DE60125025D1 - System für simultanprojektionen von mehrfach phasenverschobenen mustern für die dreidimensionale inspektion eines objektes - Google Patents

System für simultanprojektionen von mehrfach phasenverschobenen mustern für die dreidimensionale inspektion eines objektes

Info

Publication number
DE60125025D1
DE60125025D1 DE60125025T DE60125025T DE60125025D1 DE 60125025 D1 DE60125025 D1 DE 60125025D1 DE 60125025 T DE60125025 T DE 60125025T DE 60125025 T DE60125025 T DE 60125025T DE 60125025 D1 DE60125025 D1 DE 60125025D1
Authority
DE
Germany
Prior art keywords
shifted patterns
phase
simultaneous
patterns
multiple phase
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE60125025T
Other languages
English (en)
Other versions
DE60125025T2 (de
Inventor
Alain Coulombe
Michel Cantin
Alexandre Nikitine
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Solvision Inc
Original Assignee
Solvision Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Solvision Inc filed Critical Solvision Inc
Application granted granted Critical
Publication of DE60125025D1 publication Critical patent/DE60125025D1/de
Publication of DE60125025T2 publication Critical patent/DE60125025T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2509—Color coding
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518—Projection by scanning of the object
    • G01B11/2527—Projection by scanning of the object with phase change by in-plane movement of the patern
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/10—Image acquisition
    • G06V10/12—Details of acquisition arrangements; Constructional details thereof
    • G06V10/14—Optical characteristics of the device performing the acquisition or on the illumination arrangements
    • G06V10/145—Illumination specially adapted for pattern recognition, e.g. using gratings
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V2201/00—Indexing scheme relating to image or video recognition or understanding
    • G06V2201/06—Recognition of objects for industrial automation

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Artificial Intelligence (AREA)
  • Multimedia (AREA)
  • Theoretical Computer Science (AREA)
  • Length Measuring Devices By Optical Means (AREA)
DE60125025T 2000-03-24 2001-03-20 System für simultanprojektionen von mehrfach phasenverschobenen mustern für die dreidimensionale inspektion eines objektes Expired - Fee Related DE60125025T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
CA002301822A CA2301822A1 (fr) 2000-03-24 2000-03-24 Projection simultanee de plusieurs patrons avec acquisition simultanee pour l'inspection d'objets en trois dimensions
CA2301822 2000-03-24
PCT/CA2001/000376 WO2001071279A1 (en) 2000-03-24 2001-03-20 System for simultaneous projections of multiple phase-shifted patterns for the three-dimensional inspection of an object

Publications (2)

Publication Number Publication Date
DE60125025D1 true DE60125025D1 (de) 2007-01-18
DE60125025T2 DE60125025T2 (de) 2007-07-05

Family

ID=4165604

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60125025T Expired - Fee Related DE60125025T2 (de) 2000-03-24 2001-03-20 System für simultanprojektionen von mehrfach phasenverschobenen mustern für die dreidimensionale inspektion eines objektes

Country Status (12)

Country Link
US (2) US7079666B2 (de)
EP (1) EP1266187B1 (de)
JP (1) JP2003528303A (de)
KR (1) KR100815283B1 (de)
CN (1) CN1185464C (de)
AT (1) ATE347682T1 (de)
AU (1) AU2001242179A1 (de)
CA (1) CA2301822A1 (de)
DE (1) DE60125025T2 (de)
IL (1) IL151528A0 (de)
TW (1) TW571072B (de)
WO (1) WO2001071279A1 (de)

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CN112113511B (zh) * 2020-08-17 2021-11-23 上海交通大学 一种半透明物体表面轮廓线提取方法、系统及终端
CN112666698B (zh) * 2021-01-27 2022-11-22 之江实验室 一种基于色散超表面的光纤束多方位三维共聚焦成像装置及方法
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Also Published As

Publication number Publication date
US20070146727A1 (en) 2007-06-28
DE60125025T2 (de) 2007-07-05
CA2301822A1 (fr) 2001-09-24
ATE347682T1 (de) 2006-12-15
JP2003528303A (ja) 2003-09-24
US20020018118A1 (en) 2002-02-14
US7403650B2 (en) 2008-07-22
US7079666B2 (en) 2006-07-18
EP1266187A1 (de) 2002-12-18
CN1419647A (zh) 2003-05-21
IL151528A0 (en) 2003-04-10
KR20030009403A (ko) 2003-01-29
TW571072B (en) 2004-01-11
KR100815283B1 (ko) 2008-03-19
AU2001242179A1 (en) 2001-10-03
WO2001071279A1 (en) 2001-09-27
EP1266187B1 (de) 2006-12-06
CN1185464C (zh) 2005-01-19

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