DE60122626D1 - Zweipol-Halbleiter-Überstromschutz - Google Patents
Zweipol-Halbleiter-ÜberstromschutzInfo
- Publication number
- DE60122626D1 DE60122626D1 DE60122626T DE60122626T DE60122626D1 DE 60122626 D1 DE60122626 D1 DE 60122626D1 DE 60122626 T DE60122626 T DE 60122626T DE 60122626 T DE60122626 T DE 60122626T DE 60122626 D1 DE60122626 D1 DE 60122626D1
- Authority
- DE
- Germany
- Prior art keywords
- mosfet
- zener diode
- overcurrent protection
- terminal semiconductor
- vertical mosfet
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
- H01L27/0203—Particular design considerations for integrated circuits
- H01L27/0248—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection
- H01L27/0251—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices
- H01L27/0266—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices using field effect transistors as protective elements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
- H01L27/0203—Particular design considerations for integrated circuits
- H01L27/0248—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection
- H01L27/0251—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices
- H01L27/0255—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices using diodes as protective elements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2000198415 | 2000-06-30 | ||
JP2000198415A JP3660566B2 (ja) | 2000-06-30 | 2000-06-30 | 過電流制限型半導体素子 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE60122626D1 true DE60122626D1 (de) | 2006-10-12 |
DE60122626T2 DE60122626T2 (de) | 2007-08-30 |
Family
ID=18696581
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60122626T Expired - Fee Related DE60122626T2 (de) | 2000-06-30 | 2001-06-20 | Halbleiter-Überstrombegrenzer |
Country Status (5)
Country | Link |
---|---|
US (1) | US6469352B2 (de) |
EP (1) | EP1168449B1 (de) |
JP (1) | JP3660566B2 (de) |
AT (1) | ATE338344T1 (de) |
DE (1) | DE60122626T2 (de) |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6521958B1 (en) * | 1999-08-26 | 2003-02-18 | Micron Technology, Inc. | MOSFET technology for programmable address decode and correction |
US6674667B2 (en) * | 2001-02-13 | 2004-01-06 | Micron Technology, Inc. | Programmable fuse and antifuse and method therefor |
TW200509496A (en) * | 2003-08-21 | 2005-03-01 | Fultec Pty Ltd Proprietary | Integrated electronic disconnecting circuits, methods, and systems |
JP4437655B2 (ja) * | 2003-10-02 | 2010-03-24 | 三菱電機株式会社 | 半導体装置及び半導体装置の駆動回路 |
DE102004052096B4 (de) * | 2004-10-26 | 2016-05-19 | Infineon Technologies Ag | Halbleiterschaltelement mit Feldeffekttransistoren |
JP4718517B2 (ja) * | 2007-05-29 | 2011-07-06 | Imv株式会社 | 基板検査装置 |
CN101452953B (zh) * | 2007-11-28 | 2011-10-26 | 广州南科集成电子有限公司 | 一种恒流源器件及制造方法 |
JP4632068B2 (ja) * | 2008-05-30 | 2011-02-16 | 三菱電機株式会社 | 半導体装置 |
US9379045B2 (en) | 2012-09-13 | 2016-06-28 | Fairchild Semiconductor Corporation | Common drain power clip for battery pack protection mosfet |
US9343568B2 (en) * | 2014-05-12 | 2016-05-17 | Macronix International Co., Ltd. | Semiconductor device having high-resistance conductor structure, method of manufacturing the same and method of operating the same |
CN104992934B (zh) * | 2015-05-29 | 2018-01-09 | 株洲南车时代电气股份有限公司 | 功率半导体器件子模组 |
US9553087B1 (en) * | 2015-11-02 | 2017-01-24 | Taiwan Semiconductor Manufacturing Company Ltd. | Semiconductor device |
DE102016207859B3 (de) * | 2016-05-06 | 2017-10-26 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Monolithisch integrierter Halbleiterschalter, insbesondere Leistungstrennschalter |
CN110993600B (zh) * | 2019-12-16 | 2024-03-15 | 广东聚华印刷显示技术有限公司 | Esd防护结构、esd防护结构制作方法及显示装置 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4533970A (en) * | 1983-06-27 | 1985-08-06 | Motorola, Inc. | Series current limiter |
JPS63181376A (ja) * | 1987-01-23 | 1988-07-26 | Toshiba Corp | 半導体装置 |
JP3111576B2 (ja) * | 1992-01-06 | 2000-11-27 | 富士電機株式会社 | 半導体装置 |
US5550701A (en) * | 1994-08-30 | 1996-08-27 | International Rectifier Corporation | Power MOSFET with overcurrent and over-temperature protection and control circuit decoupled from body diode |
FR2742933B1 (fr) | 1995-12-20 | 1998-03-13 | Sgs Thomson Microelectronics | Composant statique et monolithique limiteur de courant et disjoncteur |
FR2751489B1 (fr) * | 1996-07-16 | 1998-10-16 | Sgs Thomson Microelectronics | Microdisjoncteur statique autoblocable |
FR2766984B1 (fr) | 1997-08-01 | 1999-09-03 | Commissariat Energie Atomique | Dispositif de protection d'une charge electrique et circuit d'alimentation comportant un tel dispositif |
-
2000
- 2000-06-30 JP JP2000198415A patent/JP3660566B2/ja not_active Expired - Fee Related
-
2001
- 2001-06-20 DE DE60122626T patent/DE60122626T2/de not_active Expired - Fee Related
- 2001-06-20 EP EP01114966A patent/EP1168449B1/de not_active Expired - Lifetime
- 2001-06-20 AT AT01114966T patent/ATE338344T1/de not_active IP Right Cessation
- 2001-06-20 US US09/884,057 patent/US6469352B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP1168449B1 (de) | 2006-08-30 |
US20020000568A1 (en) | 2002-01-03 |
JP3660566B2 (ja) | 2005-06-15 |
EP1168449A3 (de) | 2004-08-04 |
EP1168449A2 (de) | 2002-01-02 |
JP2002016485A (ja) | 2002-01-18 |
US6469352B2 (en) | 2002-10-22 |
ATE338344T1 (de) | 2006-09-15 |
DE60122626T2 (de) | 2007-08-30 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |