DE602005015790D1 - Magnetischer RAM Speicher (MRAM) mit mehr als einem Bit pro Speicherzelle - Google Patents

Magnetischer RAM Speicher (MRAM) mit mehr als einem Bit pro Speicherzelle

Info

Publication number
DE602005015790D1
DE602005015790D1 DE602005015790T DE602005015790T DE602005015790D1 DE 602005015790 D1 DE602005015790 D1 DE 602005015790D1 DE 602005015790 T DE602005015790 T DE 602005015790T DE 602005015790 T DE602005015790 T DE 602005015790T DE 602005015790 D1 DE602005015790 D1 DE 602005015790D1
Authority
DE
Germany
Prior art keywords
mram
bit per
magnetic ram
memory cell
ram memory
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE602005015790T
Other languages
English (en)
Inventor
Christophe Frey
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics lnc USA
Original Assignee
STMicroelectronics lnc USA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by STMicroelectronics lnc USA filed Critical STMicroelectronics lnc USA
Publication of DE602005015790D1 publication Critical patent/DE602005015790D1/de
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
    • G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/56—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
    • G11C11/5607—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using magnetic storage elements
DE602005015790T 2004-06-30 2005-06-29 Magnetischer RAM Speicher (MRAM) mit mehr als einem Bit pro Speicherzelle Expired - Fee Related DE602005015790D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/881,746 US7301800B2 (en) 2004-06-30 2004-06-30 Multi-bit magnetic random access memory element

Publications (1)

Publication Number Publication Date
DE602005015790D1 true DE602005015790D1 (de) 2009-09-17

Family

ID=35079439

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602005015790T Expired - Fee Related DE602005015790D1 (de) 2004-06-30 2005-06-29 Magnetischer RAM Speicher (MRAM) mit mehr als einem Bit pro Speicherzelle

Country Status (4)

Country Link
US (1) US7301800B2 (de)
EP (1) EP1612804B1 (de)
JP (1) JP2006019006A (de)
DE (1) DE602005015790D1 (de)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7304887B2 (en) * 2004-09-03 2007-12-04 Samsung Electronics Co., Ltd. Method and apparatus for multi-plane MRAM
US20080094885A1 (en) * 2006-10-24 2008-04-24 Macronix International Co., Ltd. Bistable Resistance Random Access Memory Structures with Multiple Memory Layers and Multilevel Memory States
KR100961723B1 (ko) 2008-02-18 2010-06-10 이화여자대학교 산학협력단 스핀 토크 변환을 이용한 자기터널접합 소자를 사용한ｘｏｒ 논리 연산장치
US7804710B2 (en) * 2008-03-31 2010-09-28 International Business Machines Corporation Multi-layer magnetic random access memory using spin-torque magnetic tunnel junctions and method for write state of the multi-layer magnetic random access memory
US8289662B2 (en) * 2008-05-20 2012-10-16 International Business Machines Corporation Tunnel junction resistor for high resistance devices and systems using the same
US8279662B2 (en) 2010-11-11 2012-10-02 Seagate Technology Llc Multi-bit magnetic memory with independently programmable free layer domains
US8203870B2 (en) 2010-11-23 2012-06-19 Seagate Technology Llc Flux programmed multi-bit magnetic memory

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JP2683919B2 (ja) * 1988-07-29 1997-12-03 三菱電機株式会社 半導体記憶装置
JP2507164B2 (ja) * 1990-10-04 1996-06-12 三菱電機株式会社 半導体記憶装置
US5287304A (en) * 1990-12-31 1994-02-15 Texas Instruments Incorporated Memory cell circuit and array
US5748545A (en) * 1997-04-03 1998-05-05 Aplus Integrated Circuits, Inc. Memory device with on-chip manufacturing and memory cell defect detection capability
JPH11354728A (ja) * 1998-06-09 1999-12-24 Canon Inc 磁性薄膜メモリおよびその記録再生駆動方法
DE10020128A1 (de) * 2000-04-14 2001-10-18 Infineon Technologies Ag MRAM-Speicher
JP4020573B2 (ja) 2000-07-27 2007-12-12 富士通株式会社 磁性メモリデバイス、および磁性メモリデバイスにおけるデータ読み出し方法
US6331943B1 (en) * 2000-08-28 2001-12-18 Motorola, Inc. MTJ MRAM series-parallel architecture
KR100451096B1 (ko) * 2000-09-19 2004-10-02 엔이씨 일렉트로닉스 가부시키가이샤 자기메모리셀어레이를 갖는 비휘발성 반도체메모리장치
US6335890B1 (en) * 2000-11-01 2002-01-01 International Business Machines Corporation Segmented write line architecture for writing magnetic random access memories
JP2002216468A (ja) * 2000-11-08 2002-08-02 Canon Inc 半導体記憶装置
JP3920565B2 (ja) * 2000-12-26 2007-05-30 株式会社東芝 磁気ランダムアクセスメモリ
JP5019681B2 (ja) * 2001-04-26 2012-09-05 ルネサスエレクトロニクス株式会社 薄膜磁性体記憶装置
JP4282919B2 (ja) * 2001-04-27 2009-06-24 インターナショナル・ビジネス・マシーンズ・コーポレーション レジスタ
US6490217B1 (en) * 2001-05-23 2002-12-03 International Business Machines Corporation Select line architecture for magnetic random access memories
KR100589569B1 (ko) * 2001-07-17 2006-06-19 산요덴키가부시키가이샤 반도체 메모리 장치
JP4780878B2 (ja) * 2001-08-02 2011-09-28 ルネサスエレクトロニクス株式会社 薄膜磁性体記憶装置
JP4771631B2 (ja) * 2001-09-21 2011-09-14 ルネサスエレクトロニクス株式会社 薄膜磁性体記憶装置
JP4570313B2 (ja) * 2001-10-25 2010-10-27 ルネサスエレクトロニクス株式会社 薄膜磁性体記憶装置
JP3866567B2 (ja) 2001-12-13 2007-01-10 株式会社東芝 半導体記憶装置及びその製造方法
US6594191B2 (en) * 2001-12-13 2003-07-15 Infineon Technologies Ag Segmented write line architecture
US6788605B2 (en) * 2002-07-15 2004-09-07 Hewlett-Packard Development Company, L.P. Shared volatile and non-volatile memory
JP4134637B2 (ja) * 2002-08-27 2008-08-20 株式会社日立製作所 半導体装置
TW578149B (en) * 2002-09-09 2004-03-01 Ind Tech Res Inst High density magnetic random access memory
JP4133149B2 (ja) * 2002-09-12 2008-08-13 株式会社ルネサステクノロジ 半導体記憶装置
US6714441B1 (en) * 2002-09-17 2004-03-30 Micron Technology, Inc. Bridge-type magnetic random access memory (MRAM) latch
JP4274790B2 (ja) * 2002-12-25 2009-06-10 株式会社ルネサステクノロジ 磁気記憶装置
KR100479810B1 (ko) * 2002-12-30 2005-03-31 주식회사 하이닉스반도체 불휘발성 메모리 장치
US6940749B2 (en) * 2003-02-24 2005-09-06 Applied Spintronics Technology, Inc. MRAM array with segmented word and bit lines
US6778429B1 (en) * 2003-06-02 2004-08-17 International Business Machines Corporation Write circuit for a magnetic random access memory
US7203129B2 (en) * 2004-02-16 2007-04-10 Taiwan Semiconductor Manufacturing Company, Ltd. Segmented MRAM memory array
US7209383B2 (en) * 2004-06-16 2007-04-24 Stmicroelectronics, Inc. Magnetic random access memory array having bit/word lines for shared write select and read operations
FR2871921A1 (fr) 2004-06-16 2005-12-23 St Microelectronics Sa Architecture de memoire a lignes d'ecriture segmentees

Also Published As

Publication number Publication date
EP1612804B1 (de) 2009-08-05
JP2006019006A (ja) 2006-01-19
EP1612804A3 (de) 2006-04-26
US20060002182A1 (en) 2006-01-05
US7301800B2 (en) 2007-11-27
EP1612804A2 (de) 2006-01-04

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Legal Events

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8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee