FR2924805B1 - Microscope a plasmon de surface a haute resolution avec interferometre heterodyne en polarisation radiale. - Google Patents

Microscope a plasmon de surface a haute resolution avec interferometre heterodyne en polarisation radiale.

Info

Publication number
FR2924805B1
FR2924805B1 FR0759716A FR0759716A FR2924805B1 FR 2924805 B1 FR2924805 B1 FR 2924805B1 FR 0759716 A FR0759716 A FR 0759716A FR 0759716 A FR0759716 A FR 0759716A FR 2924805 B1 FR2924805 B1 FR 2924805B1
Authority
FR
France
Prior art keywords
high resolution
surface plasmon
radial polarization
heterodyne interferometer
resolution surface
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR0759716A
Other languages
English (en)
Other versions
FR2924805A1 (fr
Inventor
Lotfi Berguiga
Francoise Argoul
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Centre National de la Recherche Scientifique CNRS
Ecole Normale Superieure de Lyon
Ecole Normale Superierure de Lyon
Original Assignee
Centre National de la Recherche Scientifique CNRS
Ecole Normale Superieure de Lyon
Ecole Normale Superierure de Lyon
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Centre National de la Recherche Scientifique CNRS, Ecole Normale Superieure de Lyon, Ecole Normale Superierure de Lyon filed Critical Centre National de la Recherche Scientifique CNRS
Priority to FR0759716A priority Critical patent/FR2924805B1/fr
Priority to EP08865044A priority patent/EP2220480A2/fr
Priority to US12/747,266 priority patent/US8610897B2/en
Priority to PCT/FR2008/052279 priority patent/WO2009080998A2/fr
Publication of FR2924805A1 publication Critical patent/FR2924805A1/fr
Application granted granted Critical
Publication of FR2924805B1 publication Critical patent/FR2924805B1/fr
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection
    • G01N21/553—Attenuated total reflection and using surface plasmons
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/04—Measuring microscopes
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/067—Electro-optic, magneto-optic, acousto-optic elements

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
FR0759716A 2007-12-11 2007-12-11 Microscope a plasmon de surface a haute resolution avec interferometre heterodyne en polarisation radiale. Expired - Fee Related FR2924805B1 (fr)

Priority Applications (4)

Application Number Priority Date Filing Date Title
FR0759716A FR2924805B1 (fr) 2007-12-11 2007-12-11 Microscope a plasmon de surface a haute resolution avec interferometre heterodyne en polarisation radiale.
EP08865044A EP2220480A2 (fr) 2007-12-11 2008-12-11 Microscope a plasmon de surface a haute resolution avec interferometre heterodyne en polarisation radiale
US12/747,266 US8610897B2 (en) 2007-12-11 2008-12-11 High-resolution surface plasmon microscope with heterodyne interferometry in radial polarization mode
PCT/FR2008/052279 WO2009080998A2 (fr) 2007-12-11 2008-12-11 Microscope a plasmon de surface a haute resolution avec interferometre heterodyne en polarisation radiale

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR0759716A FR2924805B1 (fr) 2007-12-11 2007-12-11 Microscope a plasmon de surface a haute resolution avec interferometre heterodyne en polarisation radiale.

Publications (2)

Publication Number Publication Date
FR2924805A1 FR2924805A1 (fr) 2009-06-12
FR2924805B1 true FR2924805B1 (fr) 2011-05-06

Family

ID=39226775

Family Applications (1)

Application Number Title Priority Date Filing Date
FR0759716A Expired - Fee Related FR2924805B1 (fr) 2007-12-11 2007-12-11 Microscope a plasmon de surface a haute resolution avec interferometre heterodyne en polarisation radiale.

Country Status (4)

Country Link
US (1) US8610897B2 (fr)
EP (1) EP2220480A2 (fr)
FR (1) FR2924805B1 (fr)
WO (1) WO2009080998A2 (fr)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2924805B1 (fr) 2007-12-11 2011-05-06 Ecole Norm Superieure Lyon Microscope a plasmon de surface a haute resolution avec interferometre heterodyne en polarisation radiale.
WO2010088418A1 (fr) * 2009-01-29 2010-08-05 The Regents Of The University Of California Microscopie de haute résolution à éclairage structuré
EP2635896A1 (fr) 2010-11-03 2013-09-11 Reametrix Inc. Procédé et dispositif de mesure de fluorescence d'échantillons
CN102243174B (zh) * 2011-04-14 2013-05-22 中国科学院半导体研究所 基于相位检测的表面等离子体共振传感装置
DE102012010207B4 (de) * 2012-05-15 2024-02-29 Carl Zeiss Microscopy Gmbh Mikroskop und Mikroskopieverfahren
GB201216645D0 (en) * 2012-09-18 2012-10-31 Univ Nottingham Surface plasmon microscopy
US20150168300A1 (en) * 2014-01-28 2015-06-18 National Institute Of Standards And Technology Article and process for modifying light
CN107014803B (zh) * 2017-06-06 2019-09-27 中国计量大学 一种拉曼光谱检测装置
CN107329245B (zh) * 2017-07-06 2023-05-05 中国科学院西安光学精密机械研究所 基于径向偏振调制的干涉式结构光照明显微镜系统与方法
TWI637162B (zh) * 2017-08-01 2018-10-01 陳敬恒 Radial polarized light surface plasma excitation device
FR3090099B1 (fr) 2018-12-18 2022-04-22 Univ De Technologie De Troyes Dispositif laser pour interferometrie a polarisation
CN112649368B (zh) * 2020-12-25 2022-05-13 厦门大学 基于物镜耦合型的表面等离子体耦合发射定向增强型显微荧光成像与光谱检测方法及装置
KR102650211B1 (ko) * 2021-12-27 2024-03-21 재단법인 구미전자정보기술원 단일 광원을 이용한 표면 형상 정보 획득 장치

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5028136A (en) * 1987-01-23 1991-07-02 Iit Research Institute Rugate optical filter systems
GB2248497B (en) * 1990-09-26 1994-05-25 Marconi Gec Ltd An optical sensor
US5623339A (en) * 1995-08-04 1997-04-22 International Business Machines Corporation Interferometric measuring method based on multi-pole sensing
IL131903A0 (en) * 1999-09-15 2001-03-19 Technion Res & Dev Foundation Plasmon resonance phase imaging
GB0013139D0 (en) * 2000-05-30 2000-07-19 Univ Nottingham Improvements in and relating to microscopy
JP2003083886A (ja) 2001-09-13 2003-03-19 Kubota Corp 表面プラズモン顕微鏡及び表面プラズモン顕微鏡における暗環像情報取得方法
US7545503B2 (en) * 2005-09-27 2009-06-09 Verity Instruments, Inc. Self referencing heterodyne reflectometer and method for implementing
FR2924805B1 (fr) * 2007-12-11 2011-05-06 Ecole Norm Superieure Lyon Microscope a plasmon de surface a haute resolution avec interferometre heterodyne en polarisation radiale.

Also Published As

Publication number Publication date
EP2220480A2 (fr) 2010-08-25
WO2009080998A3 (fr) 2009-08-20
FR2924805A1 (fr) 2009-06-12
WO2009080998A2 (fr) 2009-07-02
US8610897B2 (en) 2013-12-17
US20100328674A1 (en) 2010-12-30

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Legal Events

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TQ Partial transmission of property
PLFP Fee payment

Year of fee payment: 9

ST Notification of lapse

Effective date: 20170831