DE3814060C2 - - Google Patents
Info
- Publication number
- DE3814060C2 DE3814060C2 DE3814060A DE3814060A DE3814060C2 DE 3814060 C2 DE3814060 C2 DE 3814060C2 DE 3814060 A DE3814060 A DE 3814060A DE 3814060 A DE3814060 A DE 3814060A DE 3814060 C2 DE3814060 C2 DE 3814060C2
- Authority
- DE
- Germany
- Prior art keywords
- voltage
- resistor
- output
- detector
- connection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000003990 capacitor Substances 0.000 claims description 28
- 238000005259 measurement Methods 0.000 claims description 17
- 238000012360 testing method Methods 0.000 claims description 8
- 238000004804 winding Methods 0.000 description 8
- 230000010355 oscillation Effects 0.000 description 7
- 238000010586 diagram Methods 0.000 description 5
- 230000008901 benefit Effects 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 239000004020 conductor Substances 0.000 description 2
- 230000003111 delayed effect Effects 0.000 description 2
- 230000010363 phase shift Effects 0.000 description 2
- 230000001360 synchronised effect Effects 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 1
- 230000006378 damage Effects 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000003071 parasitic effect Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 230000002441 reversible effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2601—Apparatus or methods therefor
- G01R31/2603—Apparatus or methods therefor for curve tracing of semiconductor characteristics, e.g. on oscilloscope
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Measurement Of Current Or Voltage (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62204924A JPH0721526B2 (ja) | 1987-08-18 | 1987-08-18 | 素子測定装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE3814060A1 DE3814060A1 (de) | 1989-03-02 |
| DE3814060C2 true DE3814060C2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1993-06-24 |
Family
ID=16498620
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE3814060A Granted DE3814060A1 (de) | 1987-08-18 | 1988-04-26 | Einrichtung zur ermittlung der kennwerte von elektronischen bauelementen |
Country Status (6)
Families Citing this family (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0632061B2 (ja) * | 1990-08-27 | 1994-04-27 | 喜光 松本 | アナログ乗算・平均回路及び該回路を使用した電力計回路 |
| US5265099A (en) * | 1991-02-28 | 1993-11-23 | Feinstein David Y | Method for heating dynamic memory units whereby |
| JP2512362B2 (ja) * | 1991-12-03 | 1996-07-03 | ソニー・テクトロニクス株式会社 | 素子測定装置 |
| US5731700A (en) * | 1994-03-14 | 1998-03-24 | Lsi Logic Corporation | Quiescent power supply current test method and apparatus for integrated circuits |
| JPH08195660A (ja) * | 1995-01-19 | 1996-07-30 | Rohm Co Ltd | トランジスタのドライブ電流の予測方法 |
| JP3558425B2 (ja) * | 1995-09-01 | 2004-08-25 | アジレント・テクノロジーズ・インク | 信号切換装置およびスイッチ回路 |
| US6281699B1 (en) * | 2000-03-15 | 2001-08-28 | Teradyne, Inc. | Detector with common mode comparator for automatic test equipment |
| SG101938A1 (en) * | 2000-06-16 | 2004-02-27 | Yong Khim Swee | High speed idd measurement circuit |
| US7411150B2 (en) * | 2002-06-12 | 2008-08-12 | Alstom Technology Ltd. | Method of producing a composite component |
| JP6017176B2 (ja) * | 2012-05-01 | 2016-10-26 | エスアイアイ・セミコンダクタ株式会社 | 充放電制御回路を有する電子機器 |
| KR102787438B1 (ko) * | 2017-05-03 | 2025-03-26 | 퀘리타우, 인크. | 신호 분배 장치 |
| US10460326B2 (en) * | 2017-10-24 | 2019-10-29 | Global Circuit Innovations, Inc. | Counterfeit integrated circuit detection by comparing integrated circuit signature to reference signature |
| CN111308232B (zh) * | 2018-12-12 | 2022-08-19 | 中车株洲电力机车研究所有限公司 | 用于大功率变流模块电流回路杂散参数的测取系统及方法 |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| NL148598B (nl) * | 1948-12-29 | 1900-01-01 | Science Union & Cie | Werkwijze voor de bereiding van een geneesmiddel, dat de neiging van de bloedplaatjes tot samenklonteren en aan elkaar plakken vermindert, en een fibrinolytische werking vertoont, een geneesmiddel met een dergelijke werking, en een werkwijze voor de bereiding van een geneeskrachtige verbinding. |
| US3054954A (en) * | 1958-10-14 | 1962-09-18 | Philco Corp | System for testing transistors |
| US3286180A (en) * | 1962-06-22 | 1966-11-15 | E H Res Lab Inc | Electrical measuring apparatus for determining response time of transistors and the like |
| US3371276A (en) * | 1964-12-28 | 1968-02-27 | Rca Corp | Apparatus responsive to radio frequency noise for non-destructively testing a reversely biased transistor for second breakdown |
| US3707677A (en) * | 1971-03-08 | 1972-12-26 | Communications Transistor Corp | Method and apparatus for measuring r. f. current gain of a transistor |
| US3965420A (en) * | 1974-12-16 | 1976-06-22 | Rca Corporation | Apparatus for non-destructively testing the voltage characteristics of a transistor |
| JPS5332428A (en) * | 1976-09-08 | 1978-03-27 | Hitachi Ltd | Safety check circuit of combustion controlling apparatus |
| US4368425A (en) * | 1980-11-24 | 1983-01-11 | Dbx, Inc. | System for and method of testing transistors |
| NL8502385A (nl) * | 1984-10-04 | 1986-05-01 | Sony Tektronix Corp | Inrichting voor het meten van de karakteristieken van elektronische inrichtingen. |
| US4727318A (en) * | 1984-10-04 | 1988-02-23 | Sony/Tektronix Corporation | Apparatus for measuring characteristics of electronic devices |
| JPS61134682A (ja) * | 1984-12-05 | 1986-06-21 | Sony Tektronix Corp | 素子特性測定装置 |
| JPS6187429A (ja) * | 1984-10-04 | 1986-05-02 | Sony Tektronix Corp | 繰返し電圧発生回路 |
-
1987
- 1987-08-18 JP JP62204924A patent/JPH0721526B2/ja not_active Expired - Lifetime
-
1988
- 1988-01-05 US US07/141,006 patent/US4818934A/en not_active Expired - Lifetime
- 1988-03-22 GB GB8806770A patent/GB2208719B/en not_active Expired - Fee Related
- 1988-04-26 DE DE3814060A patent/DE3814060A1/de active Granted
- 1988-05-30 CA CA000568105A patent/CA1278880C/en not_active Expired - Fee Related
- 1988-08-18 FR FR888811010A patent/FR2619633B1/fr not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0721526B2 (ja) | 1995-03-08 |
| US4818934A (en) | 1989-04-04 |
| FR2619633A1 (fr) | 1989-02-24 |
| GB2208719B (en) | 1991-06-26 |
| GB8806770D0 (en) | 1988-04-20 |
| GB2208719A (en) | 1989-04-12 |
| DE3814060A1 (de) | 1989-03-02 |
| CA1278880C (en) | 1991-01-08 |
| JPS6447967A (en) | 1989-02-22 |
| FR2619633B1 (fr) | 1990-07-06 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| DE3814060C2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | ||
| DE3133019A1 (de) | Leistungsmessgeraet | |
| DE2738088A1 (de) | Statischer kompass | |
| DE2249646A1 (de) | Verfahren zum ermitteln der lage einer stoersignalquelle | |
| DE69004865T2 (de) | Eingangsschaltung für Elektrizitätszähler. | |
| DE3623136C2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | ||
| EP0593007B1 (de) | Verfahren zum Bestimmen der elektrischen Netzableitung in ungeerdeten elektrischen Netzen | |
| DE2636063A1 (de) | Spitzenwertdetektor | |
| DE2311184A1 (de) | Messtechnischer detektor | |
| DE69405998T2 (de) | Elektrisches testgerät | |
| DE2720556C3 (de) | Schaltung zum Anzeigen der Impedanzanpassung eines Signalkopplungsnetzwerkes | |
| DE3308973C2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | ||
| DE2235944A1 (de) | Vorrichtung zur bestimmung des effektivwertes einer pulsierenden elektrischen groesse | |
| DE2500805A1 (de) | Brueckenschaltung | |
| DE2419128A1 (de) | Erdungswiderstandsmesser mit zwei generatoren | |
| DE2746912C3 (de) | Dem Prüfen von Strom- oder Spannungswandlern dienende Einrichtungen zur selbsttätigen Ermittlung des Betragsfehlers und des Fehlwinkels eines Strom- oder Spannungswandlers | |
| DE4244739C2 (de) | Anordnung zur Auswertung der Admittanz einer variablen Meßkapazität, insbesondere für kapazitive Füllstandssonden | |
| DE3007426A1 (de) | Schaltungsanordnung mit einem kondensator im rueckkopplungszweig eines operationsverstaerkers | |
| DE102015202320A1 (de) | Detektorvorrichtung für einen Computertomographen | |
| DE69319756T2 (de) | Gerät zur Messung elektrischer Grössen | |
| DE3728163C2 (de) | Meßeinrichtung zur Bestimmung des Scheitelwerts hoher Wechselspannungen | |
| DE3220014C2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | ||
| DE2024012C3 (de) | Vorrichtung zur Fehlerortung an Leitungen bzw. Kabeln mittels Impulsortung | |
| DE2643460C3 (de) | Schaltungsanordnung zum Messen von Strömen oder Spannungen | |
| EP0610331B1 (de) | Schaltungsanordnung und verfahren zur elektrischen wirbelstromprüfung |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| OP8 | Request for examination as to paragraph 44 patent law | ||
| D2 | Grant after examination | ||
| 8364 | No opposition during term of opposition | ||
| 8328 | Change in the person/name/address of the agent |
Free format text: PATENTANWAELTE MUELLER & HOFFMANN, 81667 MUENCHEN |
|
| 8339 | Ceased/non-payment of the annual fee |