DE60218163D1 - Megaschallreinigungs- und trocknungsvorrichtung - Google Patents

Megaschallreinigungs- und trocknungsvorrichtung

Info

Publication number
DE60218163D1
DE60218163D1 DE60218163T DE60218163T DE60218163D1 DE 60218163 D1 DE60218163 D1 DE 60218163D1 DE 60218163 T DE60218163 T DE 60218163T DE 60218163 T DE60218163 T DE 60218163T DE 60218163 D1 DE60218163 D1 DE 60218163D1
Authority
DE
Germany
Prior art keywords
splash guard
chuck
substrate
mega
drying device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60218163T
Other languages
English (en)
Other versions
DE60218163T2 (de
Inventor
M Lauerhaas
Jr J Nicolosi
Paul Mertens
William Fyen
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Interuniversitair Microelektronica Centrum vzw IMEC
Akrion Technologies Inc
Original Assignee
Interuniversitair Microelektronica Centrum vzw IMEC
Akrion Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Interuniversitair Microelektronica Centrum vzw IMEC, Akrion Technologies Inc filed Critical Interuniversitair Microelektronica Centrum vzw IMEC
Publication of DE60218163D1 publication Critical patent/DE60218163D1/de
Application granted granted Critical
Publication of DE60218163T2 publication Critical patent/DE60218163T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/304Mechanical treatment, e.g. grinding, polishing, cutting
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67017Apparatus for fluid treatment
    • H01L21/67028Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • H01L21/6704Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
    • H01L21/67051Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67017Apparatus for fluid treatment
    • H01L21/67028Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • H01L21/67034Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for drying
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S134/00Cleaning and liquid contact with solids
    • Y10S134/902Semiconductor wafer

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
  • Drying Of Solid Materials (AREA)
  • Cleaning By Liquid Or Steam (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
DE60218163T 2001-06-12 2002-06-12 Megaschallreinigungs- und trocknungsvorrichtung Expired - Lifetime DE60218163T2 (de)

Applications Claiming Priority (7)

Application Number Priority Date Filing Date Title
US29773601P 2001-06-12 2001-06-12
US297736P 2001-06-12
US30492001P 2001-07-11 2001-07-11
US304920P 2001-07-11
US31672501P 2001-08-30 2001-08-30
US316725P 2001-08-30
PCT/US2002/018761 WO2002101795A2 (en) 2001-06-12 2002-06-12 Megasonic cleaner and dryer system

Publications (2)

Publication Number Publication Date
DE60218163D1 true DE60218163D1 (de) 2007-03-29
DE60218163T2 DE60218163T2 (de) 2007-11-22

Family

ID=27404512

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60218163T Expired - Lifetime DE60218163T2 (de) 2001-06-12 2002-06-12 Megaschallreinigungs- und trocknungsvorrichtung

Country Status (7)

Country Link
US (6) US20020185155A1 (de)
EP (1) EP1402566B1 (de)
JP (1) JP4114188B2 (de)
KR (2) KR20090104115A (de)
AT (1) ATE354175T1 (de)
DE (1) DE60218163T2 (de)
WO (5) WO2002101798A2 (de)

Families Citing this family (81)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7429537B2 (en) * 1999-01-22 2008-09-30 Semitool, Inc. Methods and apparatus for rinsing and drying
US7234477B2 (en) 2000-06-30 2007-06-26 Lam Research Corporation Method and apparatus for drying semiconductor wafer surfaces using a plurality of inlets and outlets held in close proximity to the wafer surfaces
US7584761B1 (en) 2000-06-30 2009-09-08 Lam Research Corporation Wafer edge surface treatment with liquid meniscus
US7000622B2 (en) * 2002-09-30 2006-02-21 Lam Research Corporation Methods and systems for processing a bevel edge of a substrate using a dynamic liquid meniscus
WO2002101798A2 (en) * 2001-06-12 2002-12-19 Verteq, Inc. Method of applying liquid to a megasonic apparatus for improved cleaning control
US6679272B2 (en) * 2001-08-03 2004-01-20 Verteq, Inc. Megasonic probe energy attenuator
TW586974B (en) 2001-11-02 2004-05-11 Product Systems Inc Radial power megasonic transducer
US7287537B2 (en) * 2002-01-29 2007-10-30 Akrion Technologies, Inc. Megasonic probe energy director
KR100493016B1 (ko) * 2002-03-23 2005-06-07 삼성전자주식회사 반도체 소자 제조에 이용되는 메가소닉 세정장치
US7185661B2 (en) * 2002-05-06 2007-03-06 Akrion Technologies, Inc. Reciprocating megasonic probe
US20040031167A1 (en) * 2002-06-13 2004-02-19 Stein Nathan D. Single wafer method and apparatus for drying semiconductor substrates using an inert gas air-knife
US7045018B2 (en) 2002-09-30 2006-05-16 Lam Research Corporation Substrate brush scrubbing and proximity cleaning-drying sequence using compatible chemistries, and method, apparatus, and system for implementing the same
US7293571B2 (en) 2002-09-30 2007-11-13 Lam Research Corporation Substrate proximity processing housing and insert for generating a fluid meniscus
US7997288B2 (en) 2002-09-30 2011-08-16 Lam Research Corporation Single phase proximity head having a controlled meniscus for treating a substrate
US8236382B2 (en) 2002-09-30 2012-08-07 Lam Research Corporation Proximity substrate preparation sequence, and method, apparatus, and system for implementing the same
US6954993B1 (en) 2002-09-30 2005-10-18 Lam Research Corporation Concentric proximity processing head
US7240679B2 (en) 2002-09-30 2007-07-10 Lam Research Corporation System for substrate processing with meniscus, vacuum, IPA vapor, drying manifold
US7383843B2 (en) 2002-09-30 2008-06-10 Lam Research Corporation Method and apparatus for processing wafer surfaces using thin, high velocity fluid layer
US6988327B2 (en) 2002-09-30 2006-01-24 Lam Research Corporation Methods and systems for processing a substrate using a dynamic liquid meniscus
US7513262B2 (en) 2002-09-30 2009-04-07 Lam Research Corporation Substrate meniscus interface and methods for operation
US7614411B2 (en) 2002-09-30 2009-11-10 Lam Research Corporation Controls of ambient environment during wafer drying using proximity head
US7367345B1 (en) 2002-09-30 2008-05-06 Lam Research Corporation Apparatus and method for providing a confined liquid for immersion lithography
US7153400B2 (en) 2002-09-30 2006-12-26 Lam Research Corporation Apparatus and method for depositing and planarizing thin films of semiconductor wafers
US7389783B2 (en) 2002-09-30 2008-06-24 Lam Research Corporation Proximity meniscus manifold
US7069937B2 (en) 2002-09-30 2006-07-04 Lam Research Corporation Vertical proximity processor
US7093375B2 (en) 2002-09-30 2006-08-22 Lam Research Corporation Apparatus and method for utilizing a meniscus in substrate processing
US7632376B1 (en) 2002-09-30 2009-12-15 Lam Research Corporation Method and apparatus for atomic layer deposition (ALD) in a proximity system
JP2004207503A (ja) * 2002-12-25 2004-07-22 Canon Inc 処理装置
US7704367B2 (en) 2004-06-28 2010-04-27 Lam Research Corporation Method and apparatus for plating semiconductor wafers
TWI235684B (en) * 2003-04-11 2005-07-11 Au Optronics Corp Anti-splashing device and method
KR100526192B1 (ko) * 2003-05-28 2005-11-03 삼성전자주식회사 웨이퍼 세정장치 및 세정방법
EP1635960A2 (de) * 2003-06-06 2006-03-22 P.C.T. Systems, Inc. Verfahren und vorrichtung zur bearbeitung von substraten mit megaschallenergie
US7675000B2 (en) 2003-06-24 2010-03-09 Lam Research Corporation System method and apparatus for dry-in, dry-out, low defect laser dicing using proximity technology
US7170190B1 (en) 2003-12-16 2007-01-30 Lam Research Corporation Apparatus for oscillating a head and methods for implementing the same
US7350315B2 (en) 2003-12-22 2008-04-01 Lam Research Corporation Edge wheel dry manifold
US7337663B2 (en) * 2004-03-12 2008-03-04 Semitool, Inc. Sonic energy process chamber
US8118044B2 (en) * 2004-03-12 2012-02-21 Applied Materials, Inc. Single workpiece processing chamber with tilting load/unload upper rim
US8062471B2 (en) 2004-03-31 2011-11-22 Lam Research Corporation Proximity head heating method and apparatus
JP2008506268A (ja) * 2004-07-09 2008-02-28 アクリオン・テクノロジーズ・インコーポレーテッド 減圧下照射による処理方法及び装置
US7089687B2 (en) 2004-09-30 2006-08-15 Lam Research Corporation Wafer edge wheel with drying function
US7732123B2 (en) * 2004-11-23 2010-06-08 Taiwan Semiconductor Manufacturing Company, Ltd. Immersion photolithography with megasonic rinse
US20060157095A1 (en) * 2005-01-19 2006-07-20 Pham Xuyen N Systems and methods for spinning semiconductor wafers
US8070884B2 (en) * 2005-04-01 2011-12-06 Fsi International, Inc. Methods for rinsing microelectronic substrates utilizing cool rinse fluid within a gas enviroment including a drying enhancement substance
JP2007073670A (ja) * 2005-09-06 2007-03-22 Disco Abrasive Syst Ltd 水溶性樹脂被覆方法
US8480810B2 (en) 2005-12-30 2013-07-09 Lam Research Corporation Method and apparatus for particle removal
US7644512B1 (en) 2006-01-18 2010-01-12 Akrion, Inc. Systems and methods for drying a rotating substrate
US9987666B2 (en) 2006-01-20 2018-06-05 Naura Akrion Inc. Composite transducer apparatus and system for processing a substrate and method of constructing the same
WO2007085022A2 (en) * 2006-01-20 2007-07-26 Akrion Technologies, Inc. System, apparatus and methods for processing substrates using acoustic energy
US9049520B2 (en) 2006-01-20 2015-06-02 Akrion Systems Llc Composite transducer apparatus and system for processing a substrate and method of constructing the same
WO2007085015A2 (en) 2006-01-20 2007-07-26 Akrion Technologies, Inc. Acoustic energy system, method and apparatus for processing flat articles
US7928366B2 (en) 2006-10-06 2011-04-19 Lam Research Corporation Methods of and apparatus for accessing a process chamber using a dual zone gas injector with improved optical access
US20080017219A1 (en) * 2006-07-12 2008-01-24 Cole Franklin Transducer assembly incorporating a transmitter having through holes, and method and system for cleaning a substrate utilizing the same
KR100797079B1 (ko) * 2006-07-12 2008-01-22 세메스 주식회사 기판 처리 장치 및 방법
US20080029123A1 (en) * 2006-08-02 2008-02-07 Brian Aegerter Sonic and chemical wafer processor
US8261758B2 (en) * 2006-08-17 2012-09-11 Novellus Systems, Inc. Apparatus and method for cleaning and removing liquids from front and back sides of a rotating workpiece
US8813764B2 (en) 2009-05-29 2014-08-26 Lam Research Corporation Method and apparatus for physical confinement of a liquid meniscus over a semiconductor wafer
US8327861B2 (en) * 2006-12-19 2012-12-11 Lam Research Corporation Megasonic precision cleaning of semiconductor process equipment components and parts
US8146902B2 (en) 2006-12-21 2012-04-03 Lam Research Corporation Hybrid composite wafer carrier for wet clean equipment
US20080155852A1 (en) * 2006-12-29 2008-07-03 Olgado Donald J K Multiple substrate vapor drying systems and methods
US8464736B1 (en) 2007-03-30 2013-06-18 Lam Research Corporation Reclaim chemistry
US7975708B2 (en) 2007-03-30 2011-07-12 Lam Research Corporation Proximity head with angled vacuum conduit system, apparatus and method
US8388762B2 (en) 2007-05-02 2013-03-05 Lam Research Corporation Substrate cleaning technique employing multi-phase solution
US8141566B2 (en) 2007-06-19 2012-03-27 Lam Research Corporation System, method and apparatus for maintaining separation of liquids in a controlled meniscus
US8051863B2 (en) * 2007-10-18 2011-11-08 Lam Research Corporation Methods of and apparatus for correlating gap value to meniscus stability in processing of a wafer surface by a recipe-controlled meniscus
KR101546660B1 (ko) 2008-12-12 2015-08-25 에이씨엠 리서치 (상하이) 인코포레이티드 반도체 웨이퍼 세척 방법 및 장치
TWI483299B (zh) * 2009-01-09 2015-05-01 Acm Res Shanghai Inc 半導體矽片的清洗方法和裝置
US9068775B2 (en) 2009-02-09 2015-06-30 Heat Technologies, Inc. Ultrasonic drying system and method
JP5140641B2 (ja) * 2009-06-29 2013-02-06 株式会社荏原製作所 基板処理方法及び基板処理装置
US20120189421A1 (en) * 2011-01-21 2012-07-26 Samsung Austin Semiconductor, L.P. Parallel multi wafer axial spin clean processing using spin cassette inside movable process chamber
US8916003B2 (en) * 2011-09-23 2014-12-23 Nanya Technology Corporation Wafer scrubber
US9266151B2 (en) * 2012-11-28 2016-02-23 Beijing Sevenstar Electronics Co., Ltd. Cleaning device resistant to liquid backsplash and cleaning system therewith
US9174249B2 (en) * 2012-12-12 2015-11-03 Lam Research Corporation Ultrasonic cleaning method and apparatus therefore
WO2014210257A1 (en) * 2013-06-26 2014-12-31 Beijing Sevenstar Electronics Co. Ltd. Vertical no-spin process chamber
US10488108B2 (en) 2014-07-01 2019-11-26 Heat Technologies, Inc. Indirect acoustic drying system and method
WO2016014960A1 (en) 2014-07-24 2016-01-28 Heat Technologies, Inc. Acoustic-assisted heat and mass transfer device
CN106238373A (zh) * 2015-11-03 2016-12-21 无锡市三立轴承有限公司 新型轴承快速清洗装置
WO2017125242A1 (en) * 2016-01-20 2017-07-27 DUSSAULT, Donald Herbert Method and apparatus for cleaning a disc record
KR102522272B1 (ko) * 2018-04-27 2023-04-18 에이씨엠 리서치 (상하이), 인코포레이티드 반도체 웨이퍼 세정 방법 및 장치
US11273607B2 (en) 2019-11-15 2022-03-15 Arcam Ab Depowdering apparatuses for additive manufacturing and methods for using the same
CN111219953B (zh) * 2020-01-16 2022-04-01 长江存储科技有限责任公司 晶片的干燥装置、干燥方法、清洗系统及清洗干燥装置
CN115475798B (zh) * 2022-09-27 2024-05-14 重庆镜辰美科技有限公司 一种用于光学镜片的超声波清洗装置

Family Cites Families (46)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4178188A (en) 1977-09-14 1979-12-11 Branson Ultrasonics Corporation Method for cleaning workpieces by ultrasonic energy
DE3027533C2 (de) 1980-07-21 1986-05-15 Telsonic Aktiengesellschaft für elektronische Entwicklung und Fabrikation, Bronschhofen Verfahren zur Erzeugung und Abstrahlung von Ultraschallenergie in Flüssigkeiten sowie Ultraschallresonator zur Ausführung des Verfahrens
US4326553A (en) * 1980-08-28 1982-04-27 Rca Corporation Megasonic jet cleaner apparatus
US4401131A (en) 1981-05-15 1983-08-30 Gca Corporation Apparatus for cleaning semiconductor wafers
DE3435849A1 (de) 1984-09-29 1986-04-30 Paul Peter Prof. Dr.med. 4400 Münster Lunkenheimer Luftimpulserzeuger bei beatmungsgeraeten
US4966505A (en) * 1985-09-17 1990-10-30 Chiron-Werke Gmbh & Co. Kg Machine tool
JPH0620350B2 (ja) 1986-01-27 1994-03-16 沖電気工業株式会社 信号処理装置
DE3719952A1 (de) * 1987-06-15 1988-12-29 Convac Gmbh Einrichtung zur behandlung von wafern bei der herstellung von halbleiterelementen
US4902350A (en) * 1987-09-09 1990-02-20 Robert F. Orr Method for rinsing, cleaning and drying silicon wafers
ATE156344T1 (de) * 1991-04-25 1997-08-15 Univ Brown Res Found Implantierbare, biokompatible immunisolator- trägersubstanz zum abgeben ausgesuchter, therapeutischer produkte
US5427622A (en) * 1993-02-12 1995-06-27 International Business Machines Corporation Method for uniform cleaning of wafers using megasonic energy
US5427822A (en) * 1993-05-17 1995-06-27 General Motors Corporation Method and apparatus for coating vehicle panels
US5364474A (en) * 1993-07-23 1994-11-15 Williford Jr John F Method for removing particulate matter
US5656097A (en) * 1993-10-20 1997-08-12 Verteq, Inc. Semiconductor wafer cleaning system
US5518542A (en) * 1993-11-05 1996-05-21 Tokyo Electron Limited Double-sided substrate cleaning apparatus
US5658097A (en) * 1995-12-14 1997-08-19 Fe Lime Industry Corporation Soil or ground quality stabilizer and treatment method
US5849104A (en) 1996-09-19 1998-12-15 Yieldup International Method and apparatus for cleaning wafers using multiple tanks
JP3742451B2 (ja) * 1996-01-17 2006-02-01 昌之 都田 洗浄方法
AT403380B (de) * 1996-03-05 1998-01-26 Voest Alpine Ind Anlagen Verfahren zum reduzieren von metallschwamm
US5769566A (en) * 1996-03-11 1998-06-23 Shea; Gerald Catch basin splash guard
JP3556043B2 (ja) * 1996-03-19 2004-08-18 株式会社荏原製作所 基板乾燥装置
US5849084A (en) * 1996-06-21 1998-12-15 Micron Technology, Inc. Spin coating dispense arm assembly
WO1998001896A1 (fr) 1996-07-03 1998-01-15 Ultraclean Technology Research Institute Appareil de lavage et procede de lavage
US5778554A (en) * 1996-07-15 1998-07-14 Oliver Design, Inc. Wafer spin dryer and method of drying a wafer
US6039059A (en) * 1996-09-30 2000-03-21 Verteq, Inc. Wafer cleaning system
JP3286539B2 (ja) * 1996-10-30 2002-05-27 信越半導体株式会社 洗浄装置および洗浄方法
US5800626A (en) * 1997-02-18 1998-09-01 International Business Machines Corporation Control of gas content in process liquids for improved megasonic cleaning of semiconductor wafers and microelectronics substrates
US6701941B1 (en) * 1997-05-09 2004-03-09 Semitool, Inc. Method for treating the surface of a workpiece
TW402737B (en) * 1997-05-27 2000-08-21 Tokyo Electron Ltd Cleaning/drying device and method
JPH1154471A (ja) * 1997-08-05 1999-02-26 Tokyo Electron Ltd 処理装置及び処理方法
US6334902B1 (en) * 1997-09-24 2002-01-01 Interuniversitair Microelektronica Centrum (Imec) Method and apparatus for removing a liquid from a surface
JP4616948B2 (ja) 1997-09-24 2011-01-19 アイメック 回転基材の表面から液体を除去する方法および装置
ATE287126T1 (de) 1997-09-24 2005-01-15 Imec Inter Uni Micro Electr Verfahren zum entfernen einer flüssigkeit von einer oberfläche einer substrat
EP0905746A1 (de) 1997-09-24 1999-03-31 Interuniversitair Micro-Elektronica Centrum Vzw Verfahren zum Entfernen einer Flüssigkeit von einer Oberfläche einer umlaufenden Substrat
US5888124A (en) * 1997-09-26 1999-03-30 Vanguard International Semiconductor Corporation Apparatus for polishing and cleaning a wafer
US6460552B1 (en) * 1998-10-05 2002-10-08 Lorimer D'arcy H. Method and apparatus for cleaning flat workpieces
US6021789A (en) * 1998-11-10 2000-02-08 International Business Machines Corporation Wafer cleaning system with progressive megasonic wave
JP4011218B2 (ja) * 1999-01-04 2007-11-21 株式会社東芝 基板処理装置及び基板処理方法
US6468362B1 (en) * 1999-08-25 2002-10-22 Applied Materials, Inc. Method and apparatus for cleaning/drying hydrophobic wafers
ATE409954T1 (de) 2000-06-19 2008-10-15 Imec Inter Uni Micro Electr Verfahren und vorrichtung zur lokalen flüssigkeitsbehandlung von einer substratoberfläche
US7451774B2 (en) * 2000-06-26 2008-11-18 Applied Materials, Inc. Method and apparatus for wafer cleaning
KR100416592B1 (ko) * 2001-02-10 2004-02-05 삼성전자주식회사 매엽식 웨이퍼 세정 장치 및 이를 이용한 웨이퍼 세정 방법
JP4532776B2 (ja) * 2001-05-07 2010-08-25 パナソニック株式会社 基板洗浄方法及び電子デバイスの製造方法
WO2002101798A2 (en) * 2001-06-12 2002-12-19 Verteq, Inc. Method of applying liquid to a megasonic apparatus for improved cleaning control
JP2004140196A (ja) * 2002-10-17 2004-05-13 Nec Electronics Corp 半導体装置の製造方法および基板洗浄装置
US6823876B1 (en) * 2003-09-02 2004-11-30 Macronix International Co., Ltd. Methodology of rotational etching tool maintenance

Also Published As

Publication number Publication date
US20020185153A1 (en) 2002-12-12
ATE354175T1 (de) 2007-03-15
KR20090104115A (ko) 2009-10-05
WO2002101799A3 (en) 2003-02-27
WO2002101796A2 (en) 2002-12-19
JP4114188B2 (ja) 2008-07-09
WO2002101798A3 (en) 2003-02-27
US6923192B2 (en) 2005-08-02
WO2002101799A2 (en) 2002-12-19
DE60218163T2 (de) 2007-11-22
EP1402566A2 (de) 2004-03-31
US6928751B2 (en) 2005-08-16
WO2002101795A2 (en) 2002-12-19
US20040231188A1 (en) 2004-11-25
WO2002101798A2 (en) 2002-12-19
WO2002101795A3 (en) 2003-03-06
KR20040028782A (ko) 2004-04-03
US20020185154A1 (en) 2002-12-12
US20020185152A1 (en) 2002-12-12
JP2004537168A (ja) 2004-12-09
WO2002101796A3 (en) 2003-02-27
US20020185155A1 (en) 2002-12-12
EP1402566B1 (de) 2007-02-14
WO2002101797A3 (en) 2003-02-27
US20040020512A1 (en) 2004-02-05
US6754980B2 (en) 2004-06-29
WO2002101797A2 (en) 2002-12-19

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