ITUA20164741A1 - Circuito di lettura di uno stadio circuitale a lunga costante di tempo e relativo metodo di lettura - Google Patents
Circuito di lettura di uno stadio circuitale a lunga costante di tempo e relativo metodo di letturaInfo
- Publication number
- ITUA20164741A1 ITUA20164741A1 ITUA2016A004741A ITUA20164741A ITUA20164741A1 IT UA20164741 A1 ITUA20164741 A1 IT UA20164741A1 IT UA2016A004741 A ITUA2016A004741 A IT UA2016A004741A IT UA20164741 A ITUA20164741 A IT UA20164741A IT UA20164741 A1 ITUA20164741 A1 IT UA20164741A1
- Authority
- IT
- Italy
- Prior art keywords
- circuit
- reading
- constant time
- long constant
- stage
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/24—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using capacitors
-
- G—PHYSICS
- G04—HOROLOGY
- G04F—TIME-INTERVAL MEASURING
- G04F10/00—Apparatus for measuring unknown time intervals by electric means
- G04F10/10—Apparatus for measuring unknown time intervals by electric means by measuring electric or magnetic quantities changing in proportion to time
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Computer Hardware Design (AREA)
- Read Only Memory (AREA)
Priority Applications (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
ITUA2016A004741A ITUA20164741A1 (it) | 2016-06-29 | 2016-06-29 | Circuito di lettura di uno stadio circuitale a lunga costante di tempo e relativo metodo di lettura |
CN201611201116.7A CN107545925B (zh) | 2016-06-29 | 2016-12-22 | 用于长时间常数电路级的读取电路和相应的读取方法 |
CN201621418704.1U CN206638965U (zh) | 2016-06-29 | 2016-12-22 | 读取电路和电子设备 |
US15/389,751 US10127966B2 (en) | 2016-06-29 | 2016-12-23 | Reading circuit with a shifting stage and corresponding reading method |
EP16206892.8A EP3264202B1 (en) | 2016-06-29 | 2016-12-23 | Reading circuit for a long-time-constant circuit stage and corresponding reading method |
US16/151,388 US10217503B2 (en) | 2016-06-29 | 2018-10-04 | Reading circuit of a long time constant circuit stage and corresponding reading method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
ITUA2016A004741A ITUA20164741A1 (it) | 2016-06-29 | 2016-06-29 | Circuito di lettura di uno stadio circuitale a lunga costante di tempo e relativo metodo di lettura |
Publications (1)
Publication Number | Publication Date |
---|---|
ITUA20164741A1 true ITUA20164741A1 (it) | 2017-12-29 |
Family
ID=57184733
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ITUA2016A004741A ITUA20164741A1 (it) | 2016-06-29 | 2016-06-29 | Circuito di lettura di uno stadio circuitale a lunga costante di tempo e relativo metodo di lettura |
Country Status (4)
Country | Link |
---|---|
US (2) | US10127966B2 (it) |
EP (1) | EP3264202B1 (it) |
CN (2) | CN107545925B (it) |
IT (1) | ITUA20164741A1 (it) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
ITUA20164741A1 (it) * | 2016-06-29 | 2017-12-29 | St Microelectronics Srl | Circuito di lettura di uno stadio circuitale a lunga costante di tempo e relativo metodo di lettura |
US20240120822A1 (en) * | 2021-02-19 | 2024-04-11 | Neuro Device Group S .A. | Circuit for a medical device or for another device, medical device and method |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20100020648A1 (en) * | 2006-07-27 | 2010-01-28 | Stmicroelectronics S.A. | Charge retention circuit for a time measurement |
US20110007567A1 (en) * | 2007-01-05 | 2011-01-13 | Jean-Louis Modave | Temporary locking of an electronic circuit |
Family Cites Families (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4393481A (en) * | 1979-08-31 | 1983-07-12 | Xicor, Inc. | Nonvolatile static random access memory system |
US5798961A (en) * | 1994-08-23 | 1998-08-25 | Emc Corporation | Non-volatile memory module |
US5875126A (en) * | 1995-09-29 | 1999-02-23 | California Institute Of Technology | Autozeroing floating gate amplifier |
JP3519547B2 (ja) * | 1996-06-24 | 2004-04-19 | 株式会社東芝 | 中間電圧発生回路及びこれを有する不揮発性半導体メモリ |
JP2002208290A (ja) * | 2001-01-09 | 2002-07-26 | Mitsubishi Electric Corp | チャージポンプ回路およびこれを用いた不揮発性メモリの動作方法 |
EP1225595B1 (en) * | 2001-01-15 | 2007-08-08 | STMicroelectronics S.r.l. | Method and circuit for dynamic reading of a memory cell, in particular a multi-level nonvolatile memory cell |
US6639833B2 (en) * | 2001-02-14 | 2003-10-28 | Stmicroelectronics S.R.L. | Method and circuit for dynamic reading of a memory cell at low supply voltage and with low output dynamics |
JP3874247B2 (ja) * | 2001-12-25 | 2007-01-31 | 株式会社ルネサステクノロジ | 半導体集積回路装置 |
US6914812B2 (en) * | 2003-01-28 | 2005-07-05 | Intersil America Inc. | Tunnel device level shift circuit |
US6894928B2 (en) * | 2003-01-28 | 2005-05-17 | Intersil Americas Inc. | Output voltage compensating circuit and method for a floating gate reference voltage generator |
US6829164B2 (en) * | 2003-02-14 | 2004-12-07 | Xicor Corporation | Differential floating gate circuit and method for programming |
EP2047475B1 (fr) * | 2006-07-27 | 2010-06-16 | Stmicroelectronics SA | Circuit de lecture d'un element de retention de charges pour mesure temporelle |
WO2008060984A2 (en) * | 2006-11-14 | 2008-05-22 | Rambus Inc. | Low energy memory component |
FR2926400A1 (fr) * | 2008-01-11 | 2009-07-17 | St Microelectronics Rousset | Cellule eeprom a perte de charges |
JP2011222105A (ja) * | 2010-04-14 | 2011-11-04 | Elpida Memory Inc | 半導体装置 |
JP2012027983A (ja) * | 2010-07-23 | 2012-02-09 | Elpida Memory Inc | 半導体装置 |
CN102667947B (zh) * | 2010-09-28 | 2014-07-23 | 松下电器产业株式会社 | 电阻变化型非易失性存储元件的形成方法 |
FR2981190B1 (fr) | 2011-10-06 | 2014-03-21 | St Microelectronics Rousset | Circuit d'ecoulement de charges electriques pour une mesure temporelle |
ITUA20164741A1 (it) * | 2016-06-29 | 2017-12-29 | St Microelectronics Srl | Circuito di lettura di uno stadio circuitale a lunga costante di tempo e relativo metodo di lettura |
-
2016
- 2016-06-29 IT ITUA2016A004741A patent/ITUA20164741A1/it unknown
- 2016-12-22 CN CN201611201116.7A patent/CN107545925B/zh active Active
- 2016-12-22 CN CN201621418704.1U patent/CN206638965U/zh not_active Expired - Fee Related
- 2016-12-23 US US15/389,751 patent/US10127966B2/en active Active
- 2016-12-23 EP EP16206892.8A patent/EP3264202B1/en active Active
-
2018
- 2018-10-04 US US16/151,388 patent/US10217503B2/en active Active
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20100020648A1 (en) * | 2006-07-27 | 2010-01-28 | Stmicroelectronics S.A. | Charge retention circuit for a time measurement |
US20110007567A1 (en) * | 2007-01-05 | 2011-01-13 | Jean-Louis Modave | Temporary locking of an electronic circuit |
Also Published As
Publication number | Publication date |
---|---|
US20190035450A1 (en) | 2019-01-31 |
US10127966B2 (en) | 2018-11-13 |
CN107545925B (zh) | 2021-01-01 |
EP3264202B1 (en) | 2021-10-06 |
CN206638965U (zh) | 2017-11-14 |
US10217503B2 (en) | 2019-02-26 |
EP3264202A1 (en) | 2018-01-03 |
CN107545925A (zh) | 2018-01-05 |
US20180005684A1 (en) | 2018-01-04 |
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