DE60218163D1 - Megaschallreinigungs- und trocknungsvorrichtung - Google Patents
Megaschallreinigungs- und trocknungsvorrichtungInfo
- Publication number
- DE60218163D1 DE60218163D1 DE60218163T DE60218163T DE60218163D1 DE 60218163 D1 DE60218163 D1 DE 60218163D1 DE 60218163 T DE60218163 T DE 60218163T DE 60218163 T DE60218163 T DE 60218163T DE 60218163 D1 DE60218163 D1 DE 60218163D1
- Authority
- DE
- Germany
- Prior art keywords
- splash guard
- chuck
- substrate
- mega
- drying device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000004140 cleaning Methods 0.000 title 1
- 238000001035 drying Methods 0.000 title 1
- 239000000758 substrate Substances 0.000 abstract 6
- 239000012530 fluid Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67051—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/67034—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for drying
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S134/00—Cleaning and liquid contact with solids
- Y10S134/902—Semiconductor wafer
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Drying Of Solid Materials (AREA)
- Cleaning By Liquid Or Steam (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Applications Claiming Priority (7)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US29773601P | 2001-06-12 | 2001-06-12 | |
US297736P | 2001-06-12 | ||
US30492001P | 2001-07-11 | 2001-07-11 | |
US304920P | 2001-07-11 | ||
US31672501P | 2001-08-30 | 2001-08-30 | |
US316725P | 2001-08-30 | ||
PCT/US2002/018761 WO2002101795A2 (en) | 2001-06-12 | 2002-06-12 | Megasonic cleaner and dryer system |
Publications (2)
Publication Number | Publication Date |
---|---|
DE60218163D1 true DE60218163D1 (de) | 2007-03-29 |
DE60218163T2 DE60218163T2 (de) | 2007-11-22 |
Family
ID=27404512
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60218163T Expired - Lifetime DE60218163T2 (de) | 2001-06-12 | 2002-06-12 | Megaschallreinigungs- und trocknungsvorrichtung |
Country Status (7)
Country | Link |
---|---|
US (6) | US20020185155A1 (de) |
EP (1) | EP1402566B1 (de) |
JP (1) | JP4114188B2 (de) |
KR (2) | KR20090104115A (de) |
AT (1) | ATE354175T1 (de) |
DE (1) | DE60218163T2 (de) |
WO (5) | WO2002101798A2 (de) |
Families Citing this family (81)
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US7234477B2 (en) | 2000-06-30 | 2007-06-26 | Lam Research Corporation | Method and apparatus for drying semiconductor wafer surfaces using a plurality of inlets and outlets held in close proximity to the wafer surfaces |
US7584761B1 (en) | 2000-06-30 | 2009-09-08 | Lam Research Corporation | Wafer edge surface treatment with liquid meniscus |
US7000622B2 (en) * | 2002-09-30 | 2006-02-21 | Lam Research Corporation | Methods and systems for processing a bevel edge of a substrate using a dynamic liquid meniscus |
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US20040031167A1 (en) * | 2002-06-13 | 2004-02-19 | Stein Nathan D. | Single wafer method and apparatus for drying semiconductor substrates using an inert gas air-knife |
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US7997288B2 (en) | 2002-09-30 | 2011-08-16 | Lam Research Corporation | Single phase proximity head having a controlled meniscus for treating a substrate |
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US7240679B2 (en) | 2002-09-30 | 2007-07-10 | Lam Research Corporation | System for substrate processing with meniscus, vacuum, IPA vapor, drying manifold |
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US7367345B1 (en) | 2002-09-30 | 2008-05-06 | Lam Research Corporation | Apparatus and method for providing a confined liquid for immersion lithography |
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US7170190B1 (en) | 2003-12-16 | 2007-01-30 | Lam Research Corporation | Apparatus for oscillating a head and methods for implementing the same |
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-
2002
- 2002-06-12 WO PCT/US2002/018764 patent/WO2002101798A2/en not_active Application Discontinuation
- 2002-06-12 US US10/171,431 patent/US20020185155A1/en not_active Abandoned
- 2002-06-12 WO PCT/US2002/018765 patent/WO2002101799A2/en not_active Application Discontinuation
- 2002-06-12 WO PCT/US2002/018763 patent/WO2002101797A2/en not_active Application Discontinuation
- 2002-06-12 JP JP2003516068A patent/JP4114188B2/ja not_active Expired - Fee Related
- 2002-06-12 WO PCT/US2002/018762 patent/WO2002101796A2/en not_active Application Discontinuation
- 2002-06-12 WO PCT/US2002/018761 patent/WO2002101795A2/en active Application Filing
- 2002-06-12 US US10/171,430 patent/US6928751B2/en not_active Expired - Lifetime
- 2002-06-12 US US10/171,494 patent/US20040020512A1/en not_active Abandoned
- 2002-06-12 KR KR1020097017528A patent/KR20090104115A/ko not_active Application Discontinuation
- 2002-06-12 DE DE60218163T patent/DE60218163T2/de not_active Expired - Lifetime
- 2002-06-12 EP EP02742054A patent/EP1402566B1/de not_active Expired - Lifetime
- 2002-06-12 KR KR10-2003-7016342A patent/KR20040028782A/ko not_active Application Discontinuation
- 2002-06-12 US US10/171,429 patent/US6923192B2/en not_active Expired - Lifetime
- 2002-06-12 US US10/171,426 patent/US6754980B2/en not_active Expired - Lifetime
- 2002-06-12 AT AT02742054T patent/ATE354175T1/de not_active IP Right Cessation
-
2004
- 2004-06-10 US US10/865,440 patent/US20040231188A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
US20020185153A1 (en) | 2002-12-12 |
ATE354175T1 (de) | 2007-03-15 |
KR20090104115A (ko) | 2009-10-05 |
WO2002101799A3 (en) | 2003-02-27 |
WO2002101796A2 (en) | 2002-12-19 |
JP4114188B2 (ja) | 2008-07-09 |
WO2002101798A3 (en) | 2003-02-27 |
US6923192B2 (en) | 2005-08-02 |
WO2002101799A2 (en) | 2002-12-19 |
DE60218163T2 (de) | 2007-11-22 |
EP1402566A2 (de) | 2004-03-31 |
US6928751B2 (en) | 2005-08-16 |
WO2002101795A2 (en) | 2002-12-19 |
US20040231188A1 (en) | 2004-11-25 |
WO2002101798A2 (en) | 2002-12-19 |
WO2002101795A3 (en) | 2003-03-06 |
KR20040028782A (ko) | 2004-04-03 |
US20020185154A1 (en) | 2002-12-12 |
US20020185152A1 (en) | 2002-12-12 |
JP2004537168A (ja) | 2004-12-09 |
WO2002101796A3 (en) | 2003-02-27 |
US20020185155A1 (en) | 2002-12-12 |
EP1402566B1 (de) | 2007-02-14 |
WO2002101797A3 (en) | 2003-02-27 |
US20040020512A1 (en) | 2004-02-05 |
US6754980B2 (en) | 2004-06-29 |
WO2002101797A2 (en) | 2002-12-19 |
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