (en) * 1975-05-23 1978-09-19 Bausch & Lomb Incorporated Image analysis measurement apparatus and methods
JPS55110905A (en) * 1979-02-20 1980-08-27 Hajime Sangyo Kk Defect detecting device
JPS55132904A (en) * 1979-04-05 1980-10-16 Fuji Electric Co Ltd Shape inspection system
DE2916361A1 (de) * 1979-04-23 1980-11-06 Siemens Ag Verfahren und anordnung zum pruefen des randes von durchsichtigen gefaessen
GB2111213A (en) * 1981-12-09 1983-06-29 Neuss Schraubenwerk Method and apparatus for sorting screws
DE3277571D1 (en) * 1982-01-30 1987-12-10 Nhk Spring Co Ltd Screw inspection device
US4493105A (en) * 1982-03-31 1985-01-08 General Electric Company Method and apparatus for visual image processing
US4549205A (en) * 1982-05-10 1985-10-22 Takeda Chemical Industries, Ltd. Ampoule inspecting method
JPS5987081A (ja) * 1982-11-09 1984-05-19 池上通信機株式会社 外観品位検査方式
US4608709A (en) * 1983-03-08 1986-08-26 Owens-Illinois, Inc. Method and apparatus for gauging containers
JPS59182301A (ja) * 1983-03-31 1984-10-17 Hokuyo Automatic Co ワ−ク外形寸法測定装置
US4581632A (en) * 1983-05-27 1986-04-08 Key Technology, Inc. Optical inspection apparatus for moving articles
DE3587220T2 (de) * 1984-01-13 1993-07-08 Komatsu Mfg Co Ltd Identifizierungsverfahren von konturlinien.
JPS61193009A (ja) * 1985-02-22 1986-08-27 Toyo Glass Kk 容器の開口天面欠陥検査方法
JPS6269154A (ja) * 1985-09-21 1987-03-30 Hajime Sangyo Kk 壜口欠陥検査装置

Also Published As

Publication number Publication date
EP0206501B1 (de) 1992-07-22
EP0206501A2 (de) 1986-12-30
IE58985B1 (en) 1993-12-15
EP0206501A3 (en) 1989-11-02
IE861348L (en) 1986-11-22
GB2175396A (en) 1986-11-26
US4858156A (en) 1989-08-15
DE3686100T2 (de) 1993-01-07
GB2175396B (en) 1989-06-28
GB8512979D0 (en) 1985-06-26
JPS61271442A (ja) 1986-12-01

Similar Documents

Publication Publication Date Title
DE3853014T2 (de) Apparat zur Prüfung von Einkäufen.
DE3675462D1 (de) Apparat zur fortbewegung in rohren.
DE3683452D1 (de) Analyseapparat.
DE3789875D1 (de) Metrologischer Apparat.
DE3686100D1 (de) Apparat zur pruefung von objekten.
NO177167C (no) Apparat for bestemmelse av posisjon
DE3584412D1 (de) Supraleitender apparat.
DE3670374D1 (de) Vorrichtung zum ermitteln von hochspannungsleitungen.
DE3887325T2 (de) Positionsmessverfahren und -apparat.
DE3779181D1 (de) Apparat zum verbinden von metallischen baendern.
DE69021908D1 (de) Apparat zur Detektion.
DK631986D0 (da) Fremgangsmaade samt apparat til kalcinering.
DE3850592T2 (de) Apparat zur Vorbereitung von Briefen.
FI850047A0 (fi) Hushaolls- eller koeksapparat.
NO864198D0 (no) Fremgangsmaate og apparat for fluidanalyse.
DK162432C (da) Apparat til sortering af spisebestik
DK399586A (da) Fremgangsmaade samt apparat til bestemmelse af uklarheds- og straemningspunkt
DK174784D0 (da) Fremgangsmaade,apparat samt hylstre til stopning
DE69020985T2 (de) Apparat zur Trennung von Lösungen.
DE3678367D1 (de) Interferometrischer apparat.
DE69008217D1 (de) System zum Prüfen von Kabelstücken.
DE3861819D1 (de) Apparat zum runden von kreisquerschnitten.
DK15690A (da) Moentsorteringsapparat
DE3786645D1 (de) Apparat zur vorbehandlung von messdaten.
DE3381251D1 (de) Kombinatorische messmethode und apparat.

Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee