IL151528A0 - System for simultaneous projections of multiple phase-shifted patterns for the three-dimensional inspection of an object - Google Patents

System for simultaneous projections of multiple phase-shifted patterns for the three-dimensional inspection of an object

Info

Publication number
IL151528A0
IL151528A0 IL15152801A IL15152801A IL151528A0 IL 151528 A0 IL151528 A0 IL 151528A0 IL 15152801 A IL15152801 A IL 15152801A IL 15152801 A IL15152801 A IL 15152801A IL 151528 A0 IL151528 A0 IL 151528A0
Authority
IL
Israel
Prior art keywords
shifted patterns
phase
simultaneous
patterns
multiple phase
Prior art date
Application number
IL15152801A
Other languages
English (en)
Original Assignee
Solvision Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Solvision Inc filed Critical Solvision Inc
Publication of IL151528A0 publication Critical patent/IL151528A0/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2509—Color coding
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518—Projection by scanning of the object
    • G01B11/2527—Projection by scanning of the object with phase change by in-plane movement of the patern
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/10—Image acquisition
    • G06V10/12—Details of acquisition arrangements; Constructional details thereof
    • G06V10/14—Optical characteristics of the device performing the acquisition or on the illumination arrangements
    • G06V10/145—Illumination specially adapted for pattern recognition, e.g. using gratings
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V2201/00—Indexing scheme relating to image or video recognition or understanding
    • G06V2201/06—Recognition of objects for industrial automation

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Artificial Intelligence (AREA)
  • Multimedia (AREA)
  • Theoretical Computer Science (AREA)
  • Length Measuring Devices By Optical Means (AREA)
IL15152801A 2000-03-24 2001-03-20 System for simultaneous projections of multiple phase-shifted patterns for the three-dimensional inspection of an object IL151528A0 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CA002301822A CA2301822A1 (fr) 2000-03-24 2000-03-24 Projection simultanee de plusieurs patrons avec acquisition simultanee pour l'inspection d'objets en trois dimensions
PCT/CA2001/000376 WO2001071279A1 (en) 2000-03-24 2001-03-20 System for simultaneous projections of multiple phase-shifted patterns for the three-dimensional inspection of an object

Publications (1)

Publication Number Publication Date
IL151528A0 true IL151528A0 (en) 2003-04-10

Family

ID=4165604

Family Applications (1)

Application Number Title Priority Date Filing Date
IL15152801A IL151528A0 (en) 2000-03-24 2001-03-20 System for simultaneous projections of multiple phase-shifted patterns for the three-dimensional inspection of an object

Country Status (12)

Country Link
US (2) US7079666B2 (xx)
EP (1) EP1266187B1 (xx)
JP (1) JP2003528303A (xx)
KR (1) KR100815283B1 (xx)
CN (1) CN1185464C (xx)
AT (1) ATE347682T1 (xx)
AU (1) AU2001242179A1 (xx)
CA (1) CA2301822A1 (xx)
DE (1) DE60125025T2 (xx)
IL (1) IL151528A0 (xx)
TW (1) TW571072B (xx)
WO (1) WO2001071279A1 (xx)

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CN105043300A (zh) * 2015-05-27 2015-11-11 东莞市盟拓光电科技有限公司 可从多方位对被测物同时投影的三维测量系统
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CN105806253B (zh) * 2016-04-18 2018-10-09 国家电网公司 一种定日镜面形的检测方法
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CN110192079A (zh) * 2017-01-20 2019-08-30 英泰克普拉斯有限公司 三维形状测量装置和测量方法
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TWI639829B (zh) * 2017-06-21 2018-11-01 致茂電子股份有限公司 太陽能電池的檢測方法與檢測系統
CN112930468B (zh) * 2018-11-08 2022-11-18 成都频泰鼎丰企业管理中心（有限合伙） 三维测量设备
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Also Published As

Publication number Publication date
DE60125025T2 (de) 2007-07-05
KR100815283B1 (ko) 2008-03-19
EP1266187B1 (en) 2006-12-06
US20020018118A1 (en) 2002-02-14
CN1419647A (zh) 2003-05-21
TW571072B (en) 2004-01-11
WO2001071279A1 (en) 2001-09-27
US7403650B2 (en) 2008-07-22
CA2301822A1 (fr) 2001-09-24
KR20030009403A (ko) 2003-01-29
DE60125025D1 (de) 2007-01-18
US7079666B2 (en) 2006-07-18
CN1185464C (zh) 2005-01-19
AU2001242179A1 (en) 2001-10-03
EP1266187A1 (en) 2002-12-18
US20070146727A1 (en) 2007-06-28
JP2003528303A (ja) 2003-09-24
ATE347682T1 (de) 2006-12-15

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