ATE221650T1 - Optisches verfahren und vorrichtung zum erkennen von fehlstellen - Google Patents

Optisches verfahren und vorrichtung zum erkennen von fehlstellen

Info

Publication number
ATE221650T1
ATE221650T1 AT97308168T AT97308168T ATE221650T1 AT E221650 T1 ATE221650 T1 AT E221650T1 AT 97308168 T AT97308168 T AT 97308168T AT 97308168 T AT97308168 T AT 97308168T AT E221650 T1 ATE221650 T1 AT E221650T1
Authority
AT
Austria
Prior art keywords
optical object
point
shadow pattern
optical
image
Prior art date
Application number
AT97308168T
Other languages
English (en)
Inventor
Peter Vokhmin
Original Assignee
Prolaser Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Prolaser Ltd filed Critical Prolaser Ltd
Application granted granted Critical
Publication of ATE221650T1 publication Critical patent/ATE221650T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
AT97308168T 1996-12-17 1997-10-15 Optisches verfahren und vorrichtung zum erkennen von fehlstellen ATE221650T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IL11985096A IL119850A (en) 1996-12-17 1996-12-17 Optical method and apparatus for detecting low frequency defects

Publications (1)

Publication Number Publication Date
ATE221650T1 true ATE221650T1 (de) 2002-08-15

Family

ID=11069591

Family Applications (1)

Application Number Title Priority Date Filing Date
AT97308168T ATE221650T1 (de) 1996-12-17 1997-10-15 Optisches verfahren und vorrichtung zum erkennen von fehlstellen

Country Status (6)

Country Link
US (1) US6075591A (de)
EP (1) EP0856728B1 (de)
AT (1) ATE221650T1 (de)
DE (1) DE69714401T2 (de)
ES (1) ES2180901T3 (de)
IL (1) IL119850A (de)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2807522B1 (fr) * 2000-04-07 2002-06-14 Aerospatiale Matra Airbus Dispositif pour determiner les valeurs d'au moins un parametre de particules, notamment de gouttelettes d'eau
US6671039B2 (en) * 2000-06-22 2003-12-30 Hoya Corporation Spectacle lens image sensing processing apparatus and spectacle lens positioning method
US6661506B2 (en) * 2000-08-24 2003-12-09 Og Technologies, Inc. Engine bearing inspection system
US7023542B2 (en) * 2002-04-03 2006-04-04 3M Innovative Properties Company Imaging method and apparatus
US7142295B2 (en) * 2003-03-05 2006-11-28 Corning Incorporated Inspection of transparent substrates for defects
GB0307345D0 (en) * 2003-03-29 2003-05-07 Pilkington Plc Glazing inspection
US7295330B2 (en) * 2003-07-11 2007-11-13 Chow Peter P Film mapping system
WO2005096074A1 (ja) 2004-03-31 2005-10-13 Kabushiki Kaisha Topcon 治具装着装置
EP1605241A1 (de) 2004-06-09 2005-12-14 Automation & Robotics Apparat zur optischen Kontrolle von transparenten oder reflektierenden Proben
US20090174554A1 (en) 2005-05-11 2009-07-09 Eric Bergeron Method and system for screening luggage items, cargo containers or persons
US7991242B2 (en) 2005-05-11 2011-08-02 Optosecurity Inc. Apparatus, method and system for screening receptacles and persons, having image distortion correction functionality
US7899232B2 (en) 2006-05-11 2011-03-01 Optosecurity Inc. Method and apparatus for providing threat image projection (TIP) in a luggage screening system, and luggage screening system implementing same
US8494210B2 (en) 2007-03-30 2013-07-23 Optosecurity Inc. User interface for use in security screening providing image enhancement capabilities and apparatus for implementing same
DE102006051538B4 (de) * 2006-10-27 2009-04-09 Schott Ag Verfahren und Vorrichtung zur Bestimmung der Waviness von Glasscheiben
JP4970149B2 (ja) * 2007-05-31 2012-07-04 株式会社ニデック カップ取付け装置
US20110193954A1 (en) * 2010-02-08 2011-08-11 Sunrise Optical Llc Apparatus for the measurement of the topography and photoelectric properties of transparent surfaces
JP2012243805A (ja) * 2011-05-16 2012-12-10 Toshiba Corp パターン形成方法
DE102011078833A1 (de) * 2011-07-07 2013-01-10 3D-Micromac Ag Verfahren und Vorrichtung zum Detektieren einer Markierung an einem Objekt
AU2012304490B2 (en) 2011-09-07 2015-06-25 Rapiscan Systems, Inc. X-ray inspection system that integrates manifest data with imaging/detection processing
DE102011119806B4 (de) * 2011-11-25 2020-10-15 Carl Zeiss Vision International Gmbh Verfahren und Vorrichtung zum Sichtbarmachen eines Signierzeichens auf einem Brillenglas
FR3017963B1 (fr) 2014-02-27 2016-03-25 Essilor Int Instrument optique pour identifier et localiser des microgravures presentes sur une lentille ophtalmique
FR3017964B1 (fr) 2014-02-27 2016-03-25 Essilor Int Instrument optique pour reperer au moins un point caracteristique d'une lentille ophtalmique
DE102015115735B3 (de) * 2015-09-17 2017-03-23 Carl Zeiss Vision International Gmbh Vorrichtung und Verfahren zum Sichtbarmachen eines Signierzeichens auf einem Brillenglas
CN108603847A (zh) * 2016-02-05 2018-09-28 东丽株式会社 片状物的检查装置及片状物的检查方法
US10302807B2 (en) 2016-02-22 2019-05-28 Rapiscan Systems, Inc. Systems and methods for detecting threats and contraband in cargo

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3743431A (en) * 1972-05-09 1973-07-03 Philco Ford Corp Radiation sensitive means for detecting flaws in glass
GB1403911A (en) * 1972-07-26 1975-08-28 Sira Institute Method and apparatus for testing optical components
IL63264A (en) * 1980-11-04 1986-07-31 Israel Atomic Energy Comm Topographical mapping system and method
US4547073A (en) * 1981-02-17 1985-10-15 Matsushita Electric Industrial Co., Ltd. Surface examining apparatus and method
DE3237511A1 (de) * 1982-10-09 1984-04-12 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V., 8000 München Verfahren zur pruefung von glaserzeugnissen
DE3406066A1 (de) * 1984-02-20 1985-08-22 Siemens AG, 1000 Berlin und 8000 München Anordnung zur optischen erfassung raeumlicher unebenheiten in der struktur eines zu untersuchenden objekts
US4810895A (en) * 1987-01-13 1989-03-07 Rotlex Optics Ltd. Method and apparatus for optical examination of an object particularly by moire ray deflection mapping
DE3816392A1 (de) * 1988-05-13 1989-11-23 Ver Glaswerke Gmbh Verfahren zur bestimmung der optischen qualitaet von flachglas oder flachglasprodukten
DE3838954A1 (de) * 1988-11-17 1990-05-23 Siemens Ag Optikanordnung zur dreidimensionalen formerfassung
DE3926349A1 (de) * 1989-08-09 1991-02-14 Sick Optik Elektronik Erwin Optische fehlerinspektionsvorrichtung
US5309222A (en) * 1991-07-16 1994-05-03 Mitsubishi Denki Kabushiki Kaisha Surface undulation inspection apparatus

Also Published As

Publication number Publication date
DE69714401D1 (de) 2002-09-05
EP0856728A3 (de) 1998-09-09
US6075591A (en) 2000-06-13
IL119850A0 (en) 1997-03-18
DE69714401T2 (de) 2003-09-18
IL119850A (en) 2000-11-21
ES2180901T3 (es) 2003-02-16
EP0856728A2 (de) 1998-08-05
EP0856728B1 (de) 2002-07-31

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Legal Events

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UEP Publication of translation of european patent specification
REN Ceased due to non-payment of the annual fee