JPS55119074A - Test apparatus for ic - Google Patents

Test apparatus for ic

Info

Publication number
JPS55119074A
JPS55119074A JP2735979A JP2735979A JPS55119074A JP S55119074 A JPS55119074 A JP S55119074A JP 2735979 A JP2735979 A JP 2735979A JP 2735979 A JP2735979 A JP 2735979A JP S55119074 A JPS55119074 A JP S55119074A
Authority
JP
Japan
Prior art keywords
voltage
program
power source
output
output voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2735979A
Other languages
Japanese (ja)
Inventor
Ken Hashizume
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP2735979A priority Critical patent/JPS55119074A/en
Publication of JPS55119074A publication Critical patent/JPS55119074A/en
Pending legal-status Critical Current

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  • Tests Of Electronic Circuits (AREA)

Abstract

PURPOSE: To enable the quick functional evaluation tests with the output voltage of a reference program power source and that of respective program power sources set at the final level by having the voltage set at the specified value overlapping the output voltage of the reference power source prior to the application of each voltage to the power supply terminal with a plurality of program power sources.
CONSTITUTION: DC output voltage V1 of a reference program power source 13 in the test apparatus 12 is applied to the power supply terminal T1 of those T1WT3 of IC11 to be tested. The power source 13 is so arranged to set the output voltage within the specified range based on the 0 potential according to the program to be inputted, while the power sources 14a and 14b are so done to output the voltage V2 and V3 in such a manner that the voltage according to the program information overlaps the output voltage V1 of the power source 13. The signal having a test pulse overlapping the voltage V1 is applied to the terminal 14 from a pulse driver 18. A voltage comparator 19 compares the output signal of the IC11 with the reference voltage VREF through the terminal T5 and finally, the apparatus 12 performs the functional evaluation of the IC11, receiving the comparison voltage signal.
COPYRIGHT: (C)1980,JPO&Japio
JP2735979A 1979-03-09 1979-03-09 Test apparatus for ic Pending JPS55119074A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2735979A JPS55119074A (en) 1979-03-09 1979-03-09 Test apparatus for ic

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2735979A JPS55119074A (en) 1979-03-09 1979-03-09 Test apparatus for ic

Publications (1)

Publication Number Publication Date
JPS55119074A true JPS55119074A (en) 1980-09-12

Family

ID=12218848

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2735979A Pending JPS55119074A (en) 1979-03-09 1979-03-09 Test apparatus for ic

Country Status (1)

Country Link
JP (1) JPS55119074A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5965270A (en) * 1982-08-23 1984-04-13 テクトロニツクス・インコ−ポレイテツド Self-testing method and device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5965270A (en) * 1982-08-23 1984-04-13 テクトロニツクス・インコ−ポレイテツド Self-testing method and device

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