ATE390627T1 - Verfahren und vorrichtung zur oberflächenplasmonenmikroskopie - Google Patents

Verfahren und vorrichtung zur oberflächenplasmonenmikroskopie

Info

Publication number
ATE390627T1
ATE390627T1 AT01940702T AT01940702T ATE390627T1 AT E390627 T1 ATE390627 T1 AT E390627T1 AT 01940702 T AT01940702 T AT 01940702T AT 01940702 T AT01940702 T AT 01940702T AT E390627 T1 ATE390627 T1 AT E390627T1
Authority
AT
Austria
Prior art keywords
radiation
surface waves
surface plasmon
analyzing
sample
Prior art date
Application number
AT01940702T
Other languages
English (en)
Inventor
Michael Somekh
Chung See
Original Assignee
Univ Nottingham
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Univ Nottingham filed Critical Univ Nottingham
Application granted granted Critical
Publication of ATE390627T1 publication Critical patent/ATE390627T1/de

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6456—Spatial resolved fluorescence measurements; Imaging
    • G01N21/6458—Fluorescence microscopy
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/648—Specially adapted constructive features of fluorimeters using evanescent coupling or surface plasmon coupling for the excitation of fluorescence
AT01940702T 2000-05-30 2001-05-30 Verfahren und vorrichtung zur oberflächenplasmonenmikroskopie ATE390627T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GBGB0013139.1A GB0013139D0 (en) 2000-05-30 2000-05-30 Improvements in and relating to microscopy

Publications (1)

Publication Number Publication Date
ATE390627T1 true ATE390627T1 (de) 2008-04-15

Family

ID=9892647

Family Applications (1)

Application Number Title Priority Date Filing Date
AT01940702T ATE390627T1 (de) 2000-05-30 2001-05-30 Verfahren und vorrichtung zur oberflächenplasmonenmikroskopie

Country Status (7)

Country Link
US (1) US7142308B2 (de)
EP (1) EP1287337B1 (de)
AT (1) ATE390627T1 (de)
AU (1) AU2001274206A1 (de)
DE (1) DE60133383T2 (de)
GB (1) GB0013139D0 (de)
WO (1) WO2001092858A1 (de)

Families Citing this family (30)

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US7557929B2 (en) 2001-12-18 2009-07-07 Massachusetts Institute Of Technology Systems and methods for phase measurements
US7365858B2 (en) * 2001-12-18 2008-04-29 Massachusetts Institute Of Technology Systems and methods for phase measurements
US7508608B2 (en) 2004-11-17 2009-03-24 Illumina, Inc. Lithographically fabricated holographic optical identification element
US7923260B2 (en) 2002-08-20 2011-04-12 Illumina, Inc. Method of reading encoded particles
US7164533B2 (en) 2003-01-22 2007-01-16 Cyvera Corporation Hybrid random bead/chip based microarray
US7901630B2 (en) 2002-08-20 2011-03-08 Illumina, Inc. Diffraction grating-based encoded microparticle assay stick
US7872804B2 (en) 2002-08-20 2011-01-18 Illumina, Inc. Encoded particle having a grating with variations in the refractive index
US7900836B2 (en) 2002-08-20 2011-03-08 Illumina, Inc. Optical reader system for substrates having an optically readable code
US7092160B2 (en) 2002-09-12 2006-08-15 Illumina, Inc. Method of manufacturing of diffraction grating-based optical identification element
US20100255603A9 (en) * 2002-09-12 2010-10-07 Putnam Martin A Method and apparatus for aligning microbeads in order to interrogate the same
US7433123B2 (en) * 2004-02-19 2008-10-07 Illumina, Inc. Optical identification element having non-waveguide photosensitive substrate with diffraction grating therein
WO2006020363A2 (en) 2004-07-21 2006-02-23 Illumina, Inc. Method and apparatus for drug product tracking using encoded optical identification elements
WO2006055735A2 (en) * 2004-11-16 2006-05-26 Illumina, Inc Scanner having spatial light modulator
EP2194485B1 (de) 2004-11-16 2012-10-17 Illumina, Inc. Verfahren und Vorrichtung zum Auslesen kodierter Mikroperlen
US7333205B2 (en) * 2005-03-31 2008-02-19 U Chicago Argonne Llc Broadband surface plasmon jets: direct observation of plasmon propagation for application to sensors and optical communications in microscale and nanoscale circuitry
US7830575B2 (en) 2006-04-10 2010-11-09 Illumina, Inc. Optical scanner with improved scan time
WO2009120643A2 (en) * 2008-03-22 2009-10-01 Lyle Shirley Dimensional probe and methods of use
US8736847B2 (en) 2010-07-24 2014-05-27 Focused Innovation, Inc. Method and apparatus for imaging
US8265375B2 (en) 2006-06-16 2012-09-11 Shirley Lyle G Method and apparatus for remote sensing of objects utilizing radiation speckle
FR2924805B1 (fr) * 2007-12-11 2011-05-06 Ecole Norm Superieure Lyon Microscope a plasmon de surface a haute resolution avec interferometre heterodyne en polarisation radiale.
EP2101168A1 (de) * 2008-03-12 2009-09-16 Ecole Normale Superieure De Lyon Verbesserte nicht lineare Mikroskopie mit Oberflächen-Plasmonresonanz
US8662962B2 (en) * 2008-06-30 2014-03-04 3M Innovative Properties Company Sandpaper with non-slip coating layer and method of using
FR2942049B1 (fr) * 2009-02-12 2011-04-01 Ecole Norm Superieure Lyon Microscope de plasmon de surface a haute resolution comportant un interferometre heterodyne fibre
WO2010111649A1 (en) * 2009-03-26 2010-09-30 Guy Kennedy Low numerical aperture exclusion imaging
KR101245544B1 (ko) * 2010-11-29 2013-03-21 한국전기연구원 표면 플라즈몬 현상에 의한 광간섭 변화 특성을 이용한 바이오 센싱 장치
CN103842799B (zh) * 2011-09-30 2017-09-08 通用电气公司 用于样本阵列的自参考检测与成像的系统和方法
GB201216645D0 (en) 2012-09-18 2012-10-31 Univ Nottingham Surface plasmon microscopy
JP6188521B2 (ja) * 2013-10-02 2017-08-30 株式会社日立エルジーデータストレージ 光計測装置
ES2903348T3 (es) * 2016-04-26 2022-04-01 Atten2 Advanced Monitoring Tech S L Sistema de monitorización de fluido
EP3538941A4 (de) 2016-11-10 2020-06-17 The Trustees of Columbia University in the City of New York Schnelles hochauflösendes bildgebungsverfahren für grosse proben

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3909144A1 (de) * 1989-03-21 1990-09-27 Basf Ag Verfahren zur bestimmung von brechungsindex und schichtdicke duenner schichten
DE3914631A1 (de) * 1989-05-03 1990-11-08 Basf Ag Verfahren zur untersuchung der physikalischen eigenschaften duenner schichten
DE4310025A1 (de) * 1993-03-27 1994-09-29 Boehringer Mannheim Gmbh Vorrichtung zur lateral aufgelösten Untersuchung einer lateral heterogenen ultradünnen Objektschicht
JP2000055805A (ja) 1998-06-01 2000-02-25 Toto Ltd センサ装置
US6594011B1 (en) * 2000-07-11 2003-07-15 Maven Technologies, Llc Imaging apparatus and method

Also Published As

Publication number Publication date
DE60133383T2 (de) 2009-04-02
US7142308B2 (en) 2006-11-28
EP1287337A1 (de) 2003-03-05
EP1287337B1 (de) 2008-03-26
US20040100636A1 (en) 2004-05-27
GB0013139D0 (en) 2000-07-19
AU2001274206A1 (en) 2001-12-11
WO2001092858A1 (en) 2001-12-06
DE60133383D1 (de) 2008-05-08

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