GB2436744B - Terahertz imaging system - Google Patents
Terahertz imaging systemInfo
- Publication number
- GB2436744B GB2436744B GB0707081A GB0707081A GB2436744B GB 2436744 B GB2436744 B GB 2436744B GB 0707081 A GB0707081 A GB 0707081A GB 0707081 A GB0707081 A GB 0707081A GB 2436744 B GB2436744 B GB 2436744B
- Authority
- GB
- United Kingdom
- Prior art keywords
- imaging system
- terahertz imaging
- terahertz
- imaging
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000003384 imaging method Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
- G01N21/474—Details of optical heads therefor, e.g. using optical fibres
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N2021/4704—Angular selective
- G01N2021/4709—Backscatter
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
- G01N21/474—Details of optical heads therefor, e.g. using optical fibres
- G01N2021/4742—Details of optical heads therefor, e.g. using optical fibres comprising optical fibres
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3563—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing solids; Preparation of samples therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/02—Mechanical
- G01N2201/022—Casings
- G01N2201/0221—Portable; cableless; compact; hand-held
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Toxicology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB0707081A GB2436744B (en) | 2004-02-13 | 2004-02-13 | Terahertz imaging system |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB0403272A GB2411093B (en) | 2004-02-13 | 2004-02-13 | Terahertz imaging system |
GB0707081A GB2436744B (en) | 2004-02-13 | 2004-02-13 | Terahertz imaging system |
Publications (3)
Publication Number | Publication Date |
---|---|
GB0707081D0 GB0707081D0 (en) | 2007-05-23 |
GB2436744A GB2436744A (en) | 2007-10-03 |
GB2436744B true GB2436744B (en) | 2008-09-10 |
Family
ID=38116619
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB0707081A Expired - Fee Related GB2436744B (en) | 2004-02-13 | 2004-02-13 | Terahertz imaging system |
Country Status (1)
Country | Link |
---|---|
GB (1) | GB2436744B (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2013190350A (en) * | 2012-03-14 | 2013-09-26 | Canon Inc | Apparatus using electromagnetic wave of terahertz wave band |
CN104280396A (en) * | 2014-09-29 | 2015-01-14 | 苏州赛森电子科技有限公司 | Sapphire substrate detection and recognition device suitable for LED production |
Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2138235A (en) * | 1983-04-05 | 1984-10-17 | Philips Nv | Computed tomography apparatus |
US4654749A (en) * | 1985-07-30 | 1987-03-31 | Murata Manufacturing Co., Ltd. | High-voltage ceramic capacitor and method of producing the same |
US4769827A (en) * | 1985-02-27 | 1988-09-06 | Yokogawa Medical Systems, Limited | CAT scanner |
US5251128A (en) * | 1990-11-19 | 1993-10-05 | General Electric Company | Motion artifact reduction in projection imaging |
US5461476A (en) * | 1992-11-30 | 1995-10-24 | Her Majesty The Queen In Right Of Canada, As Represented By The Minister Of National Defence | Optical apparatus for receiving scattered light |
WO2000075641A1 (en) * | 1999-06-04 | 2000-12-14 | Teraview Limited | Three dimensional imaging |
JP2003075251A (en) * | 2001-09-06 | 2003-03-12 | Communication Research Laboratory | Detection method and apparatus of terahertz light or the like, and terahertz light apparatus and imaging apparatus using the same |
WO2003042670A1 (en) * | 2001-11-13 | 2003-05-22 | Rensselaer Polytechnic Institute | Method and system for performing three-dimensional teraherz imaging on an object |
US20030178584A1 (en) * | 2000-02-28 | 2003-09-25 | Arnone Donald Dominic | Imaging apparatus and method |
-
2004
- 2004-02-13 GB GB0707081A patent/GB2436744B/en not_active Expired - Fee Related
Patent Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2138235A (en) * | 1983-04-05 | 1984-10-17 | Philips Nv | Computed tomography apparatus |
US4769827A (en) * | 1985-02-27 | 1988-09-06 | Yokogawa Medical Systems, Limited | CAT scanner |
US4654749A (en) * | 1985-07-30 | 1987-03-31 | Murata Manufacturing Co., Ltd. | High-voltage ceramic capacitor and method of producing the same |
US5251128A (en) * | 1990-11-19 | 1993-10-05 | General Electric Company | Motion artifact reduction in projection imaging |
US5461476A (en) * | 1992-11-30 | 1995-10-24 | Her Majesty The Queen In Right Of Canada, As Represented By The Minister Of National Defence | Optical apparatus for receiving scattered light |
WO2000075641A1 (en) * | 1999-06-04 | 2000-12-14 | Teraview Limited | Three dimensional imaging |
US20030178584A1 (en) * | 2000-02-28 | 2003-09-25 | Arnone Donald Dominic | Imaging apparatus and method |
JP2003075251A (en) * | 2001-09-06 | 2003-03-12 | Communication Research Laboratory | Detection method and apparatus of terahertz light or the like, and terahertz light apparatus and imaging apparatus using the same |
WO2003042670A1 (en) * | 2001-11-13 | 2003-05-22 | Rensselaer Polytechnic Institute | Method and system for performing three-dimensional teraherz imaging on an object |
Also Published As
Publication number | Publication date |
---|---|
GB0707081D0 (en) | 2007-05-23 |
GB2436744A (en) | 2007-10-03 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
732E | Amendments to the register in respect of changes of name or changes affecting rights (sect. 32/1977) | ||
PCNP | Patent ceased through non-payment of renewal fee |
Effective date: 20200213 |