JPS5733368A - Fault detector - Google Patents

Fault detector

Info

Publication number
JPS5733368A
JPS5733368A JP10876180A JP10876180A JPS5733368A JP S5733368 A JPS5733368 A JP S5733368A JP 10876180 A JP10876180 A JP 10876180A JP 10876180 A JP10876180 A JP 10876180A JP S5733368 A JPS5733368 A JP S5733368A
Authority
JP
Japan
Prior art keywords
diagnosis
circuit
comparator
waveform
results
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10876180A
Other languages
Japanese (ja)
Other versions
JPS6363867B2 (en
Inventor
Tetsuo Okuya
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP10876180A priority Critical patent/JPS5733368A/en
Publication of JPS5733368A publication Critical patent/JPS5733368A/en
Publication of JPS6363867B2 publication Critical patent/JPS6363867B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising

Abstract

PURPOSE:To obtain diagnosis results of high reliability by providing a comparator which compares the control signal for a semiconductor switch, diagnosis pulses and an operation detection signal. CONSTITUTION:A load driving circuit 20 is provided with a semiconductor switch permitting changeover having no bidirectional response delay is provided. The control signal 100 from a control circuit 4, the diagnosis pulses 101 from a pulse generator 6, and the operation detection signal 103 from a driving detection circuit 7 are supplied respectively to a comparator 80 making logical judgement. Thence, the comparison result signal 104 of the comparator 80 is applied to a waveform detecting circuit 11, by the waveform whereof, the diagnosis for faults is carried out. Since the diagnosis is carried out by detecting the waveform of the compared results in this way, the diagnosis results of high reliability are obtained. Since the faults of the pulse generating circuti 6 and an input circuit 5 are detected as well, reliability is made much higher.
JP10876180A 1980-08-07 1980-08-07 Fault detector Granted JPS5733368A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10876180A JPS5733368A (en) 1980-08-07 1980-08-07 Fault detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10876180A JPS5733368A (en) 1980-08-07 1980-08-07 Fault detector

Publications (2)

Publication Number Publication Date
JPS5733368A true JPS5733368A (en) 1982-02-23
JPS6363867B2 JPS6363867B2 (en) 1988-12-08

Family

ID=14492826

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10876180A Granted JPS5733368A (en) 1980-08-07 1980-08-07 Fault detector

Country Status (1)

Country Link
JP (1) JPS5733368A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58175926A (en) * 1982-04-05 1983-10-15 日本電気ホームエレクトロニクス株式会社 Method of protecting output circuit
JPS60196685A (en) * 1984-03-19 1985-10-05 Mitsubishi Heavy Ind Ltd Trouble detection circuit of logical operation element
JPS62156575A (en) * 1985-12-06 1987-07-11 ゼネラル・エレクトリツク・カンパニイ Testing system of control turn-off semiconductor in circuit
JPS63163469U (en) * 1987-04-15 1988-10-25

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58175926A (en) * 1982-04-05 1983-10-15 日本電気ホームエレクトロニクス株式会社 Method of protecting output circuit
JPS60196685A (en) * 1984-03-19 1985-10-05 Mitsubishi Heavy Ind Ltd Trouble detection circuit of logical operation element
JPS62156575A (en) * 1985-12-06 1987-07-11 ゼネラル・エレクトリツク・カンパニイ Testing system of control turn-off semiconductor in circuit
JPS63163469U (en) * 1987-04-15 1988-10-25

Also Published As

Publication number Publication date
JPS6363867B2 (en) 1988-12-08

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