DE602004002300D1 - Selektive bankauffrischung - Google Patents

Selektive bankauffrischung

Info

Publication number
DE602004002300D1
DE602004002300D1 DE602004002300T DE602004002300T DE602004002300D1 DE 602004002300 D1 DE602004002300 D1 DE 602004002300D1 DE 602004002300 T DE602004002300 T DE 602004002300T DE 602004002300 T DE602004002300 T DE 602004002300T DE 602004002300 D1 DE602004002300 D1 DE 602004002300D1
Authority
DE
Germany
Prior art keywords
bank operation
selective
selective bank
bank
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602004002300T
Other languages
English (en)
Other versions
DE602004002300T2 (de
Inventor
Rainer Hoehler
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Qimonda AG
Original Assignee
Infineon Technologies AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Infineon Technologies AG filed Critical Infineon Technologies AG
Publication of DE602004002300D1 publication Critical patent/DE602004002300D1/de
Application granted granted Critical
Publication of DE602004002300T2 publication Critical patent/DE602004002300T2/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/406—Management or control of the refreshing or charge-regeneration cycles
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F12/00—Accessing, addressing or allocating within memory systems or architectures
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/406—Management or control of the refreshing or charge-regeneration cycles
    • G11C11/40618—Refresh operations over multiple banks or interleaving
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/406—Management or control of the refreshing or charge-regeneration cycles
    • G11C11/40622—Partial refresh of memory arrays
DE602004002300T 2003-09-30 2004-09-21 Selektive bankauffrischung Active DE602004002300T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US674905 1996-07-03
US10/674,905 US6956782B2 (en) 2003-09-30 2003-09-30 Selective bank refresh
PCT/EP2004/010580 WO2005041198A1 (en) 2003-09-30 2004-09-21 Selective bank refresh

Publications (2)

Publication Number Publication Date
DE602004002300D1 true DE602004002300D1 (de) 2006-10-19
DE602004002300T2 DE602004002300T2 (de) 2007-09-20

Family

ID=34376980

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602004002300T Active DE602004002300T2 (de) 2003-09-30 2004-09-21 Selektive bankauffrischung

Country Status (7)

Country Link
US (2) US6956782B2 (de)
EP (1) EP1625590B1 (de)
JP (1) JP2007503069A (de)
KR (1) KR100685547B1 (de)
CN (1) CN1856837A (de)
DE (1) DE602004002300T2 (de)
WO (1) WO2005041198A1 (de)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100543914B1 (ko) * 2003-04-30 2006-01-23 주식회사 하이닉스반도체 리프레쉬 동작시 피크 전류를 줄일 수 있는 반도체 메모리장치
US6956782B2 (en) * 2003-09-30 2005-10-18 Infineon Technologies Ag Selective bank refresh
US7345940B2 (en) * 2003-11-18 2008-03-18 Infineon Technologies Ag Method and circuit configuration for refreshing data in a semiconductor memory
US7392339B2 (en) * 2003-12-10 2008-06-24 Intel Corporation Partial bank DRAM precharge
US7583551B2 (en) 2004-03-10 2009-09-01 Micron Technology, Inc. Power management control and controlling memory refresh operations
US7342841B2 (en) * 2004-12-21 2008-03-11 Intel Corporation Method, apparatus, and system for active refresh management
KR100607334B1 (ko) * 2004-12-30 2006-08-01 주식회사 하이닉스반도체 슈도 에스램의 리프레쉬 제어 회로
KR100642759B1 (ko) * 2005-01-28 2006-11-10 삼성전자주식회사 선택적 리프레쉬가 가능한 반도체 메모리 디바이스
KR100665901B1 (ko) * 2005-03-31 2007-01-11 주식회사 하이닉스반도체 반도체 기억 소자의 개별 뱅크 리프레쉬 회로 및 방법
US7457185B2 (en) * 2005-09-29 2008-11-25 Hynix Semiconductor Inc. Semiconductor memory device with advanced refresh control
KR100706830B1 (ko) * 2005-10-19 2007-04-13 주식회사 하이닉스반도체 반도체 메모리의 액티브 구간 제어장치 및 방법
US7492656B2 (en) 2006-04-28 2009-02-17 Mosaid Technologies Incorporated Dynamic random access memory with fully independent partial array refresh function
DE102006040399B4 (de) * 2006-08-29 2010-10-21 Qimonda Ag Vorrichtung zur Erneuerung von Speicherinhalten
US20080056051A1 (en) * 2006-08-31 2008-03-06 Peter Mayer Memory with memory banks and mode registers and method of operating a memory
US8095725B2 (en) 2007-12-31 2012-01-10 Intel Corporation Device, system, and method of memory allocation
US7859932B2 (en) * 2008-12-18 2010-12-28 Sandisk Corporation Data refresh for non-volatile storage
JP2012522311A (ja) * 2009-03-30 2012-09-20 ラムバス・インコーポレーテッド マージドメモリコマンドプロトコルをサポートするメモリシステム、コントローラ、およびデバイス
WO2013183155A1 (ja) * 2012-06-07 2013-12-12 富士通株式会社 選択的にメモリのリフレッシュを行う制御装置
KR102321793B1 (ko) 2015-08-12 2021-11-08 삼성전자주식회사 플렉시블 리프레쉬 스킵 영역을 운영하는 반도체 메모리 장치
US10878879B2 (en) * 2017-06-21 2020-12-29 Mediatek Inc. Refresh control method for memory system to perform refresh action on all memory banks of the memory system within refresh window
US10332582B2 (en) 2017-08-02 2019-06-25 Qualcomm Incorporated Partial refresh technique to save memory refresh power
FR3104277B1 (fr) * 2019-12-04 2022-05-06 St Microelectronics Grenoble 2 gestion de mémoire pour économiser de l’énergie
US11379367B2 (en) * 2020-11-19 2022-07-05 Micron Technology, Inc. Enhancement for activation and deactivation of memory address regions
US11880572B2 (en) * 2021-09-15 2024-01-23 Adp, Inc. Cache refresh system and processes
US20230342048A1 (en) * 2022-04-21 2023-10-26 Micron Technology, Inc. Self-Refresh Arbitration

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4357686A (en) 1980-09-24 1982-11-02 Sperry Corporation Hidden memory refresh
US5122988A (en) * 1989-09-21 1992-06-16 Schlumberger Tecnologies, Inc. Data stream smoothing using a FIFO memory
US5148546A (en) 1991-04-22 1992-09-15 Blodgett Greg A Method and system for minimizing power demands on portable computers and the like by refreshing selected dram cells
US5790831A (en) * 1994-11-01 1998-08-04 Opti Inc. VL-bus/PCI-bus bridge
JP3714489B2 (ja) * 1995-03-03 2005-11-09 株式会社日立製作所 ダイナミック型ｒａｍとメモリモジュール
JP2792486B2 (ja) * 1995-10-27 1998-09-03 日本電気株式会社 半導体記憶装置
US6167484A (en) * 1998-05-12 2000-12-26 Motorola, Inc. Method and apparatus for leveraging history bits to optimize memory refresh performance
JP2002352579A (ja) * 2001-05-25 2002-12-06 Sony Corp 情報記憶装置及び方法、メモリユニット、記録媒体、並びにプログラム
JP2002373489A (ja) 2001-06-15 2002-12-26 Mitsubishi Electric Corp 半導体記憶装置
JP2003297080A (ja) * 2002-03-29 2003-10-17 Mitsubishi Electric Corp 半導体記憶装置
KR100455393B1 (ko) * 2002-08-12 2004-11-06 삼성전자주식회사 리프레시 플래그를 발생시키는 반도체 메모리 장치 및반도체 메모리 시스템.
JP2004259343A (ja) 2003-02-25 2004-09-16 Renesas Technology Corp 半導体記憶装置
US6956782B2 (en) * 2003-09-30 2005-10-18 Infineon Technologies Ag Selective bank refresh

Also Published As

Publication number Publication date
DE602004002300T2 (de) 2007-09-20
CN1856837A (zh) 2006-11-01
US20050068826A1 (en) 2005-03-31
US20060087902A1 (en) 2006-04-27
EP1625590A1 (de) 2006-02-15
US6956782B2 (en) 2005-10-18
US7193919B2 (en) 2007-03-20
WO2005041198A1 (en) 2005-05-06
JP2007503069A (ja) 2007-02-15
KR100685547B1 (ko) 2007-02-22
EP1625590B1 (de) 2006-09-06
KR20060064055A (ko) 2006-06-12

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Legal Events

Date Code Title Description
8327 Change in the person/name/address of the patent owner

Owner name: QIMONDA AG, 81739 MUENCHEN, DE

8364 No opposition during term of opposition