JPS55101065A - Ic tester - Google Patents

Ic tester

Info

Publication number
JPS55101065A
JPS55101065A JP900979A JP900979A JPS55101065A JP S55101065 A JPS55101065 A JP S55101065A JP 900979 A JP900979 A JP 900979A JP 900979 A JP900979 A JP 900979A JP S55101065 A JPS55101065 A JP S55101065A
Authority
JP
Japan
Prior art keywords
ics
signal
decision
result
good
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP900979A
Other languages
Japanese (ja)
Inventor
Hideaki Matsuoka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Heating Appliances Co Ltd
Hitachi Netsu Kigu KK
Original Assignee
Hitachi Heating Appliances Co Ltd
Hitachi Netsu Kigu KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Heating Appliances Co Ltd, Hitachi Netsu Kigu KK filed Critical Hitachi Heating Appliances Co Ltd
Priority to JP900979A priority Critical patent/JPS55101065A/en
Publication of JPS55101065A publication Critical patent/JPS55101065A/en
Pending legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)

Abstract

PURPOSE: To prevent an error decision and also to simplify control over reference IC by providing two reference IC of good quality and by employing a reference signal only when the result of a comparison between two ICs is good.
CONSTITUTION: A signal from input signal generator 1 is applied to IC2 to be tested and two reference ICs 3 and 4. Reference output signals from those two reference ICs 3 and 4 are applied to comparator 5 for a comparing decision and only when the result is good, a comparing decision with the output signal of IC2 to be tested as a reference signal is made by comparator 6 and the comparison result is displayed by display unit 7. Consequently, the risk of an error decision due to faults or abnormality of reference ICs 3 and 4 is prevented and control over reference ICs 3 and 4 is simplified.
COPYRIGHT: (C)1980,JPO&Japio
JP900979A 1979-01-29 1979-01-29 Ic tester Pending JPS55101065A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP900979A JPS55101065A (en) 1979-01-29 1979-01-29 Ic tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP900979A JPS55101065A (en) 1979-01-29 1979-01-29 Ic tester

Publications (1)

Publication Number Publication Date
JPS55101065A true JPS55101065A (en) 1980-08-01

Family

ID=11708641

Family Applications (1)

Application Number Title Priority Date Filing Date
JP900979A Pending JPS55101065A (en) 1979-01-29 1979-01-29 Ic tester

Country Status (1)

Country Link
JP (1) JPS55101065A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006145416A (en) * 2004-11-22 2006-06-08 Toshiba Corp Custom ic verification device and verification method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006145416A (en) * 2004-11-22 2006-06-08 Toshiba Corp Custom ic verification device and verification method

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