DE602004012915D1 - Automatisches Analysengerät - Google Patents

Automatisches Analysengerät

Info

Publication number
DE602004012915D1
DE602004012915D1 DE602004012915T DE602004012915T DE602004012915D1 DE 602004012915 D1 DE602004012915 D1 DE 602004012915D1 DE 602004012915 T DE602004012915 T DE 602004012915T DE 602004012915 T DE602004012915 T DE 602004012915T DE 602004012915 D1 DE602004012915 D1 DE 602004012915D1
Authority
DE
Germany
Prior art keywords
automatic analyzer
analyzer
automatic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE602004012915T
Other languages
English (en)
Other versions
DE602004012915T2 (de
Inventor
Hiroyuki Suzuki
Satoshi Shibuya
Isao Yamazaki
Masaaki Hanawa
Masaharu Nishida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi High Tech Corp
Original Assignee
Hitachi High Technologies Corp
Hitachi High Tech Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi High Technologies Corp, Hitachi High Tech Corp filed Critical Hitachi High Technologies Corp
Publication of DE602004012915D1 publication Critical patent/DE602004012915D1/de
Application granted granted Critical
Publication of DE602004012915T2 publication Critical patent/DE602004012915T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/026—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations having blocks or racks of reaction cells or cuvettes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04—Details of the conveyor system
    • G01N2035/046—General conveyor features
    • G01N2035/0462—Buffers [FIFO] or stacks [LIFO] for holding carriers between operations

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
DE602004012915T 2003-03-19 2004-02-11 Automatisches Analysengerät Expired - Lifetime DE602004012915T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2003074752A JP3931150B2 (ja) 2003-03-19 2003-03-19 自動分析装置
JP2003074752 2003-03-19

Publications (2)

Publication Number Publication Date
DE602004012915D1 true DE602004012915D1 (de) 2008-05-21
DE602004012915T2 DE602004012915T2 (de) 2009-05-28

Family

ID=32821336

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602004012915T Expired - Lifetime DE602004012915T2 (de) 2003-03-19 2004-02-11 Automatisches Analysengerät

Country Status (4)

Country Link
US (1) US20040186360A1 (de)
EP (1) EP1460431B1 (de)
JP (1) JP3931150B2 (de)
DE (1) DE602004012915T2 (de)

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EP1653234A1 (de) * 2004-10-27 2006-05-03 Roche Diagnostics GmbH Carouselartige Probeentnahmestation
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US7628954B2 (en) 2005-05-04 2009-12-08 Abbott Laboratories, Inc. Reagent and sample handling device for automatic testing system
JP4801542B2 (ja) * 2006-09-08 2011-10-26 株式会社日立ハイテクノロジーズ 自動分析装置
JP2008209332A (ja) * 2007-02-28 2008-09-11 Hitachi High-Technologies Corp 自動分析装置
US8112229B2 (en) * 2007-05-31 2012-02-07 Abbott Laboratories Method for determining the order of execution of assays of a sample in a laboratory automation system
JP5156282B2 (ja) * 2007-06-27 2013-03-06 株式会社日立ハイテクノロジーズ 自動分析装置のラック搬送方法
JP5083095B2 (ja) * 2007-08-10 2012-11-28 富士ゼロックス株式会社 画像表示媒体及び画像表示装置
JP5049769B2 (ja) 2007-12-25 2012-10-17 株式会社日立ハイテクノロジーズ 自動分析装置および検体処理システム
IT1390719B1 (it) * 2008-07-16 2011-09-15 Dachi S R L Procedimento per la gestione di campioni urgenti all'interno di un impianto di automazione
US8534447B2 (en) 2008-09-16 2013-09-17 Ibis Biosciences, Inc. Microplate handling systems and related computer program products and methods
JP5142976B2 (ja) * 2008-12-25 2013-02-13 株式会社日立ハイテクノロジーズ 自動分析装置
JP5315044B2 (ja) * 2008-12-26 2013-10-16 シスメックス株式会社 検体検査装置
WO2010087303A1 (ja) * 2009-01-27 2010-08-05 株式会社日立ハイテクノロジーズ 自動分析装置および自動分析方法
JP2010181197A (ja) * 2009-02-03 2010-08-19 Beckman Coulter Inc 自動分析装置およびラック搬送方法
JP5093140B2 (ja) * 2009-02-09 2012-12-05 株式会社島津製作所 検体搬送システム
JP5378859B2 (ja) * 2009-03-30 2013-12-25 シスメックス株式会社 検体検査システム
CN102725641B (zh) * 2010-01-28 2015-09-23 株式会社日立高新技术 自动分析系统
EP2455763B1 (de) 2010-11-23 2018-10-17 F. Hoffmann-La Roche AG Verbindung, Vorrichtung und Verfahren zum Transportieren von Probenregalen
EP2755037A4 (de) * 2011-09-05 2015-04-08 Hitachi High Tech Corp Automatische analysevorrichtung
JP5417498B2 (ja) * 2012-07-20 2014-02-12 株式会社日立ハイテクノロジーズ 検体処理システム
US9709588B2 (en) 2013-06-17 2017-07-18 Hitachi High-Technologies Corporation Automatic analyzer
EP3176587B1 (de) * 2014-07-31 2020-11-04 Hitachi High-Tech Corporation Automatisierter analysator
CN104181316B (zh) * 2014-08-28 2018-04-27 爱威科技股份有限公司 一种样本多项检测装置及方法
JP6898239B2 (ja) 2015-01-23 2021-07-07 エフ．ホフマン−ラ ロシュ アーゲーＦ． Ｈｏｆｆｍａｎｎ−Ｌａ Ｒｏｃｈｅ Ａｋｔｉｅｎｇｅｓｅｌｌｓｃｈａｆｔ 分析機器の試薬ロータに試薬容器を装填するための装填デバイス、および、分析機器
JP6069459B2 (ja) * 2015-10-30 2017-02-01 株式会社日立ハイテクノロジーズ 検体処理システム、機能モジュール、および、検体処理システムの検体ラックの搬送方法
EP3517972B1 (de) 2016-09-23 2023-03-08 Hitachi High-Tech Corporation Probentestautomatisierungssystem
EP4345459A3 (de) * 2016-12-19 2024-06-05 Hitachi High-Tech Corporation Automatischer analysator
JP6165958B2 (ja) * 2016-12-26 2017-07-19 株式会社日立ハイテクノロジーズ 検体処理システム
JP6166002B2 (ja) * 2017-01-31 2017-07-19 株式会社日立ハイテクノロジーズ 検体処理システム
JP6166001B2 (ja) * 2017-01-31 2017-07-19 株式会社日立ハイテクノロジーズ 検体処理システム
CN110325865A (zh) * 2017-03-07 2019-10-11 株式会社日立高新技术 自动分析装置
US11565266B2 (en) * 2017-08-09 2023-01-31 Hitachi High-Tech Corporation Automatic analyzer
JP2019045363A (ja) * 2017-09-05 2019-03-22 株式会社日立ハイテクノロジーズ 自動分析装置
JP6943977B2 (ja) * 2017-12-15 2021-10-06 株式会社日立ハイテク 自動分析装置
CN109975568B (zh) * 2017-12-28 2022-11-11 深圳市新产业生物医学工程股份有限公司 样本架调度控制方法、系统以及医学检测设备
JP6638029B2 (ja) * 2018-07-13 2020-01-29 株式会社日立ハイテクノロジーズ 検体処理システム
CN112585473B (zh) * 2018-12-11 2024-01-12 株式会社日立高新技术 自动分析装置
US11755725B2 (en) 2019-01-30 2023-09-12 Salesforce, Inc. Machine learning anomaly detection mechanism
CN112285357B (zh) * 2019-07-25 2024-03-08 深圳迈瑞生物医疗电子股份有限公司 样本分析方法及样本分析系统

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JP2819697B2 (ja) * 1989-11-30 1998-10-30 株式会社島津製作所 自動分析装置
JPH03183957A (ja) * 1989-12-13 1991-08-09 Shimadzu Corp 自動分析装置
JPH0833402B2 (ja) * 1990-01-26 1996-03-29 株式会社島津製作所 自動分析装置
JPH05264558A (ja) * 1992-03-19 1993-10-12 Nittec Co Ltd 容器の移送装置
JPH0634642A (ja) * 1992-07-20 1994-02-10 Nittec Co Ltd 容器移送装置
JPH06207943A (ja) * 1993-01-11 1994-07-26 Toshiba Corp 自動分析装置
JP3579516B2 (ja) * 1995-07-26 2004-10-20 株式会社エイアンドティー 検体搬送システム
JP3579515B2 (ja) * 1995-07-26 2004-10-20 株式会社エイアンドティー 検体搬送システム
JP3336894B2 (ja) * 1997-01-29 2002-10-21 株式会社日立製作所 自動分析装置
JPH10282111A (ja) * 1997-04-09 1998-10-23 Hitachi Ltd 検体分析システム
EP0871034B1 (de) * 1997-04-10 2007-03-07 Hitachi, Ltd. Automatische Analysevorrichtung
JPH10282115A (ja) * 1997-04-10 1998-10-23 Hitachi Ltd 検体分析装置
JP3889877B2 (ja) * 1997-04-10 2007-03-07 株式会社日立製作所 自動分析装置およびその支援システム
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JP3668618B2 (ja) * 1998-09-29 2005-07-06 株式会社日立製作所 自動分析装置
JP3740317B2 (ja) * 1999-03-17 2006-02-01 株式会社日立製作所 自動分析装置
JP2001091523A (ja) * 1999-09-21 2001-04-06 Hitachi Ltd 自動分析装置
JP2001153875A (ja) * 1999-11-29 2001-06-08 Olympus Optical Co Ltd 自動分析装置
WO2001051929A1 (fr) * 2000-01-12 2001-07-19 Hitachi, Ltd. Analyseur automatique et dispositif de transfert de portoir
WO2002059624A1 (en) * 2001-01-23 2002-08-01 Hitachi, Ltd. Automatic analyzer
SM200100015B (it) * 2001-08-09 2003-02-12 Arper Spa Struttura di sedia
JP3830836B2 (ja) * 2002-03-07 2006-10-11 株式会社日立ハイテクノロジーズ 自動分析装置
US6723288B2 (en) * 2002-04-29 2004-04-20 Dade Behring Inc. Method of providing assay processing in a multi-analyzer system

Also Published As

Publication number Publication date
JP2004279357A (ja) 2004-10-07
EP1460431B1 (de) 2008-04-09
EP1460431A2 (de) 2004-09-22
JP3931150B2 (ja) 2007-06-13
US20040186360A1 (en) 2004-09-23
DE602004012915T2 (de) 2009-05-28
EP1460431A3 (de) 2004-12-08

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