DE3776714D1 - Geraet und verfahren zum kalibrieren eines wechselspannungsniveaus. - Google Patents
Geraet und verfahren zum kalibrieren eines wechselspannungsniveaus.Info
- Publication number
- DE3776714D1 DE3776714D1 DE8787105167T DE3776714T DE3776714D1 DE 3776714 D1 DE3776714 D1 DE 3776714D1 DE 8787105167 T DE8787105167 T DE 8787105167T DE 3776714 T DE3776714 T DE 3776714T DE 3776714 D1 DE3776714 D1 DE 3776714D1
- Authority
- DE
- Germany
- Prior art keywords
- switching device
- digital signal
- existing
- analog switching
- fed
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/3167—Testing of combined analog and digital circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
- G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
- G01R31/3191—Calibration
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP61086255A JPH0697256B2 (ja) | 1986-04-14 | 1986-04-14 | Acレベル校正装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
DE3776714D1 true DE3776714D1 (de) | 1992-03-26 |
Family
ID=13881712
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE8787105167T Expired - Fee Related DE3776714D1 (de) | 1986-04-14 | 1987-04-08 | Geraet und verfahren zum kalibrieren eines wechselspannungsniveaus. |
Country Status (4)
Country | Link |
---|---|
US (1) | US4799008A (de) |
EP (1) | EP0242700B1 (de) |
JP (1) | JPH0697256B2 (de) |
DE (1) | DE3776714D1 (de) |
Families Citing this family (31)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
AU625293B2 (en) * | 1988-12-09 | 1992-07-09 | Tandem Computers Incorporated | Synchronization of fault-tolerant computer system having multiple processors |
EP0430256B1 (de) * | 1989-12-01 | 1996-02-07 | Advantest Corporation | Verfahren und Anordnung zur Kalibrierung von Ausgangssignalen für einen Wellenformanalyse-Apparat |
JPH03176678A (ja) * | 1989-12-06 | 1991-07-31 | Advantest Corp | Icテスタのac評価方法 |
JP2839938B2 (ja) * | 1990-06-27 | 1998-12-24 | 富士通株式会社 | 回路模擬試験装置及び該装置における半導体集積回路の試験方法 |
US5420515A (en) * | 1992-08-28 | 1995-05-30 | Hewlett-Packard Company | Active circuit trimming with AC and DC response trims relative to a known response |
US5504670A (en) * | 1993-03-31 | 1996-04-02 | Intel Corporation | Method and apparatus for allocating resources in a multiprocessor system |
US5642300A (en) * | 1996-01-26 | 1997-06-24 | Rotek Instrument Corp. | Precision voltage/current/power source |
US5724363A (en) * | 1996-06-21 | 1998-03-03 | Breya; Edward F. | Optical analog signal transmission system |
US5929628A (en) * | 1996-12-05 | 1999-07-27 | Teradyne, Inc. | Apparatus and method for performing amplitude calibration in an electronic circuit tester |
US6479979B1 (en) * | 1999-07-09 | 2002-11-12 | Srico, Inc. | Opto-electric device for measuring the root-mean-square value of an alternating current voltage |
US6331783B1 (en) | 1999-10-19 | 2001-12-18 | Teradyne, Inc. | Circuit and method for improved test and calibration in automated test equipment |
JP4291494B2 (ja) * | 2000-04-04 | 2009-07-08 | 株式会社アドバンテスト | Ic試験装置のタイミング校正装置 |
US7305310B2 (en) | 2004-10-18 | 2007-12-04 | Electro Industries/Gauge Tech. | System and method for compensating for potential and current transformers in energy meters |
US7304586B2 (en) | 2004-10-20 | 2007-12-04 | Electro Industries / Gauge Tech | On-line web accessed energy meter |
US7508190B2 (en) | 2004-10-20 | 2009-03-24 | Electro Industries/Gauge Tech. | Test pulses for enabling revenue testable panel meters |
US9080894B2 (en) | 2004-10-20 | 2015-07-14 | Electro Industries/Gauge Tech | Intelligent electronic device for receiving and sending data at high speeds over a network |
US7747733B2 (en) | 2004-10-25 | 2010-06-29 | Electro Industries/Gauge Tech | Power meter having multiple ethernet ports |
US8160824B2 (en) | 2005-01-27 | 2012-04-17 | Electro Industries/Gauge Tech | Intelligent electronic device with enhanced power quality monitoring and communication capabilities |
US7996171B2 (en) | 2005-01-27 | 2011-08-09 | Electro Industries/Gauge Tech | Intelligent electronic device with broad-range high accuracy |
US8190381B2 (en) | 2005-01-27 | 2012-05-29 | Electro Industries/Gauge Tech | Intelligent electronic device with enhanced power quality monitoring and communications capabilities |
US8620608B2 (en) | 2005-01-27 | 2013-12-31 | Electro Industries/Gauge Tech | Intelligent electronic device and method thereof |
US8587949B2 (en) | 2007-03-27 | 2013-11-19 | Electro Industries/Gauge Tech | Electronic meter having user-interface and central processing functionality on a single printed circuit board |
US10845399B2 (en) | 2007-04-03 | 2020-11-24 | Electro Industries/Gaugetech | System and method for performing data transfers in an intelligent electronic device |
US20130275066A1 (en) | 2007-04-03 | 2013-10-17 | Electro Industries/Gaugetech | Digital power metering system |
US9989618B2 (en) | 2007-04-03 | 2018-06-05 | Electro Industries/Gaugetech | Intelligent electronic device with constant calibration capabilities for high accuracy measurements |
JP2010117349A (ja) * | 2008-10-16 | 2010-05-27 | Advantest Corp | 試験装置、パフォーマンスボード、および、キャリブレーション用ボード |
JP5321841B2 (ja) * | 2010-01-26 | 2013-10-23 | 株式会社東芝 | 半導体集積回路 |
US9476960B2 (en) | 2013-12-18 | 2016-10-25 | Tektronix, Inc. | Measurement system including accessory with internal calibration signal |
US10551470B2 (en) * | 2017-09-22 | 2020-02-04 | Rohde & Schwarz Gmbh & Co. Kg | Calibration apparatus, calibration system and method for calibrating at least one of the signal generator and a signal analyzer |
CN108731940A (zh) * | 2018-05-10 | 2018-11-02 | 西安邮电大学 | 一种电子标定器及其标定扭振测量仪的方法 |
US11102596B2 (en) * | 2019-11-19 | 2021-08-24 | Roku, Inc. | In-sync digital waveform comparison to determine pass/fail results of a device under test (DUT) |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4127811A (en) * | 1976-09-03 | 1978-11-28 | Hewlett-Packard Company | Auto-calibrating voltmeter |
GB2028517A (en) * | 1978-08-22 | 1980-03-05 | Catt I | Testing digital circuits |
IT7923478A0 (it) * | 1979-06-12 | 1979-06-12 | Sits Soc It Telecom Siemens | Disposizione circuitale per il collaudo di un convertitore analogico-digitale di un sistema di telecomunicazioni. |
JPS5753145A (en) * | 1980-09-16 | 1982-03-30 | Sony Tektronix Corp | Calibrator for analogue-digital converter |
US4637020A (en) * | 1983-08-01 | 1987-01-13 | Fairchild Semiconductor Corporation | Method and apparatus for monitoring automated testing of electronic circuits |
JPS6089774A (ja) * | 1983-08-01 | 1985-05-20 | フエアチアイルド カメラ アンド インストルメント コ−ポレ−シヨン | 最小メモリを使用した自動テスト方式における信号タイミング装置の制御 |
-
1986
- 1986-04-14 JP JP61086255A patent/JPH0697256B2/ja not_active Expired - Lifetime
-
1987
- 1987-04-07 US US07/035,391 patent/US4799008A/en not_active Expired - Lifetime
- 1987-04-08 DE DE8787105167T patent/DE3776714D1/de not_active Expired - Fee Related
- 1987-04-08 EP EP87105167A patent/EP0242700B1/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP0242700B1 (de) | 1992-02-19 |
EP0242700A3 (en) | 1988-08-24 |
EP0242700A2 (de) | 1987-10-28 |
JPS62242872A (ja) | 1987-10-23 |
JPH0697256B2 (ja) | 1994-11-30 |
US4799008A (en) | 1989-01-17 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |