DE602004004253D1 - Gleichzeitiges lesen von und schreiben in verschiedene speicherzellen - Google Patents
Gleichzeitiges lesen von und schreiben in verschiedene speicherzellenInfo
- Publication number
- DE602004004253D1 DE602004004253D1 DE602004004253T DE602004004253T DE602004004253D1 DE 602004004253 D1 DE602004004253 D1 DE 602004004253D1 DE 602004004253 T DE602004004253 T DE 602004004253T DE 602004004253 T DE602004004253 T DE 602004004253T DE 602004004253 D1 DE602004004253 D1 DE 602004004253D1
- Authority
- DE
- Germany
- Prior art keywords
- writing
- memory cells
- different memory
- simultaneous reading
- simultaneous
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/22—Read-write [R-W] timing or clocking circuits; Read-write [R-W] control signal generators or management
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/14—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using thin-film elements
- G11C11/15—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using thin-film elements using multiple magnetic layers
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C8/00—Arrangements for selecting an address in a digital store
- G11C8/16—Multiple access memory array, e.g. addressing one storage element via at least two independent addressing line groups
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
- G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
- G11C13/0021—Auxiliary circuits
- G11C13/0069—Writing or programming circuits or methods
- G11C2013/0076—Write operation performed depending on read result
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Mram Or Spin Memory Techniques (AREA)
- Semiconductor Memories (AREA)
- Hall/Mr Elements (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP03100725 | 2003-03-20 | ||
EP03100725 | 2003-03-20 | ||
PCT/IB2004/050274 WO2004084226A1 (en) | 2003-03-20 | 2004-03-17 | Simultaneous reading from and writing to different memory cells |
Publications (2)
Publication Number | Publication Date |
---|---|
DE602004004253D1 true DE602004004253D1 (de) | 2007-02-22 |
DE602004004253T2 DE602004004253T2 (de) | 2007-11-15 |
Family
ID=33016982
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE602004004253T Expired - Lifetime DE602004004253T2 (de) | 2003-03-20 | 2004-03-17 | Gleichzeitiges lesen von und schreiben in verschiedene speicherzellen |
Country Status (6)
Country | Link |
---|---|
US (1) | US7382664B2 (de) |
EP (1) | EP1609153B1 (de) |
JP (1) | JP2006523358A (de) |
CN (1) | CN100541650C (de) |
DE (1) | DE602004004253T2 (de) |
WO (1) | WO2004084226A1 (de) |
Families Citing this family (27)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
ATE378683T1 (de) * | 2003-07-22 | 2007-11-15 | Nxp Bv | Kompensation einer langen lesezeit einer speichervorrichtung in datenvergleichs- und schreiboperationen |
US8314024B2 (en) * | 2008-12-19 | 2012-11-20 | Unity Semiconductor Corporation | Device fabrication |
US7646627B2 (en) * | 2006-05-18 | 2010-01-12 | Renesas Technology Corp. | Magnetic random access memory having improved read disturb suppression and thermal disturbance resistance |
US7760542B2 (en) * | 2008-04-21 | 2010-07-20 | Seagate Technology Llc | Spin-torque memory with unidirectional write scheme |
US8233319B2 (en) | 2008-07-18 | 2012-07-31 | Seagate Technology Llc | Unipolar spin-transfer switching memory unit |
US7933146B2 (en) * | 2008-10-08 | 2011-04-26 | Seagate Technology Llc | Electronic devices utilizing spin torque transfer to flip magnetic orientation |
US7933137B2 (en) * | 2008-10-08 | 2011-04-26 | Seagate Teachnology Llc | Magnetic random access memory (MRAM) utilizing magnetic flip-flop structures |
US8055958B2 (en) * | 2008-12-11 | 2011-11-08 | Samsung Electronics Co., Ltd. | Replacement data storage circuit storing address of defective memory cell |
US7965543B2 (en) * | 2009-04-30 | 2011-06-21 | Everspin Technologies, Inc. | Method for reducing current density in a magnetoelectronic device |
US8315081B2 (en) | 2010-03-22 | 2012-11-20 | Qualcomm Incorporated | Memory cell that includes multiple non-volatile memories |
US8284597B2 (en) * | 2010-05-06 | 2012-10-09 | Macronix International Co., Ltd. | Diode memory |
US9196341B2 (en) * | 2010-05-12 | 2015-11-24 | Qualcomm Incorporated | Memory device having a local current sink |
FR2964248B1 (fr) * | 2010-09-01 | 2013-07-19 | Commissariat Energie Atomique | Dispositif magnetique et procede de lecture et d’ecriture dans un tel dispositif magnetique |
US8625336B2 (en) * | 2011-02-08 | 2014-01-07 | Crocus Technology Inc. | Memory devices with series-interconnected magnetic random access memory cells |
EP2751807A4 (de) | 2011-09-02 | 2015-02-18 | Hewlett Packard Development Co | Vorrichtung zur speicherung von daten und verfahren zum lesen von speicherzellen |
KR20140052695A (ko) * | 2012-10-25 | 2014-05-07 | 삼성전자주식회사 | 양방향 리드 스킴을 갖는 자기 메모리 장치 |
US9530822B2 (en) * | 2013-04-28 | 2016-12-27 | Alexander Mikhailovich Shukh | High density nonvolatile memory |
US9312005B2 (en) | 2013-09-10 | 2016-04-12 | Micron Technology, Inc. | Accessing memory cells in parallel in a cross-point array |
GB2527363B (en) * | 2014-06-20 | 2019-06-19 | Advanced Risc Mach Ltd | Read assist techniques in a memory device |
US9792986B2 (en) * | 2015-05-29 | 2017-10-17 | Intel Corporation | Phase change memory current |
US9514796B1 (en) | 2015-06-26 | 2016-12-06 | Intel Corporation | Magnetic storage cell memory with back hop-prevention |
US9614002B1 (en) * | 2016-01-21 | 2017-04-04 | Samsung Electronics Co., Ltd. | 0T bi-directional memory cell |
KR20210126436A (ko) | 2020-04-10 | 2021-10-20 | 삼성전자주식회사 | 검증을 포함하는 기입 동작을 위한 메모리 장치 및 그것의 동작 방법 |
KR20220033146A (ko) * | 2020-09-09 | 2022-03-16 | 삼성전자주식회사 | 저항성 메모리 장치 및 저항성 메모리 장치의 데이터 리드 방법 |
CN117378009A (zh) * | 2021-08-22 | 2024-01-09 | 华为技术有限公司 | 一种磁性随机存储器及电子设备 |
CN114022148B (zh) * | 2021-12-24 | 2022-04-22 | 杭州趣链科技有限公司 | 基于区块链的交易冲突检测方法、装置、设备和存储介质 |
CN116644703B (zh) * | 2023-05-29 | 2023-11-24 | 合芯科技有限公司 | 一种位图文件的生成方法及装置 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4672583A (en) * | 1983-06-15 | 1987-06-09 | Nec Corporation | Dynamic random access memory device provided with test circuit for internal refresh circuit |
US5640343A (en) | 1996-03-18 | 1997-06-17 | International Business Machines Corporation | Magnetic memory array using magnetic tunnel junction devices in the memory cells |
JP4215844B2 (ja) * | 1997-11-05 | 2009-01-28 | 日本テキサス・インスツルメンツ株式会社 | 半導体記憶装置 |
US6545906B1 (en) | 2001-10-16 | 2003-04-08 | Motorola, Inc. | Method of writing to scalable magnetoresistance random access memory element |
US6687179B2 (en) * | 2002-04-10 | 2004-02-03 | Micron Technology, Inc. | Method and system for writing data in an MRAM memory device |
TW200405338A (en) * | 2002-05-22 | 2004-04-01 | Koninkl Philips Electronics Nv | MRAM-cell and array-architecture with maximum read-out signal and reduced electro-magnetic interference |
-
2004
- 2004-03-17 US US10/549,559 patent/US7382664B2/en active Active
- 2004-03-17 EP EP04721265A patent/EP1609153B1/de not_active Expired - Lifetime
- 2004-03-17 CN CNB2004800072540A patent/CN100541650C/zh not_active Expired - Fee Related
- 2004-03-17 DE DE602004004253T patent/DE602004004253T2/de not_active Expired - Lifetime
- 2004-03-17 JP JP2006506728A patent/JP2006523358A/ja not_active Withdrawn
- 2004-03-17 WO PCT/IB2004/050274 patent/WO2004084226A1/en active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
WO2004084226A1 (en) | 2004-09-30 |
US7382664B2 (en) | 2008-06-03 |
CN1777956A (zh) | 2006-05-24 |
JP2006523358A (ja) | 2006-10-12 |
CN100541650C (zh) | 2009-09-16 |
US20060209600A1 (en) | 2006-09-21 |
DE602004004253T2 (de) | 2007-11-15 |
EP1609153A1 (de) | 2005-12-28 |
EP1609153B1 (de) | 2007-01-10 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
DE602004004253D1 (de) | Gleichzeitiges lesen von und schreiben in verschiedene speicherzellen | |
DE602004025452D1 (de) | Sim-karten lese- und schreibgerät | |
DE60324614D1 (de) | Speicherzelle und Speichervorrichtung | |
NO20020847L (no) | Referansecelle for höyhastighetslesing i ikke-flyktige hukommelsekretser | |
DE60003628D1 (de) | Halbleiterspeicheranordnung mit verringertem Stromverbrauch bei Datenhaltemodus | |
IL169151A0 (en) | Memory system having fast and slow data reading mechanisms | |
DE60030680D1 (de) | Zuverlässiges Speicherlaufwerk und Datenschreibverfahren | |
DE602004017270D1 (de) | Speicheranordnung mit schneller Leseoperation und niedrigerem Stromverbrauch sowie entsprechendes Leseverfahren | |
DE60303835D1 (de) | Magnetischer Direktzugriffsspeicher sowie entsprechendes Leseverfahren | |
DE10196635T1 (de) | Speichermodul und in eine Speicherkomponente eingebaute Selbstprüfung | |
DE602005001829D1 (de) | Magnetische Multibit-Direktzugriffspeicheranordnung und deren Schreibverfahren | |
DE50106823D1 (de) | Schaltungsanordnung zum zerstörungsfreien, selbstnormierenden auslesen von mram-speicherzellen | |
DE602004001094D1 (de) | USB Speichereinheit und Steuergerät | |
EP1953671A4 (de) | Inhaltsdatenstruktur und speicherkarte | |
DE60323801D1 (de) | Magnetische Speicheranordnung, Herstellungsverfahren und Schreib/Leseverfahren | |
DE60222891D1 (de) | Nichtflüchtige Speicheranordnung und Selbstreparatur-Verfahren | |
DE60305752D1 (de) | SpeicherKarte | |
DE60222349D1 (de) | Verfahren und Anordnung zum Schreiben von Speicherzellen | |
DE60302029D1 (de) | Barcodeleser und Barcodeleseverfahren | |
DE60314287D1 (de) | Nichtflüchtiger speicher und schreibverfahren dafür | |
ITTO20021035A1 (it) | Dispositivo di memoria non volatile a lettura e scrittura simulante. | |
FI20045505A0 (fi) | Laitteen muistiin tallennettavan tiedon suojaaminen | |
DE60305668D1 (de) | Erhöhen des lesesignals in ferroelektrischen speichern | |
DE602004001679D1 (de) | Speichersystem mit sequenziell ausgeführten schnellen und langsamen lesezugriffen | |
DE502004006214D1 (de) | Speichertransistor und speichereinheit mit asymmetrischem taschendotierbereich |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8327 | Change in the person/name/address of the patent owner |
Owner name: NXP B.V., EINDHOVEN, NL |
|
8328 | Change in the person/name/address of the agent |
Representative=s name: EISENFUEHR, SPEISER & PARTNER, 10178 BERLIN |