DE602005015464D1 - Strukturen zur digital-analog-wandlung - Google Patents

Strukturen zur digital-analog-wandlung

Info

Publication number
DE602005015464D1
DE602005015464D1 DE602005015464T DE602005015464T DE602005015464D1 DE 602005015464 D1 DE602005015464 D1 DE 602005015464D1 DE 602005015464 T DE602005015464 T DE 602005015464T DE 602005015464 T DE602005015464 T DE 602005015464T DE 602005015464 D1 DE602005015464 D1 DE 602005015464D1
Authority
DE
Germany
Prior art keywords
structures
digital analogue
analogue transformation
transformation
digital
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE602005015464T
Other languages
German (de)
English (en)
Inventor
Patrick C Kirby
Colin G Lyden
Tudor M Vinereanu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Analog Devices Inc
Original Assignee
Analog Devices Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Analog Devices Inc filed Critical Analog Devices Inc
Publication of DE602005015464D1 publication Critical patent/DE602005015464D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1009—Calibration
    • H03M1/1033—Calibration over the full range of the converter, e.g. for correcting differential non-linearity
    • H03M1/1057—Calibration over the full range of the converter, e.g. for correcting differential non-linearity by trimming, i.e. by individually adjusting at least part of the quantisation value generators or stages to their nominal values
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/66—Digital/analogue converters
    • H03M1/74—Simultaneous conversion
    • H03M1/78—Simultaneous conversion using ladder network
    • H03M1/785—Simultaneous conversion using ladder network using resistors, i.e. R-2R ladders

Landscapes

  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Analogue/Digital Conversion (AREA)
DE602005015464T 2004-09-20 2005-08-23 Strukturen zur digital-analog-wandlung Expired - Lifetime DE602005015464D1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US61146904P 2004-09-20 2004-09-20
US11/048,374 US7095351B2 (en) 2004-09-20 2005-02-01 Digital-to-analog converter structures
PCT/EP2005/054141 WO2006032592A1 (en) 2004-09-20 2005-08-23 Digital-to-analog converter structures

Publications (1)

Publication Number Publication Date
DE602005015464D1 true DE602005015464D1 (de) 2009-08-27

Family

ID=35159837

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602005015464T Expired - Lifetime DE602005015464D1 (de) 2004-09-20 2005-08-23 Strukturen zur digital-analog-wandlung

Country Status (7)

Country Link
US (1) US7095351B2 (enExample)
EP (1) EP1792402B1 (enExample)
JP (1) JP4550901B2 (enExample)
CN (1) CN101023583B (enExample)
DE (1) DE602005015464D1 (enExample)
TW (1) TWI296880B (enExample)
WO (1) WO2006032592A1 (enExample)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7173552B1 (en) * 2003-10-01 2007-02-06 Analog Devices, Inc. High accuracy segmented DAC
TWI330001B (en) * 2006-08-15 2010-09-01 Realtek Semiconductor Corp Dynamic bias control circuit and related apparatus for digital-to-analog converter
US7688240B2 (en) * 2008-05-02 2010-03-30 Analog Devices, Inc. Method and apparatus for calibrating an RDAC for end-to-end tolerance correction of output resistance
CN101345527B (zh) * 2008-07-09 2010-06-02 清华大学 一种基于CeRAM单元的数模变换器
DE102010016556A1 (de) * 2009-04-24 2010-11-25 Intersil Americas Inc., Milpitas Widerstands-Feineinstellung für Polysilizium
US8164495B2 (en) * 2009-11-12 2012-04-24 Intersil Americas Inc. Integrated non-linearity (INL) and differential non-linearity (DNL) correction techniques for digital-to-analog converters (DACS)
CN101834605B (zh) * 2010-04-12 2013-03-06 智原科技股份有限公司 模拟数字转换器的测试系统与测试方法
CN101924554B (zh) * 2010-06-30 2013-07-03 中国电子科技集团公司第五十八研究所 电荷耦合流水线模数转换器的共模误差校准电路
WO2012009133A1 (en) 2010-07-15 2012-01-19 Analog Devices, Inc. Programmable linearity correction circuit for digital-to-analog converter
JP6043052B2 (ja) * 2011-06-20 2016-12-14 ティアック株式会社 Ｄａ変換装置
CN102545906B (zh) * 2012-02-10 2015-01-07 英特格灵芯片(天津)有限公司 电流型数模转换方法和装置
US8537043B1 (en) * 2012-04-12 2013-09-17 Analog Devices, Inc. Digital-to-analog converter with controlled gate voltages
US8576101B1 (en) 2012-11-05 2013-11-05 Google Inc. Calibration of an R2R ladder based current digital-to-analog converter (DAC)
US8912939B2 (en) * 2012-12-14 2014-12-16 Analog Devices Technology String DAC leakage current cancellation
CN103795415A (zh) * 2014-01-24 2014-05-14 中国人民解放军国防科学技术大学 基于双路组合数模转换器的高精度数模转换方法及装置
CN104168026B (zh) * 2014-08-25 2017-09-15 长沙瑞达星微电子有限公司 一种分段式电流舵dac电路
US9276598B1 (en) * 2015-05-22 2016-03-01 Texas Instruments Incorporated Trim-matched segmented digital-to-analog converter apparatus, systems and methods
US10425098B2 (en) 2017-05-04 2019-09-24 Analog Devices Global Digital-to-analog converter (DAC) termination
CN110663188B (zh) * 2017-06-21 2023-04-04 德州仪器公司 分段式数/模转换器
US10892771B1 (en) * 2019-09-25 2021-01-12 Texas Instruments Incorporated Segmented resistor digital-to-analog converter
WO2021133708A1 (en) * 2019-12-23 2021-07-01 Texas Instruments Incorporated Hybrid multiplying digital analog converter
US12261622B2 (en) * 2021-06-25 2025-03-25 Intel Corporation Circuitry for digital-to-analog conversion, differential systems and digital-to-analog converter
CN113517891B (zh) * 2021-09-13 2022-01-04 成都爱旗科技有限公司 一种应用于数模转换器的线性校准系统和方法
CN115694483B (zh) * 2022-10-17 2024-03-29 电子科技大学 电阻网络、低温数模转换器电路、芯片及相关装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5119094A (en) * 1989-11-20 1992-06-02 Analog Devices, Inc. Termination circuit for an r-2r, ladder that compensates for the temperature drift caused by different current densities along the ladder, using one type of biopolar transistor
US5764174A (en) * 1996-05-14 1998-06-09 Analog Devices, Inc. Switch architecture for R/2R digital to analog converters
JPH1117547A (ja) 1997-06-19 1999-01-22 Sanyo Electric Co Ltd Ｄ／ａ変換器
JP4311511B2 (ja) * 1999-10-25 2009-08-12 日本バーブラウン株式会社 デジタル−アナログ変換の方法および装置
JP3803900B2 (ja) 1999-11-01 2006-08-02 ローム株式会社 ディジタル・アナログ変換器
US6429798B1 (en) * 2000-02-08 2002-08-06 Ericsson Inc. Combined transmit filter and D-to-A converter

Also Published As

Publication number Publication date
EP1792402B1 (en) 2009-07-15
US7095351B2 (en) 2006-08-22
CN101023583B (zh) 2012-10-10
US20060061500A1 (en) 2006-03-23
JP2008514065A (ja) 2008-05-01
EP1792402A1 (en) 2007-06-06
TW200637160A (en) 2006-10-16
WO2006032592A1 (en) 2006-03-30
TWI296880B (en) 2008-05-11
JP4550901B2 (ja) 2010-09-22
CN101023583A (zh) 2007-08-22

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