ES2180901T3 - Procedimiento para la inspeccion de un objeto optico y un aparato para la inspeccion de dicho objeto optico. - Google Patents
Procedimiento para la inspeccion de un objeto optico y un aparato para la inspeccion de dicho objeto optico.Info
- Publication number
- ES2180901T3 ES2180901T3 ES97308168T ES97308168T ES2180901T3 ES 2180901 T3 ES2180901 T3 ES 2180901T3 ES 97308168 T ES97308168 T ES 97308168T ES 97308168 T ES97308168 T ES 97308168T ES 2180901 T3 ES2180901 T3 ES 2180901T3
- Authority
- ES
- Spain
- Prior art keywords
- optical object
- inspection
- optical
- point
- shadow pattern
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
Abstract
LA INSPECCION DE UN OBJETO OPTICO PARA COMPROBAR LA EXISTENCIA DE INHOMOGENEIDADES CONSISTE EN DIRIGIR UN RAYO DIVERGENTE DE RADIACION DE INSPECCION AL OBJETO OPTICO, DE FORMA QUE ILUMINE CADA UNO DE SUS PUNTOS EN UN ANGULO UNICO; EN PROYECTAR EL RAYO A TRAVES DEL OBJETO OPTICO EN UNA PANTALLA DE PROYECCION Y OBTENER ASI UN DIBUJO DE SU SOMBRA, EN EL QUE SE PUEDEN DISTINGUIR LAS INHOMOGENEIDADES OPTICAS DEBIDO A LA DIFERENCIA DE BRILLO EN LAS AREAS CORRESPONDIENTES AL OBJETO SOBRE EL BRILLO DE FONDO DEL DIBUJO; EN REPRESENTAR POR IMAGEN EL DIBUJO DE LA SOMBRA A TRAVES DEL OBJETO OPTICO DE TAL FORMA QUE LOS RAYOS QUE FORMAN LA IMAGEN PASAN POR CADA PUNTO DEL OBJETO OPTICO A UN ANGULO QUE CORRESPONDE AL ANGULO EN EL QUE SE HA ILUMINADO EL PUNTO; Y EN DETECTAR Y ANALIZAR LA IMAGEN DEL DIBUJO DE LA SOMBRA.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
IL11985096A IL119850A (en) | 1996-12-17 | 1996-12-17 | Optical method and apparatus for detecting low frequency defects |
Publications (1)
Publication Number | Publication Date |
---|---|
ES2180901T3 true ES2180901T3 (es) | 2003-02-16 |
Family
ID=11069591
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ES97308168T Expired - Lifetime ES2180901T3 (es) | 1996-12-17 | 1997-10-15 | Procedimiento para la inspeccion de un objeto optico y un aparato para la inspeccion de dicho objeto optico. |
Country Status (6)
Country | Link |
---|---|
US (1) | US6075591A (es) |
EP (1) | EP0856728B1 (es) |
AT (1) | ATE221650T1 (es) |
DE (1) | DE69714401T2 (es) |
ES (1) | ES2180901T3 (es) |
IL (1) | IL119850A (es) |
Families Citing this family (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2807522B1 (fr) * | 2000-04-07 | 2002-06-14 | Aerospatiale Matra Airbus | Dispositif pour determiner les valeurs d'au moins un parametre de particules, notamment de gouttelettes d'eau |
US6671039B2 (en) * | 2000-06-22 | 2003-12-30 | Hoya Corporation | Spectacle lens image sensing processing apparatus and spectacle lens positioning method |
US6661506B2 (en) * | 2000-08-24 | 2003-12-09 | Og Technologies, Inc. | Engine bearing inspection system |
US7023542B2 (en) * | 2002-04-03 | 2006-04-04 | 3M Innovative Properties Company | Imaging method and apparatus |
US7142295B2 (en) * | 2003-03-05 | 2006-11-28 | Corning Incorporated | Inspection of transparent substrates for defects |
GB0307345D0 (en) * | 2003-03-29 | 2003-05-07 | Pilkington Plc | Glazing inspection |
WO2005017489A2 (en) * | 2003-07-11 | 2005-02-24 | Svt Associates, Inc. | Film mapping system |
US7715023B2 (en) | 2004-03-31 | 2010-05-11 | Kabushiki Kaisha Topcon | Jig mounting apparatus |
EP1605241A1 (fr) | 2004-06-09 | 2005-12-14 | Automation & Robotics | Appareil pour le controle des pièces transparentes ou réflechissantes |
CA2608119A1 (en) | 2005-05-11 | 2006-11-16 | Optosecurity Inc. | Method and system for screening luggage items, cargo containers or persons |
US7991242B2 (en) | 2005-05-11 | 2011-08-02 | Optosecurity Inc. | Apparatus, method and system for screening receptacles and persons, having image distortion correction functionality |
US7899232B2 (en) | 2006-05-11 | 2011-03-01 | Optosecurity Inc. | Method and apparatus for providing threat image projection (TIP) in a luggage screening system, and luggage screening system implementing same |
US8494210B2 (en) | 2007-03-30 | 2013-07-23 | Optosecurity Inc. | User interface for use in security screening providing image enhancement capabilities and apparatus for implementing same |
DE102006051538B4 (de) * | 2006-10-27 | 2009-04-09 | Schott Ag | Verfahren und Vorrichtung zur Bestimmung der Waviness von Glasscheiben |
JP4970149B2 (ja) * | 2007-05-31 | 2012-07-04 | 株式会社ニデック | カップ取付け装置 |
US20110193954A1 (en) * | 2010-02-08 | 2011-08-11 | Sunrise Optical Llc | Apparatus for the measurement of the topography and photoelectric properties of transparent surfaces |
JP2012243805A (ja) * | 2011-05-16 | 2012-12-10 | Toshiba Corp | パターン形成方法 |
DE102011078833A1 (de) * | 2011-07-07 | 2013-01-10 | 3D-Micromac Ag | Verfahren und Vorrichtung zum Detektieren einer Markierung an einem Objekt |
GB2508565B (en) | 2011-09-07 | 2016-10-05 | Rapiscan Systems Inc | X-ray inspection system that integrates manifest data with imaging/detection processing |
DE102011119806B4 (de) * | 2011-11-25 | 2020-10-15 | Carl Zeiss Vision International Gmbh | Verfahren und Vorrichtung zum Sichtbarmachen eines Signierzeichens auf einem Brillenglas |
FR3017963B1 (fr) | 2014-02-27 | 2016-03-25 | Essilor Int | Instrument optique pour identifier et localiser des microgravures presentes sur une lentille ophtalmique |
FR3017964B1 (fr) | 2014-02-27 | 2016-03-25 | Essilor Int | Instrument optique pour reperer au moins un point caracteristique d'une lentille ophtalmique |
DE102015115735B3 (de) * | 2015-09-17 | 2017-03-23 | Carl Zeiss Vision International Gmbh | Vorrichtung und Verfahren zum Sichtbarmachen eines Signierzeichens auf einem Brillenglas |
US20190033229A1 (en) * | 2016-02-05 | 2019-01-31 | Toray Industries, Inc. | Inspection device for sheet object, and inspection method for sheet object |
EP3764280A1 (en) | 2016-02-22 | 2021-01-13 | Rapiscan Systems, Inc. | Methods for verifying types of containers |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3743431A (en) * | 1972-05-09 | 1973-07-03 | Philco Ford Corp | Radiation sensitive means for detecting flaws in glass |
GB1403911A (en) * | 1972-07-26 | 1975-08-28 | Sira Institute | Method and apparatus for testing optical components |
IL63264A (en) * | 1980-11-04 | 1986-07-31 | Israel Atomic Energy Comm | Topographical mapping system and method |
US4547073A (en) * | 1981-02-17 | 1985-10-15 | Matsushita Electric Industrial Co., Ltd. | Surface examining apparatus and method |
DE3237511A1 (de) * | 1982-10-09 | 1984-04-12 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V., 8000 München | Verfahren zur pruefung von glaserzeugnissen |
DE3406066A1 (de) * | 1984-02-20 | 1985-08-22 | Siemens AG, 1000 Berlin und 8000 München | Anordnung zur optischen erfassung raeumlicher unebenheiten in der struktur eines zu untersuchenden objekts |
US4810895A (en) * | 1987-01-13 | 1989-03-07 | Rotlex Optics Ltd. | Method and apparatus for optical examination of an object particularly by moire ray deflection mapping |
DE3816392A1 (de) * | 1988-05-13 | 1989-11-23 | Ver Glaswerke Gmbh | Verfahren zur bestimmung der optischen qualitaet von flachglas oder flachglasprodukten |
DE3838954A1 (de) * | 1988-11-17 | 1990-05-23 | Siemens Ag | Optikanordnung zur dreidimensionalen formerfassung |
DE3926349A1 (de) * | 1989-08-09 | 1991-02-14 | Sick Optik Elektronik Erwin | Optische fehlerinspektionsvorrichtung |
US5309222A (en) * | 1991-07-16 | 1994-05-03 | Mitsubishi Denki Kabushiki Kaisha | Surface undulation inspection apparatus |
-
1996
- 1996-12-17 IL IL11985096A patent/IL119850A/xx not_active IP Right Cessation
-
1997
- 1997-10-15 AT AT97308168T patent/ATE221650T1/de not_active IP Right Cessation
- 1997-10-15 EP EP97308168A patent/EP0856728B1/en not_active Expired - Lifetime
- 1997-10-15 DE DE69714401T patent/DE69714401T2/de not_active Expired - Fee Related
- 1997-10-15 ES ES97308168T patent/ES2180901T3/es not_active Expired - Lifetime
- 1997-10-21 US US08/967,305 patent/US6075591A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
DE69714401T2 (de) | 2003-09-18 |
IL119850A (en) | 2000-11-21 |
DE69714401D1 (de) | 2002-09-05 |
EP0856728A3 (en) | 1998-09-09 |
US6075591A (en) | 2000-06-13 |
IL119850A0 (en) | 1997-03-18 |
ATE221650T1 (de) | 2002-08-15 |
EP0856728A2 (en) | 1998-08-05 |
EP0856728B1 (en) | 2002-07-31 |
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