DE68915284T2 - Testen von schaltungen. - Google Patents

Testen von schaltungen.

Info

Publication number
DE68915284T2
DE68915284T2 DE68915284T DE68915284T DE68915284T2 DE 68915284 T2 DE68915284 T2 DE 68915284T2 DE 68915284 T DE68915284 T DE 68915284T DE 68915284 T DE68915284 T DE 68915284T DE 68915284 T2 DE68915284 T2 DE 68915284T2
Authority
DE
Germany
Prior art keywords
circuit testing
testing
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE68915284T
Other languages
English (en)
Other versions
DE68915284D1 (de
Inventor
Vivian Watts
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Everett Charles Technologies Inc
Original Assignee
BATH SCIENTIFIC Ltd MELKSHAM WILTSHIRE GB
Bath Scientific Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by BATH SCIENTIFIC Ltd MELKSHAM WILTSHIRE GB, Bath Scientific Ltd filed Critical BATH SCIENTIFIC Ltd MELKSHAM WILTSHIRE GB
Application granted granted Critical
Publication of DE68915284D1 publication Critical patent/DE68915284D1/de
Publication of DE68915284T2 publication Critical patent/DE68915284T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06794—Devices for sensing when probes are in contact, or in position to contact, with measured object

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measuring Leads Or Probes (AREA)
DE68915284T 1988-08-24 1989-08-17 Testen von schaltungen. Expired - Fee Related DE68915284T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB888820042A GB8820042D0 (en) 1988-08-24 1988-08-24 Circuit testing
PCT/GB1989/000959 WO1990002340A1 (en) 1988-08-24 1989-08-17 Circuit testing

Publications (2)

Publication Number Publication Date
DE68915284D1 DE68915284D1 (de) 1994-06-16
DE68915284T2 true DE68915284T2 (de) 1994-12-15

Family

ID=10642600

Family Applications (1)

Application Number Title Priority Date Filing Date
DE68915284T Expired - Fee Related DE68915284T2 (de) 1988-08-24 1989-08-17 Testen von schaltungen.

Country Status (6)

Country Link
US (1) US5124647A (de)
EP (1) EP0431034B1 (de)
JP (1) JP2660353B2 (de)
DE (1) DE68915284T2 (de)
GB (1) GB8820042D0 (de)
WO (1) WO1990002340A1 (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10059751B4 (de) * 2000-11-30 2004-09-30 Leuze Lumiflex Gmbh + Co. Kg Verfahren und Schaltungsanordnung zur Überprüfung eines Ausganges eines elektrischen Bauteils

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5357191A (en) * 1992-11-09 1994-10-18 Probot, Inc. Method and apparatus for testing circuit boards
US5550844A (en) * 1992-11-19 1996-08-27 Proteus Corporation Printed circuit board fault injection circuit
JP2994259B2 (ja) 1996-03-28 1999-12-27 オー・エイチ・ティー株式会社 基板検査方法および基板検査装置
US6087841A (en) * 1997-10-01 2000-07-11 International Business Machines Corporation Contact test circuit
JP2002014134A (ja) * 2000-06-30 2002-01-18 Hioki Ee Corp 回路基板検査装置
JP2006113009A (ja) * 2004-10-18 2006-04-27 Hioki Ee Corp 回路基板検査装置
JP5307085B2 (ja) * 2010-07-20 2013-10-02 日置電機株式会社 回路基板検査装置

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4175253A (en) * 1978-02-22 1979-11-20 Teradyne, Inc. Analyzing electrical circuit boards
US4188574A (en) * 1978-03-27 1980-02-12 Instrumentation Specialties Company AC Detector for DC ground faults and high capacitance in high-voltage DC power supplies
US4229693A (en) * 1978-11-24 1980-10-21 Honeywell Information Systems Inc. Method and apparatus for capacitance testing printed circuit boards
US4342958A (en) * 1980-03-28 1982-08-03 Honeywell Information Systems Inc. Automatic test equipment test probe contact isolation detection method
US4342957A (en) * 1980-03-28 1982-08-03 Honeywell Information Systems Inc. Automatic test equipment test probe contact isolation detection apparatus and method
US4565966A (en) * 1983-03-07 1986-01-21 Kollmorgen Technologies Corporation Method and apparatus for testing of electrical interconnection networks
US4780836A (en) * 1985-08-14 1988-10-25 Kabushiki Kaisha Toshiba Method of testing semiconductor devices using a probe card
JPS6379075A (ja) * 1986-09-22 1988-04-09 Nippon Seiko Kk 導通検査装置
US5006808A (en) * 1989-03-21 1991-04-09 Bath Scientific Limited Testing electrical circuits
US5019771A (en) * 1990-05-09 1991-05-28 Knights Technology, Inc. Contact sensing for integrated circuit testing

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10059751B4 (de) * 2000-11-30 2004-09-30 Leuze Lumiflex Gmbh + Co. Kg Verfahren und Schaltungsanordnung zur Überprüfung eines Ausganges eines elektrischen Bauteils

Also Published As

Publication number Publication date
JP2660353B2 (ja) 1997-10-08
EP0431034A1 (de) 1991-06-12
WO1990002340A1 (en) 1990-03-08
EP0431034B1 (de) 1994-05-11
JPH04501763A (ja) 1992-03-26
GB8820042D0 (en) 1988-09-28
DE68915284D1 (de) 1994-06-16
US5124647A (en) 1992-06-23

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: EVERETT CHARLES TECHNOLOGIES (N.D.GES.D.STAATES DE

8339 Ceased/non-payment of the annual fee