DE60200992D1 - "Timing"-Kalibrierung und -Verifikation von Testern für elektronische Schaltungen - Google Patents
"Timing"-Kalibrierung und -Verifikation von Testern für elektronische SchaltungenInfo
- Publication number
- DE60200992D1 DE60200992D1 DE60200992T DE60200992T DE60200992D1 DE 60200992 D1 DE60200992 D1 DE 60200992D1 DE 60200992 T DE60200992 T DE 60200992T DE 60200992 T DE60200992 T DE 60200992T DE 60200992 D1 DE60200992 D1 DE 60200992D1
- Authority
- DE
- Germany
- Prior art keywords
- testers
- verification
- electronic circuits
- timing calibration
- calibration
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
- G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
- G01R31/3191—Calibration
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
- G01R31/31937—Timing aspects, e.g. measuring propagation delay
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/923,548 US6570397B2 (en) | 2001-08-07 | 2001-08-07 | Timing calibration and timing calibration verification of electronic circuit testers |
US923548 | 2001-08-07 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE60200992D1 true DE60200992D1 (de) | 2004-09-23 |
DE60200992T2 DE60200992T2 (de) | 2005-08-11 |
Family
ID=25448865
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60200992T Expired - Lifetime DE60200992T2 (de) | 2001-08-07 | 2002-02-26 | "Timing"-Kalibrierung und -Verifikation von Testern für elektronische Schaltungen |
Country Status (5)
Country | Link |
---|---|
US (1) | US6570397B2 (de) |
EP (1) | EP1283423B1 (de) |
JP (1) | JP2003130938A (de) |
DE (1) | DE60200992T2 (de) |
TW (1) | TW591238B (de) |
Families Citing this family (47)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW557527B (en) * | 2001-03-26 | 2003-10-11 | Schlumberger Technologies Inc | Method and apparatus for calibration of integrated circuit tester timing |
US6829553B2 (en) * | 2001-03-30 | 2004-12-07 | Intel Corporation | Method of and apparatus for measuring the correctness of and correcting an automatic test arrangement |
CN100573176C (zh) * | 2001-06-07 | 2009-12-23 | 株式会社艾德温特斯特 | 半导体试验装置的校准方法 |
DE10155467B4 (de) * | 2001-11-09 | 2004-11-25 | Infineon Technologies Ag | Verfahren und Vorrichtung zum Auffinden eines Fehlers in einem Signalpfad auf einer Leiterplatte |
DE10159165B4 (de) * | 2001-12-03 | 2007-02-08 | Agilent Technologies, Inc. (n.d.Ges.d.Staates Delaware), Palo Alto | Vorrichtung zum Messen und/oder Kalibrieren eines Testkopfes |
US7180314B1 (en) * | 2001-12-14 | 2007-02-20 | Lecroy Corporation | Self-calibrating electrical test probe calibratable while connected to an electrical component under test |
KR100518546B1 (ko) * | 2002-12-13 | 2005-10-04 | 삼성전자주식회사 | 집적회로 패키지를 테스트하기 위한 테스트 보드 및 이를이용한 테스터 보정방법 |
US6891392B2 (en) | 2003-02-21 | 2005-05-10 | Lsi Logic Corporation | Substrate impedance measurement |
US6946866B2 (en) * | 2003-05-30 | 2005-09-20 | Lsi Logic Corporation | Measurement of package interconnect impedance using tester and supporting tester |
JP4354235B2 (ja) * | 2003-09-12 | 2009-10-28 | 株式会社アドバンテスト | 試験装置及び調整方法 |
US6979996B2 (en) * | 2003-09-15 | 2005-12-27 | International Business Machines Corporation | Apparatus and method for automatic elimination of round-trip delay errors induced by automatic test equipment calibration |
US7154259B2 (en) * | 2003-10-23 | 2006-12-26 | Formfactor, Inc. | Isolation buffers with controlled equal time delays |
TWI272394B (en) * | 2004-02-24 | 2007-02-01 | Mjc Probe Inc | Multi-function probe card |
US7106081B2 (en) * | 2004-07-08 | 2006-09-12 | Verigy Ipco | Parallel calibration system for a test device |
US7595629B2 (en) * | 2004-07-09 | 2009-09-29 | Formfactor, Inc. | Method and apparatus for calibrating and/or deskewing communications channels |
DE102004047308A1 (de) * | 2004-09-29 | 2006-03-30 | Rohde & Schwarz Gmbh & Co. Kg | Verfahren zur Verifikation der Kalibrierung eines Mehrtor-Netzwerkanalysators und Kalibriereinheit hierfür |
US7323897B2 (en) * | 2004-12-16 | 2008-01-29 | Verigy (Singapore) Pte. Ltd. | Mock wafer, system calibrated using mock wafer, and method for calibrating automated test equipment |
US7394275B1 (en) * | 2005-03-29 | 2008-07-01 | Unisys Corporation | Systems and methods for generating and evaluating high frequency, low voltage swing signals at in-circuit testing |
US7957461B2 (en) * | 2005-03-31 | 2011-06-07 | Teradyne, Inc. | Calibrating automatic test equipment |
JP2006319273A (ja) * | 2005-05-16 | 2006-11-24 | Agilent Technol Inc | インターフェースアッセンブリ、及びそれを用いた乾燥ガス封入装置 |
JP5021924B2 (ja) * | 2005-09-27 | 2012-09-12 | 株式会社アドバンテスト | パフォーマンスボード、試験装置及び試験方法 |
US7502974B2 (en) * | 2006-02-22 | 2009-03-10 | Verigy (Singapore) Pte. Ltd. | Method and apparatus for determining which timing sets to pre-load into the pin electronics of a circuit test system, and for pre-loading or storing said timing sets |
JP4929797B2 (ja) * | 2006-04-05 | 2012-05-09 | 株式会社デンソー | 半導体評価装置 |
US7532014B2 (en) * | 2006-08-08 | 2009-05-12 | Credence Systems Corporation | LRL vector calibration to the end of the probe needles for non-standard probe cards for ATE RF testers |
KR100736680B1 (ko) * | 2006-08-10 | 2007-07-06 | 주식회사 유니테스트 | 반도체 소자 테스트 장치의 캘리브레이션 방법 |
US7852094B2 (en) * | 2006-12-06 | 2010-12-14 | Formfactor, Inc. | Sharing resources in a system for testing semiconductor devices |
US8405290B2 (en) * | 2008-11-14 | 2013-03-26 | Ceravision Limited | Light source for microwave powered lamp |
BRPI0823248A2 (pt) * | 2008-11-14 | 2015-06-16 | Cera Vision Ltd | Fonte de luz de microondas com guia de onda de dielétrico sólido . |
TWI449923B (zh) * | 2009-12-02 | 2014-08-21 | Hon Hai Prec Ind Co Ltd | 低壓差分訊號時序測試系統及方法 |
CN102340427B (zh) * | 2010-07-28 | 2016-04-27 | 中山市云创知识产权服务有限公司 | 网络接口测试电路 |
US8692538B2 (en) * | 2011-06-09 | 2014-04-08 | Teradyne, Inc. | Test equipment calibration |
CN102338856A (zh) * | 2011-06-17 | 2012-02-01 | 杭州炬华科技股份有限公司 | 用于自动化针床的工装电路 |
US10296433B2 (en) * | 2012-06-01 | 2019-05-21 | Litepoint Corporation | Method for transferring and confirming transfer of predefined data to a device under test (DUT) during a test sequence |
TWI554772B (zh) * | 2013-12-13 | 2016-10-21 | Mpi Corp | Detection and debugging of the system |
DE102013227138B4 (de) * | 2013-12-23 | 2020-06-18 | Rohde & Schwarz GmbH & Co. Kommanditgesellschaft | Kalibriermodul mit integriertem Leistungsdetektor |
CN103869272A (zh) * | 2014-03-24 | 2014-06-18 | 哈尔滨理工大学 | 高压开关动特性测试仪校验装置 |
KR102196996B1 (ko) * | 2014-11-10 | 2020-12-31 | 에스케이하이닉스 주식회사 | 반도체 장치 테스트 시스템 및 그 테스트 방법 |
TWI591362B (zh) * | 2015-02-13 | 2017-07-11 | 何恆春 | 自動調校半導體元件測試機台之方法 |
US10048348B2 (en) | 2015-08-05 | 2018-08-14 | Teradyne, Inc. | MEM relay assembly for calibrating automated test equipment |
US9903932B2 (en) * | 2015-12-07 | 2018-02-27 | Rohde & Schwarz Gmbh & Co. Kg | Measuring system, calibration device and measuring method with uncertainty analysis |
WO2017144087A1 (en) * | 2016-02-23 | 2017-08-31 | Advantest Corporation | Method and device for calibrating an automated test equipment |
CN111123076A (zh) * | 2020-01-09 | 2020-05-08 | 苏州华兴源创科技股份有限公司 | 校准装置及自动测试设备 |
CN113447791B (zh) * | 2020-03-25 | 2023-04-07 | 北京确安科技股份有限公司 | 资源共享结构测试负载板的检测方法、装置及电子设备 |
CN114200370A (zh) * | 2020-09-18 | 2022-03-18 | 中国科学院微电子研究所 | 一种测试设备及集成电路测试方法 |
CN113064060B (zh) * | 2021-03-17 | 2024-03-01 | 胜达克半导体科技(上海)股份有限公司 | 一种芯片自动测试机内测试通道信号传输时间的校准方法 |
CN114325542B (zh) * | 2021-11-23 | 2023-08-22 | 中国船舶重工集团公司第七0九研究所 | 集成电路测试系统直流信号校准板、校准装置及校准方法 |
CN116859894B (zh) * | 2023-08-08 | 2024-04-02 | 南京航空航天大学 | 基于多代理技术的直升机内部电子调节器的自动测试方法 |
Family Cites Families (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4928278A (en) * | 1987-08-10 | 1990-05-22 | Nippon Telegraph And Telephone Corporation | IC test system |
US5262716A (en) * | 1992-04-21 | 1993-11-16 | Hewlett-Packard Company | Tester calibration procedure which includes fixturing |
JPH06148279A (ja) | 1992-10-30 | 1994-05-27 | Yokogawa Hewlett Packard Ltd | 電子デバイス試験・測定装置、およびそのタイミングならびに電圧レベル校正方法 |
TW273635B (de) | 1994-09-01 | 1996-04-01 | Aesop | |
US5550466A (en) * | 1994-09-30 | 1996-08-27 | Hewlett-Packard Company | Hinged conduit for routing cables in an electronic circuit tester |
US5539305A (en) | 1994-10-03 | 1996-07-23 | Botka; Julius K. | Calibration board for an electronic circuit tester |
US6166552A (en) | 1996-06-10 | 2000-12-26 | Motorola Inc. | Method and apparatus for testing a semiconductor wafer |
JPH10170603A (ja) * | 1996-12-13 | 1998-06-26 | Ando Electric Co Ltd | Icテスタのキャリブレーション方法 |
US5923180A (en) | 1997-02-04 | 1999-07-13 | Hewlett-Packard Company | Compliant wafer prober docking adapter |
US6181145B1 (en) | 1997-10-13 | 2001-01-30 | Matsushita Electric Industrial Co., Ltd. | Probe card |
US6192496B1 (en) | 1997-11-26 | 2001-02-20 | Agilent Technologies, Inc. | System for verifying signal timing accuracy on a digital testing device |
US6105157A (en) | 1998-01-30 | 2000-08-15 | Credence Systems Corporation | Salphasic timing calibration system for an integrated circuit tester |
JP3616247B2 (ja) * | 1998-04-03 | 2005-02-02 | 株式会社アドバンテスト | Ic試験装置におけるスキュー調整方法及びこれに用いる疑似デバイス |
DE19922907B4 (de) * | 1998-05-19 | 2006-08-10 | Advantest Corp. | Kalibrierverfahren zum Kalibrieren einer Ausgabezeit eines Prüfsignals, Kalibrierverfahren zum Kalibrieren einer Zeitverschiebung und Halbleiterprüfeinrichtung |
US6114869A (en) | 1998-05-21 | 2000-09-05 | Cerprobe Corporation | Method and apparatus for interfacing between automatic wafer probe machines, automatic testers, and probe cards |
US6073261A (en) | 1998-05-22 | 2000-06-06 | Hewlett Packard Company | Circuit for evaluating signal timing |
AU9654198A (en) | 1998-06-29 | 2000-01-17 | Iliya Valeryevich Klochkov | A skew calibration means and a method of skew calibration |
US6215320B1 (en) | 1998-10-23 | 2001-04-10 | Teradyne, Inc. | High density printed circuit board |
US6218910B1 (en) | 1999-02-25 | 2001-04-17 | Formfactor, Inc. | High bandwidth passive integrated circuit tester probe card assembly |
US6331783B1 (en) | 1999-10-19 | 2001-12-18 | Teradyne, Inc. | Circuit and method for improved test and calibration in automated test equipment |
US6492797B1 (en) * | 2000-02-28 | 2002-12-10 | Schlumberger Technologies, Inc. | Socket calibration method and apparatus |
-
2001
- 2001-08-07 US US09/923,548 patent/US6570397B2/en not_active Expired - Fee Related
-
2002
- 2002-02-22 TW TW091103206A patent/TW591238B/zh not_active IP Right Cessation
- 2002-02-26 DE DE60200992T patent/DE60200992T2/de not_active Expired - Lifetime
- 2002-02-26 EP EP02004184A patent/EP1283423B1/de not_active Expired - Fee Related
- 2002-08-07 JP JP2002229933A patent/JP2003130938A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
EP1283423B1 (de) | 2004-08-18 |
TW591238B (en) | 2004-06-11 |
US6570397B2 (en) | 2003-05-27 |
US20030030453A1 (en) | 2003-02-13 |
EP1283423A1 (de) | 2003-02-12 |
DE60200992T2 (de) | 2005-08-11 |
JP2003130938A (ja) | 2003-05-08 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8327 | Change in the person/name/address of the patent owner |
Owner name: VERIGY (SINGAPORE) PTE. LTD., SINGAPORE, SG |