DE60334706D1 - Ür - Google Patents

Ür

Info

Publication number
DE60334706D1
DE60334706D1 DE60334706T DE60334706T DE60334706D1 DE 60334706 D1 DE60334706 D1 DE 60334706D1 DE 60334706 T DE60334706 T DE 60334706T DE 60334706 T DE60334706 T DE 60334706T DE 60334706 D1 DE60334706 D1 DE 60334706D1
Authority
DE
Germany
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60334706T
Other languages
English (en)
Inventor
K Oda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Mining Holdings Inc
Eneos Corp
Original Assignee
Nippon Mining and Metals Co Ltd
Nippon Mining Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Mining and Metals Co Ltd, Nippon Mining Co Ltd filed Critical Nippon Mining and Metals Co Ltd
Application granted granted Critical
Publication of DE60334706D1 publication Critical patent/DE60334706D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34—Sputtering
    • C—CHEMISTRY; METALLURGY
    • C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22C—ALLOYS
    • C22C27/00—Alloys based on rhenium or a refractory metal not mentioned in groups C22C14/00 or C22C16/00
    • C22C27/02—Alloys based on vanadium, niobium, or tantalum
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B21—MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL; PUNCHING METAL
    • B21J—FORGING; HAMMERING; PRESSING METAL; RIVETING; FORGE FURNACES
    • B21J1/00—Preparing metal stock or similar ancillary operations prior, during or post forging, e.g. heating or cooling
    • B21J1/02—Preliminary treatment of metal stock without particular shaping, e.g. salvaging segregated zones, forging or pressing in the rough
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B21—MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL; PUNCHING METAL
    • B21J—FORGING; HAMMERING; PRESSING METAL; RIVETING; FORGE FURNACES
    • B21J5/00—Methods for forging, hammering, or pressing; Special equipment or accessories therefor
    • C—CHEMISTRY; METALLURGY
    • C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22F—CHANGING THE PHYSICAL STRUCTURE OF NON-FERROUS METALS AND NON-FERROUS ALLOYS
    • C22F1/00—Changing the physical structure of non-ferrous metals or alloys by heat treatment or by hot or cold working
    • C22F1/16—Changing the physical structure of non-ferrous metals or alloys by heat treatment or by hot or cold working of other metals or alloys based thereon
    • C22F1/18—High-melting or refractory metals or alloys based thereon
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
    • C23C14/14—Metallic material, boron or silicon
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34—Sputtering
    • C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
    • C23C14/3414—Metallurgical or chemical aspects of target preparation, e.g. casting, powder metallurgy
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104—Forming layers
    • H01L21/02365—Forming inorganic semiconducting materials on a substrate
    • H01L21/02612—Formation types
    • H01L21/02617—Deposition types
    • H01L21/02631—Physical deposition at reduced pressure, e.g. MBE, sputtering, evaporation
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/49—Method of mechanical manufacture
    • Y10T29/4998—Combined manufacture including applying or shaping of fluent material
    • Y10T29/49988—Metal casting

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Physics & Mathematics (AREA)
  • Thermal Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physical Vapour Deposition (AREA)
  • Forging (AREA)
DE60334706T 2002-09-20 2003-07-29 Ür Expired - Lifetime DE60334706D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2002274308A JP4883546B2 (ja) 2002-09-20 2002-09-20 タンタルスパッタリングターゲットの製造方法
PCT/JP2003/009575 WO2004027109A1 (ja) 2002-09-20 2003-07-29 タンタルスパッタリングターゲット及びその製造方法

Publications (1)

Publication Number Publication Date
DE60334706D1 true DE60334706D1 (de) 2010-12-09

Family

ID=32024996

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60334706T Expired - Lifetime DE60334706D1 (de) 2002-09-20 2003-07-29 Ür

Country Status (8)

Country Link
US (3) US7156963B2 (de)
EP (1) EP1541708B1 (de)
JP (1) JP4883546B2 (de)
KR (1) KR100643476B1 (de)
CN (1) CN100334252C (de)
DE (1) DE60334706D1 (de)
TW (1) TWI225895B (de)
WO (1) WO2004027109A1 (de)

Families Citing this family (43)

* Cited by examiner, † Cited by third party
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US7081148B2 (en) * 2001-09-18 2006-07-25 Praxair S.T. Technology, Inc. Textured-grain-powder metallurgy tantalum sputter target
JP4883546B2 (ja) * 2002-09-20 2012-02-22 Ｊｘ日鉱日石金属株式会社 タンタルスパッタリングターゲットの製造方法
JP4263900B2 (ja) * 2002-11-13 2009-05-13 日鉱金属株式会社 Ｔａスパッタリングターゲット及びその製造方法
JP4256388B2 (ja) * 2003-04-01 2009-04-22 日鉱金属株式会社 タンタルスパッタリングターゲット
US7892367B2 (en) * 2003-11-06 2011-02-22 Jx Nippon Mining & Metals Corporation Tantalum sputtering target
US8061177B2 (en) * 2004-03-26 2011-11-22 H.C. Starck Inc. Refractory metal pots
US8252126B2 (en) * 2004-05-06 2012-08-28 Global Advanced Metals, Usa, Inc. Sputter targets and methods of forming same by rotary axial forging
US7561937B2 (en) * 2005-01-19 2009-07-14 Tosoh Smd, Inc. Automated sputtering target production
US7998287B2 (en) * 2005-02-10 2011-08-16 Cabot Corporation Tantalum sputtering target and method of fabrication
JP5126742B2 (ja) * 2005-04-28 2013-01-23 Ｊｘ日鉱日石金属株式会社 スパッタリングターゲット
RU2434073C9 (ru) * 2005-05-05 2012-12-27 Х.К. Штарк Гмбх Способ покрытия поверхности субстрата и продукт с нанесенным покрытием
JP4904341B2 (ja) * 2005-05-05 2012-03-28 ハー．ツェー．スタルク ゲゼルシャフト ミット ベシュレンクテル ハフツング スパッタターゲット及びｘ線アノードを製造又は再処理するための被覆方法
WO2007040014A1 (ja) 2005-10-04 2007-04-12 Nippon Mining & Metals Co., Ltd. スパッタリングターゲット
EE05493B1 (et) * 2006-03-07 2011-12-15 Cabot Corporation Meetod l?pliku paksusega metallesemete valmistamiseks, saadud metallplaat ja selle valmistamiseks kasutatav BCC- metall
JP4974362B2 (ja) 2006-04-13 2012-07-11 株式会社アルバック Ｔａスパッタリングターゲットおよびその製造方法
US20080078268A1 (en) * 2006-10-03 2008-04-03 H.C. Starck Inc. Process for preparing metal powders having low oxygen content, powders so-produced and uses thereof
AU2007317650B2 (en) * 2006-11-07 2012-06-14 H.C. Starck Surface Technology and Ceramic Powders GmbH Method for coating a substrate and coated product
US20080105542A1 (en) * 2006-11-08 2008-05-08 Purdy Clifford C System and method of manufacturing sputtering targets
US20080145688A1 (en) 2006-12-13 2008-06-19 H.C. Starck Inc. Method of joining tantalum clade steel structures
US8197894B2 (en) 2007-05-04 2012-06-12 H.C. Starck Gmbh Methods of forming sputtering targets
US8246903B2 (en) 2008-09-09 2012-08-21 H.C. Starck Inc. Dynamic dehydriding of refractory metal powders
US8043655B2 (en) * 2008-10-06 2011-10-25 H.C. Starck, Inc. Low-energy method of manufacturing bulk metallic structures with submicron grain sizes
EP2412843B1 (de) * 2009-03-27 2013-11-06 JX Nippon Mining & Metals Corporation Lanthanum-sputtertarget
EP2415899B1 (de) 2009-03-31 2013-11-20 JX Nippon Mining & Metals Corporation Lanthanum-sputtertarget
EP2418299A4 (de) 2009-05-22 2013-05-01 Jx Nippon Mining & Metals Corp Tantalum-sputtertarget
SG174153A1 (en) 2009-08-11 2011-10-28 Jx Nippon Mining & Metals Corp Tantalum sputtering target
KR101944580B1 (ko) * 2010-08-09 2019-01-31 제이엑스금속주식회사 탄탈 스퍼터링 타깃
CN101920435B (zh) * 2010-08-20 2012-01-11 宁夏东方钽业股份有限公司 溅射钽环件的制备工艺
US9412568B2 (en) 2011-09-29 2016-08-09 H.C. Starck, Inc. Large-area sputtering targets
US20140242401A1 (en) 2011-11-30 2014-08-28 Jx Nippon Mining & Metals Corporation Tantalum Sputtering Target and Method for Manufacturing Same
KR101882606B1 (ko) 2012-03-21 2018-07-26 제이엑스금속주식회사 탄탈 스퍼터링 타깃 및 그 제조 방법 그리고 동 타깃을 사용하여 형성한 반도체 배선용 배리어막
US10490393B2 (en) 2012-12-19 2019-11-26 Jx Nippon Mining & Metals Corporation Tantalum sputtering target and method for producing same
KR101927574B1 (ko) * 2012-12-19 2018-12-10 제이엑스금속주식회사 탄탈 스퍼터링 타깃 및 그 제조 방법
WO2014136679A1 (ja) 2013-03-04 2014-09-12 Jx日鉱日石金属株式会社 タンタルスパッタリングターゲット及びその製造方法
KR20170141280A (ko) 2013-10-01 2017-12-22 제이엑스금속주식회사 탄탈 스퍼터링 타깃
KR20160027122A (ko) 2014-03-27 2016-03-09 제이엑스 킨조쿠 가부시키가이샤 탄탈 스퍼터링 타깃 및 그 제조 방법
CN104741872B (zh) * 2015-01-16 2017-06-16 宁夏东方钽业股份有限公司 一种钽靶材的制备方法
WO2016164269A1 (en) 2015-04-10 2016-10-13 Tosoh Smd, Inc. Method of making a tantalum sputter target and sputter targets made thereby
JP6293928B2 (ja) * 2015-05-22 2018-03-14 Ｊｘ金属株式会社 タンタルスパッタリングターゲット及びその製造方法
SG11201704463VA (en) 2015-05-22 2017-07-28 Jx Nippon Mining & Metals Corp Tantalum sputtering target, and production method therefor
TWI627299B (zh) * 2017-01-20 2018-06-21 光洋應用材料科技股份有限公司 鉭濺鍍靶材及其製法
WO2018179742A1 (ja) * 2017-03-30 2018-10-04 Ｊｘ金属株式会社 タンタルスパッタリングターゲット
CN110709532B (zh) 2017-06-22 2021-07-16 株式会社Uacj 溅射靶材、溅射靶、溅射靶用铝板及其制造方法

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JPH01215426A (ja) * 1988-02-24 1989-08-29 O C C:Kk 強靭な構造用金属材料の製造法
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JPH09104972A (ja) * 1995-10-05 1997-04-22 Hitachi Metals Ltd スパッタリング用チタンターゲットおよびその製造方法
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JPH1180942A (ja) * 1997-09-10 1999-03-26 Japan Energy Corp Ｔａスパッタターゲットとその製造方法及び組立体
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US6193821B1 (en) * 1998-08-19 2001-02-27 Tosoh Smd, Inc. Fine grain tantalum sputtering target and fabrication process
US6071389A (en) * 1998-08-21 2000-06-06 Tosoh Smd, Inc. Diffusion bonded sputter target assembly and method of making
US6348113B1 (en) * 1998-11-25 2002-02-19 Cabot Corporation High purity tantalum, products containing the same, and methods of making the same
JP2000323434A (ja) * 1999-05-11 2000-11-24 Toshiba Corp スパッタターゲット、配線膜および電子部品
US6331233B1 (en) * 2000-02-02 2001-12-18 Honeywell International Inc. Tantalum sputtering target with fine grains and uniform texture and method of manufacture
JP3905301B2 (ja) 2000-10-31 2007-04-18 日鉱金属株式会社 タンタル又はタングステンターゲット−銅合金製バッキングプレート組立体及びその製造方法
US6770154B2 (en) * 2001-09-18 2004-08-03 Praxair S.T. Technology, Inc. Textured-grain-powder metallurgy tantalum sputter target
JP4883546B2 (ja) 2002-09-20 2012-02-22 Ｊｘ日鉱日石金属株式会社 タンタルスパッタリングターゲットの製造方法
JP4263900B2 (ja) 2002-11-13 2009-05-13 日鉱金属株式会社 Ｔａスパッタリングターゲット及びその製造方法
JP4256388B2 (ja) 2003-04-01 2009-04-22 日鉱金属株式会社 タンタルスパッタリングターゲット
US7892367B2 (en) * 2003-11-06 2011-02-22 Jx Nippon Mining & Metals Corporation Tantalum sputtering target

Also Published As

Publication number Publication date
US20050155856A1 (en) 2005-07-21
TW200404909A (en) 2004-04-01
CN1659305A (zh) 2005-08-24
US20070062807A1 (en) 2007-03-22
EP1541708A1 (de) 2005-06-15
US7740717B2 (en) 2010-06-22
TWI225895B (en) 2005-01-01
WO2004027109A1 (ja) 2004-04-01
JP2004107758A (ja) 2004-04-08
US7156963B2 (en) 2007-01-02
CN100334252C (zh) 2007-08-29
EP1541708B1 (de) 2010-10-27
US7716806B2 (en) 2010-05-18
EP1541708A4 (de) 2008-06-04
KR20050057382A (ko) 2005-06-16
JP4883546B2 (ja) 2012-02-22
US20070062806A1 (en) 2007-03-22
KR100643476B1 (ko) 2006-11-10

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