DE602007011453D1 - Ladungszurückhaltungsschaltung zur zeitmessung - Google Patents

Ladungszurückhaltungsschaltung zur zeitmessung

Info

Publication number
DE602007011453D1
DE602007011453D1 DE602007011453T DE602007011453T DE602007011453D1 DE 602007011453 D1 DE602007011453 D1 DE 602007011453D1 DE 602007011453 T DE602007011453 T DE 602007011453T DE 602007011453 T DE602007011453 T DE 602007011453T DE 602007011453 D1 DE602007011453 D1 DE 602007011453D1
Authority
DE
Germany
Prior art keywords
time measurement
reset circuit
load reset
load
measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602007011453T
Other languages
English (en)
Inventor
Rosa Francesco La
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics SA
Original Assignee
STMicroelectronics SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by STMicroelectronics SA filed Critical STMicroelectronics SA
Publication of DE602007011453D1 publication Critical patent/DE602007011453D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C27/00—Electric analogue stores, e.g. for storing instantaneous values
    • G11C27/005—Electric analogue stores, e.g. for storing instantaneous values with non-volatile charge storage, e.g. on floating gate or MNOS
    • G—PHYSICS
    • G04—HOROLOGY
    • G04F—TIME-INTERVAL MEASURING
    • G04F10/00—Apparatus for measuring unknown time intervals by electric means
    • G04F10/10—Apparatus for measuring unknown time intervals by electric means by measuring electric or magnetic quantities changing in proportion to time
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C27/00—Electric analogue stores, e.g. for storing instantaneous values
    • G11C27/02—Sample-and-hold arrangements
    • G11C27/024—Sample-and-hold arrangements using a capacitive memory element

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Read Only Memory (AREA)
  • Non-Volatile Memory (AREA)
  • Measurement Of Unknown Time Intervals (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
DE602007011453T 2006-07-27 2007-07-20 Ladungszurückhaltungsschaltung zur zeitmessung Active DE602007011453D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR0653135 2006-07-27
PCT/FR2007/051696 WO2008012459A2 (fr) 2006-07-27 2007-07-20 Circuit de retention de charges pour mesure temporelle

Publications (1)

Publication Number Publication Date
DE602007011453D1 true DE602007011453D1 (de) 2011-02-03

Family

ID=37728307

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602007011453T Active DE602007011453D1 (de) 2006-07-27 2007-07-20 Ladungszurückhaltungsschaltung zur zeitmessung

Country Status (6)

Country Link
US (1) US8331203B2 (de)
EP (1) EP2047476B1 (de)
JP (1) JP5377306B2 (de)
CN (1) CN101601097B (de)
DE (1) DE602007011453D1 (de)
WO (1) WO2008012459A2 (de)

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FR2904464A1 (fr) * 2006-07-27 2008-02-01 St Microelectronics Sa Circuit eeprom de retention de charges pour mesure temporelle
FR2904463A1 (fr) * 2006-07-27 2008-02-01 St Microelectronics Sa Programmation d'un circuit de retention de charges pour mesure temporelle
JP5070297B2 (ja) * 2007-01-05 2012-11-07 プロトン ワールド インターナショナル エヌ．ヴィ． 電子回路に含まれる情報の保護
EP2108164B1 (de) * 2007-01-05 2015-08-26 Proton World International N.V. Einschränkung des zugriffs auf eine elektronische schaltung
EP2108165A1 (de) * 2007-01-05 2009-10-14 Proton World International N.V. Vorübergehende sperrung einer elektronischen schaltung
JP2009105279A (ja) * 2007-10-24 2009-05-14 Fujitsu Microelectronics Ltd 半導体装置の製造方法及び半導体装置
FR2926400A1 (fr) 2008-01-11 2009-07-17 St Microelectronics Rousset Cellule eeprom a perte de charges
US7977721B2 (en) * 2008-04-30 2011-07-12 Agere Systems Inc. High voltage tolerant metal-oxide-semiconductor device
US9900406B1 (en) * 2010-02-02 2018-02-20 Arris Enterprises Llc Method and apparatus for demand-based cable upstream channel assignment
DE102010049503B4 (de) * 2010-10-27 2012-05-31 Texas Instruments Deutschland Gmbh Elektronische Schaltung mit einem Transistor mit potentialfreiem Gate und Verfahren zum vorübergehenden Deaktivieren eines Transistors mit potentialfreiem Gate
KR101725505B1 (ko) * 2010-12-07 2017-04-11 삼성전자주식회사 해킹 검출 장치, 집적 회로 및 해킹 검출 방법
FR2981190B1 (fr) 2011-10-06 2014-03-21 St Microelectronics Rousset Circuit d'ecoulement de charges electriques pour une mesure temporelle
US8985849B2 (en) * 2011-11-11 2015-03-24 Microchip Technology Incorporated High resolution temperature measurement
FR2994020B1 (fr) 2012-07-30 2015-04-10 St Microelectronics Rousset Element d'ecoulement de charges electriques
US8963647B2 (en) * 2013-02-20 2015-02-24 Board Of Trustees Of Michigan State University Self-powered timer apparatus
FR3038411B1 (fr) 2015-06-30 2018-08-17 Stmicroelectronics (Rousset) Sas Detection d'authenticite d'un circuit electronique ou d'un produit contenant un tel circuit
ITUA20164741A1 (it) 2016-06-29 2017-12-29 St Microelectronics Srl Circuito di lettura di uno stadio circuitale a lunga costante di tempo e relativo metodo di lettura
ITUA20164739A1 (it) * 2016-06-29 2017-12-29 St Microelectronics Srl Circuito di test di uno stadio circuitale a lunga costante di tempo e relativo metodo di test
US10871404B2 (en) * 2018-05-16 2020-12-22 Birad—Research & Development Company Ltd. Miniaturized thermistor based thermal sensor
FR3085540B1 (fr) 2018-08-31 2020-09-25 St Microelectronics Rousset Dispositif integre de mesure temporelle a constante de temps ultra longue et procede de fabrication
CN110660446B (zh) * 2019-09-10 2021-03-30 电子科技大学 一种评估单片机中非易失性存储器数据残留的装置

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JPH0834257B2 (ja) * 1990-04-20 1996-03-29 株式会社東芝 半導体メモリセル
JPH05129554A (ja) * 1991-07-01 1993-05-25 Toshiba Corp ダイナミツク型半導体記憶装置
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US5508958A (en) * 1994-09-29 1996-04-16 Intel Corporation Method and apparatus for sensing the state of floating gate memory cells by applying a variable gate voltage
JPH09127271A (ja) * 1995-11-01 1997-05-16 Sony Corp 時刻表示装置
US5838040A (en) * 1997-03-31 1998-11-17 Gatefield Corporation Nonvolatile reprogrammable interconnect cell with FN tunneling in sense
IT1293644B1 (it) * 1997-07-25 1999-03-08 Sgs Thomson Microelectronics Circuito e metodo di lettura di celle di una matrice di memoria analogica, in particolare di tipo flash
DE69721252D1 (de) * 1997-09-29 2003-05-28 St Microelectronics Srl Verfahren und Vorrichtung zum analogen Programmieren einer Flash-EEPROM-Speicherzelle mit Selbstprüfung
KR100282432B1 (ko) * 1998-08-31 2001-02-15 김영환 티디디비(ｔｄｄｂ) 테스트 패턴 및 그를 이용한 모스캐패시터유전체막의 ｔｄｄｂ테스트방법
JP3377762B2 (ja) 1999-05-19 2003-02-17 株式会社半導体理工学研究センター 強誘電体不揮発性メモリ
US6091671A (en) * 1999-07-14 2000-07-18 Guide Technology, Inc. Time interval analyzer having interpolator with constant current capacitor control
US6181649B1 (en) * 1999-07-14 2001-01-30 Guide Technology, Inc. Time interval analyzer having current boost
US6185125B1 (en) * 1999-12-15 2001-02-06 Winbond Electronics Corp. Circuit for measuring the data retention time of a dynamic random-access memory cell
FR2814583A1 (fr) 2000-09-22 2002-03-29 St Microelectronics Sa Procede de lecture d'une cellule memoire et circuit de lecture associe
US6856581B1 (en) * 2000-10-31 2005-02-15 International Business Machines Corporation Batteryless, oscillatorless, binary time cell usable as an horological device with associated programming methods and devices
DE60129786T2 (de) * 2001-01-15 2008-04-30 Stmicroelectronics S.R.L., Agrate Brianza Verfahren und Schaltung zum dynamischen Auslesen einer Speicherzelle, insbesondere einer nichtflüchtigen Multibitspeicherzelle
EP1306851A1 (de) * 2001-10-24 2003-05-02 STMicroelectronics S.r.l. Niedriges Dauerfestigkeitsleseverfahren und Schaltung für nichtflüchtige ferroelektrische Speichereinheiten
FR2837960B1 (fr) * 2002-03-28 2004-07-09 Oberthur Card Syst Sa Entite electronique transactionnelle securisee par mesure du temps
ATE371933T1 (de) * 2002-07-08 2007-09-15 Nxp Bv Löschbare und programmierbare nichtflüchtige zelle
FR2843660B1 (fr) * 2002-08-16 2004-09-24 St Microelectronics Sa Circuit por programmable a deux seuils de commutation
FR2844090A1 (fr) * 2002-08-27 2004-03-05 St Microelectronics Sa Cellule memoire pour registre non volatile a lecture rapide
JP3822170B2 (ja) * 2003-01-31 2006-09-13 株式会社東芝 Ｉｃカードの利用期間設定方法、ｉｃカード、および、ｉｃカードケース
US6834009B1 (en) * 2003-08-15 2004-12-21 Silicon Storage Technology, Inc. Integrated circuit with a three transistor reprogrammable nonvolatile switch for selectively connecting a source for a signal to a circuit
US20060242326A1 (en) * 2005-04-20 2006-10-26 Noam Camiel System and method for independently enforcing time based policies in a digital device
FR2904464A1 (fr) * 2006-07-27 2008-02-01 St Microelectronics Sa Circuit eeprom de retention de charges pour mesure temporelle
FR2904463A1 (fr) * 2006-07-27 2008-02-01 St Microelectronics Sa Programmation d'un circuit de retention de charges pour mesure temporelle
EP2047475B1 (de) * 2006-07-27 2010-06-16 Stmicroelectronics SA Schaltung zur auslesung eines ladungszurückhaltungselements zur zeitmessung
US7460441B2 (en) * 2007-01-12 2008-12-02 Microchip Technology Incorporated Measuring a long time period
TWI336079B (en) * 2007-07-02 2011-01-11 Ind Tech Res Inst Magnetic random access memory and data reading circuit therefor

Also Published As

Publication number Publication date
JP5377306B2 (ja) 2013-12-25
US20100020648A1 (en) 2010-01-28
EP2047476A2 (de) 2009-04-15
WO2008012459A3 (fr) 2008-03-13
EP2047476B1 (de) 2010-12-22
US8331203B2 (en) 2012-12-11
WO2008012459A2 (fr) 2008-01-31
CN101601097A (zh) 2009-12-09
JP2009544961A (ja) 2009-12-17
CN101601097B (zh) 2012-10-17

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