DE60139861D1 - Vorrichtung und verfahren zur bilderzeugung - Google Patents

Vorrichtung und verfahren zur bilderzeugung

Info

Publication number
DE60139861D1
DE60139861D1 DE60139861T DE60139861T DE60139861D1 DE 60139861 D1 DE60139861 D1 DE 60139861D1 DE 60139861 T DE60139861 T DE 60139861T DE 60139861 T DE60139861 T DE 60139861T DE 60139861 D1 DE60139861 D1 DE 60139861D1
Authority
DE
Germany
Prior art keywords
sample
radiation
imaging
thz
subdividing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60139861T
Other languages
English (en)
Inventor
Donald Dominic Arnone
Craig Michael Ciesla
Bryan Edward Cole
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TeraView Ltd
Original Assignee
TeraView Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by TeraView Ltd filed Critical TeraView Ltd
Application granted granted Critical
Publication of DE60139861D1 publication Critical patent/DE60139861D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4795—Scattering, i.e. diffuse reflection spatially resolved investigating of object in scattering medium
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Toxicology (AREA)
  • Optics & Photonics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DE60139861T 2000-02-28 2001-02-28 Vorrichtung und verfahren zur bilderzeugung Expired - Lifetime DE60139861D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB0004668A GB2359716B (en) 2000-02-28 2000-02-28 An imaging apparatus and method
PCT/GB2001/000860 WO2001065239A1 (en) 2000-02-28 2001-02-28 An imaging apparatus and method

Publications (1)

Publication Number Publication Date
DE60139861D1 true DE60139861D1 (de) 2009-10-22

Family

ID=9886538

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60139861T Expired - Lifetime DE60139861D1 (de) 2000-02-28 2001-02-28 Vorrichtung und verfahren zur bilderzeugung

Country Status (8)

Country Link
US (1) US7174037B2 (de)
EP (1) EP1269156B1 (de)
JP (1) JP2003525446A (de)
AT (1) ATE442578T1 (de)
AU (1) AU2001235801A1 (de)
DE (1) DE60139861D1 (de)
GB (1) GB2359716B (de)
WO (1) WO2001065239A1 (de)

Families Citing this family (84)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6816647B1 (en) * 1999-10-14 2004-11-09 Picometrix, Inc. Compact fiber pigtailed terahertz modules
US7152007B2 (en) 2000-02-28 2006-12-19 Tera View Limited Imaging apparatus and method
GB2384901B (en) 2002-02-04 2004-04-21 Zentian Ltd Speech recognition circuit using parallel processors
US6815683B2 (en) 2002-05-31 2004-11-09 New Jersey Institute Of Technology Terahertz imaging system and method
JP2004108905A (ja) * 2002-09-18 2004-04-08 Inst Of Physical & Chemical Res テラヘルツ波を用いた差分イメージング方法及び装置
GB2402471B (en) * 2003-06-02 2006-01-18 Teraview Ltd An analysis method and apparatus
US7507963B2 (en) * 2003-10-01 2009-03-24 California Institute Of Technology Sub-millimeter wave frequency heterodyne detector system
US7649633B2 (en) 2003-11-20 2010-01-19 National Institute Of Advanced Industrial Science And Technology Method and instrument for measuring complex dielectric constant of a sample by optical spectral measurement
JP2005157601A (ja) * 2003-11-25 2005-06-16 Canon Inc 電磁波による積層状物体計数装置及び計数方法
GB2409026B (en) * 2003-12-09 2007-09-12 Teraview Ltd An investigation system,a receiver and a method of investigating a sample
GB2410081B (en) 2004-01-19 2007-02-21 Limited Cambridge University T Terahertz radiation sensor and imaging system
GB2411093B (en) * 2004-02-13 2007-10-24 Teraview Ltd Terahertz imaging system
GB2436744B (en) * 2004-02-13 2008-09-10 Tera View Ltd Terahertz imaging system
US7291839B1 (en) * 2004-05-03 2007-11-06 Emcore Corporation Subcentimeter radiation detection and frequency domain spectroscopy
DE102004021869A1 (de) * 2004-05-04 2005-12-01 Torsten Dr. Löffler Vorrichtung und Verfahren zur Erfassung von Hochfrequenzstrahlung
GB2414294B (en) 2004-05-20 2006-08-02 Teraview Ltd Apparatus and method for investigating a sample
CA2567967C (en) 2004-05-26 2016-08-02 Picometrix, Llc Terahertz imaging in reflection and transmission mode for luggage and personnel inspection
GB2415777B (en) * 2004-06-29 2006-11-01 Tera View Ltd Imaging apparatus and method
KR101217659B1 (ko) * 2004-09-03 2013-01-02 스탠리 일렉트릭 컴퍼니, 리미티드 Ｅｌ소자
GB2418337B (en) * 2004-09-17 2008-07-16 Tera View Ltd An imaging apparatus and method
DE102004046123A1 (de) * 2004-09-23 2006-08-24 Forschungszentrum Rossendorf E.V. Kohärente Terahertz-Strahlungsquelle
JP2006145513A (ja) * 2004-11-17 2006-06-08 Semiconductor Res Found ダイオード発振素子を用いたイメージングシステムおよびイメージング方法
US20070257194A1 (en) * 2005-03-22 2007-11-08 Mueller Eric R Terahertz heterodyne tomographic imaging system
US8129684B2 (en) * 2005-03-22 2012-03-06 Coherent, Inc. Detection of hidden objects by terahertz heterodyne laser imaging
US7345279B2 (en) 2005-09-20 2008-03-18 Coherent, Inc. Identification of hidden objects by terahertz heterodyne laser imaging
JP4250603B2 (ja) 2005-03-28 2009-04-08 キヤノン株式会社 テラヘルツ波の発生素子、及びその製造方法
JP2006275910A (ja) * 2005-03-30 2006-10-12 Canon Inc 位置センシング装置及び位置センシング方法
GB0510109D0 (en) * 2005-05-18 2005-06-22 Ct For Integrated Photonics Th Method to generate and detect the radiation
GB0510112D0 (en) * 2005-05-18 2005-06-22 Ct For Integrated Photonics Th The detector
US7609875B2 (en) * 2005-05-27 2009-10-27 Orametrix, Inc. Scanner system and method for mapping surface of three-dimensional object
JP2007017419A (ja) * 2005-07-07 2007-01-25 Semiconductor Res Found ダイオード発振素子を用いた建材および建造物のイメージング方法およびイメージングシステム
US7342230B2 (en) * 2005-07-20 2008-03-11 The Boeing Company Terahertz imaging system and associated method
US7378658B2 (en) 2005-09-20 2008-05-27 Coherent, Inc. Security portal with THz trans-receiver
JP4819466B2 (ja) * 2005-10-03 2011-11-24 株式会社アドバンテスト 伝達特性測定装置、方法、プログラムおよび記録媒体
FR2892514A1 (fr) * 2005-10-25 2007-04-27 Thales Sa Detecteur d'ondes electromagnetiques a bande passante terahertz
CN100424550C (zh) * 2006-11-21 2008-10-08 中国计量学院 光子晶体太赫兹波调制器装置及其方法
US7439511B2 (en) * 2007-01-31 2008-10-21 Emcore Corporation Pulsed terahertz frequency domain spectrometer with single mode-locked laser and dispersive phase modulator
US7535005B2 (en) * 2007-01-31 2009-05-19 Emcore Corporation Pulsed terahertz spectrometer
DE102007057850A1 (de) * 2007-02-02 2009-06-04 Msa Auer Gmbh Spektrales Messsystem
DE102007006082B4 (de) * 2007-02-02 2010-04-15 Msa Auer Gmbh Spektrales Messsystem
DE102007011820B4 (de) * 2007-03-12 2013-04-18 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Verfahren zum schnellen Messen von Proben mit geringem optischen Wegunterschied mittels elektromagnetischer Strahlung im Terahertz-Bereich
JP5043488B2 (ja) 2007-03-30 2012-10-10 キヤノン株式会社 検出装置、及びイメージング装置
US7795582B2 (en) * 2007-10-19 2010-09-14 Honeywell International Inc. System and method of monitoring with temperature stabilization
US7609366B2 (en) * 2007-11-16 2009-10-27 Honeywell International Inc. Material measurement system for obtaining coincident properties and related method
JP4834718B2 (ja) * 2008-01-29 2011-12-14 キヤノン株式会社 パルスレーザ装置、テラヘルツ発生装置、テラヘルツ計測装置及びテラヘルツトモグラフィー装置
US7936453B2 (en) * 2008-04-04 2011-05-03 Emcore Corporation Terahertz frequency domain spectrometer with integrated dual laser module
US7781736B2 (en) * 2008-05-19 2010-08-24 Emcore Corporation Terahertz frequency domain spectrometer with controllable phase shift
US9029775B2 (en) 2008-05-19 2015-05-12 Joseph R. Demers Terahertz frequency domain spectrometer with phase modulation of source laser beam
US8604433B2 (en) 2008-05-19 2013-12-10 Emcore Corporation Terahertz frequency domain spectrometer with frequency shifting of source laser beam
US7876423B1 (en) 2008-06-27 2011-01-25 The United States Of America As Represented By The National Aeronautics And Space Administration Simultaneous noncontact precision imaging of microstructural and thickness variation in dielectric materials using terahertz energy
US7933027B1 (en) 2008-06-27 2011-04-26 The United States Of America As Represented By The Administrator Of National Aeronautics And Space Administration Processing waveform-based NDE
US20120041310A1 (en) * 2008-09-02 2012-02-16 Arizona Board Of Regents For And On Behalf Of Arizona State University Apparatus, System and Method for Ultrasound Powered Neurotelemetry
US8145064B2 (en) * 2008-09-19 2012-03-27 Goodrich Corporation System and method for suppressing noise by frequency dither
US8027590B2 (en) * 2008-09-19 2011-09-27 Goodrich Corporation System and method for signal extraction by path modulation
JP5173850B2 (ja) * 2009-01-05 2013-04-03 キヤノン株式会社 検査装置
US9700712B2 (en) 2009-01-26 2017-07-11 Arizona Board Of Regents, A Body Corporate Of The State Of Arizona Acting For And On Behalf Of Arizona State University Dipolar antenna system and related methods
US8508592B2 (en) * 2009-02-25 2013-08-13 The University Of Memphis Research Foundation Spatially-selective reflector structures, reflector disks, and systems and methods for use thereof
JP2011047797A (ja) * 2009-08-27 2011-03-10 Nippon Telegr & Teleph Corp <Ntt> 電波利用型画像生成装置
FR2950700B1 (fr) * 2009-09-29 2012-04-20 Univ Paris Sud Dispositif optoelectronique terahertz et procede pour generer ou detecter des ondes electromagnetiques terahertz
US8003947B1 (en) 2010-02-25 2011-08-23 Goodrich Corporation System and method for magnitude and phase retrieval by path modulation
US8296106B2 (en) * 2010-02-25 2012-10-23 Goodrich Corporation Apparatus, method and computer-readable storage medium for processing a signal in a spectrometer system
JP5610793B2 (ja) * 2010-03-02 2014-10-22 キヤノン株式会社 光伝導素子
JP2011202972A (ja) * 2010-03-24 2011-10-13 Fujitsu Ltd イメージング装置
US8144323B2 (en) * 2010-03-25 2012-03-27 Goodrich Corporation Apparatus, method and computer-readable storage medium for determining the ring-down time in a spectrometer system
US8299433B2 (en) * 2010-03-25 2012-10-30 Goodrich Corporation Multi-channel optical cell
US8780345B2 (en) 2011-04-22 2014-07-15 The University Of Memphis Research Foundation Spatially-selective disks, submillimeter imaging devices, methods of submillimeter imaging, profiling scanners, spectrometry devices, and methods of spectrometry
JP5765086B2 (ja) * 2011-06-24 2015-08-19 セイコーエプソン株式会社 テラヘルツ波発生装置、カメラ、イメージング装置および計測装置
US9400214B1 (en) 2013-03-15 2016-07-26 Joseph R. Demers Terahertz frequency domain spectrometer with a single photoconductive element for terahertz signal generation and detection
US9103715B1 (en) 2013-03-15 2015-08-11 Joseph R. Demers Terahertz spectrometer phase modulator control using second harmonic nulling
US9404853B1 (en) 2014-04-25 2016-08-02 Joseph R. Demers Terahertz spectrometer with phase modulation
US9086374B1 (en) 2014-04-25 2015-07-21 Joseph R. Demers Terahertz spectrometer with phase modulation and method
US9239264B1 (en) 2014-09-18 2016-01-19 Joseph R. Demers Transceiver method and apparatus having phase modulation and common mode phase drift rejection
US9429473B2 (en) 2014-10-16 2016-08-30 Joseph R. Demers Terahertz spectrometer and method for reducing photomixing interference pattern
JP6643799B2 (ja) * 2014-11-28 2020-02-12 キヤノン株式会社 センサ、及び、これを用いた情報取得装置
CN104457991B (zh) * 2014-12-10 2016-06-08 上海理工大学 通过太赫兹波检测气体里德伯态精细谱线的装置
KR101699273B1 (ko) * 2015-06-30 2017-01-24 한국표준과학연구원 테라헤르츠파를 이용한 실시간 비접촉 비파괴 두께 측정장치
FR3069333B1 (fr) * 2017-07-24 2021-05-14 Terahertz Waves Tech Systeme de capture de valeurs ponctuelles pour constituer une image avec des rayonnements terahertz
FR3077641B1 (fr) * 2018-02-07 2020-02-21 TiHive Systeme d'imagerie terahertz a reflexion
WO2019234842A1 (ja) * 2018-06-06 2019-12-12 株式会社日立ハイテクノロジーズ 分光測定装置、及び分光測定方法
US20220181840A1 (en) * 2019-03-26 2022-06-09 Terahertz Group Ltd. Devices for generation of electromagnetic radiation of predetermined profile
US10802066B1 (en) * 2019-12-17 2020-10-13 Quantum Valley Ideas Laboratories Single-pixel imaging of electromagnetic fields
JP7496111B2 (ja) * 2019-12-24 2024-06-06 国立大学法人東京工業大学 サブキャリア変調方式テラヘルツレーダー
GB202114195D0 (en) 2021-10-04 2021-11-17 Teraview Ltd Curvature correction
WO2024125778A1 (en) * 2022-12-14 2024-06-20 Robert Bosch Gmbh Apparatus and method for object image generation in the thz spectral range for identification of objects

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4533829A (en) * 1983-07-07 1985-08-06 The United States Of America As Represented By The Secretary Of The Air Force Optical electromagnetic radiation detector
WO1988001485A1 (en) * 1986-09-02 1988-03-10 Singer Jerome R Infrared radiation imaging system and method
US5360973A (en) * 1990-02-22 1994-11-01 Innova Laboratories, Inc. Millimeter wave beam deflector
US5293213A (en) 1992-08-12 1994-03-08 Klein Uwe K A Utilization of a modulated laser beam in heterodyne interferometry
US5450463A (en) * 1992-12-25 1995-09-12 Olympus Optical Co., Ltd. X-ray microscope
US5447159A (en) * 1993-02-03 1995-09-05 Massachusetts Institute Of Technology Optical imaging for specimens having dispersive properties
US5710430A (en) * 1995-02-15 1998-01-20 Lucent Technologies Inc. Method and apparatus for terahertz imaging
US5813987A (en) * 1995-08-01 1998-09-29 Medispectra, Inc. Spectral volume microprobe for analysis of materials
US5886534A (en) * 1995-10-27 1999-03-23 The University Of Chicago Millimeter wave sensor for on-line inspection of thin sheet dielectrics
US6026173A (en) * 1997-07-05 2000-02-15 Svenson; Robert H. Electromagnetic imaging and therapeutic (EMIT) systems
US5789750A (en) * 1996-09-09 1998-08-04 Lucent Technologies Inc. Optical system employing terahertz radiation
US5939721A (en) * 1996-11-06 1999-08-17 Lucent Technologies Inc. Systems and methods for processing and analyzing terahertz waveforms
US6078047A (en) 1997-03-14 2000-06-20 Lucent Technologies Inc. Method and apparatus for terahertz tomographic imaging
EP1155294A1 (de) * 1999-02-23 2001-11-21 Teraprobe Limited Vorrichtung und verfahren zur bildlichen darstellung im terahertzbereich

Also Published As

Publication number Publication date
JP2003525446A (ja) 2003-08-26
GB0004668D0 (en) 2000-04-19
AU2001235801A1 (en) 2001-09-12
EP1269156A1 (de) 2003-01-02
ATE442578T1 (de) 2009-09-15
US20030178584A1 (en) 2003-09-25
US7174037B2 (en) 2007-02-06
GB2359716A (en) 2001-08-29
WO2001065239A1 (en) 2001-09-07
EP1269156B1 (de) 2009-09-09
GB2359716B (en) 2002-06-12

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