DE3720017C2 - - Google Patents

Info

Publication number
DE3720017C2
DE3720017C2 DE3720017A DE3720017A DE3720017C2 DE 3720017 C2 DE3720017 C2 DE 3720017C2 DE 3720017 A DE3720017 A DE 3720017A DE 3720017 A DE3720017 A DE 3720017A DE 3720017 C2 DE3720017 C2 DE 3720017C2
Authority
DE
Germany
Prior art keywords
cresol
alkali
mixture according
hydroxy
photosensitive
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE3720017A
Other languages
German (de)
English (en)
Other versions
DE3720017A1 (de
Inventor
Hidekatsu Chigasaki Kanagawa Jp Kohara
Masanori Sagamihara Kanagawa Jp Miyabe
Nobuo Kanagawa Jp Tokutake
Toshimasa Hiratsuka Kanagawa Jp Nakayama
Shingo Fujisawa Kanagawa Jp Asaumi
Hatsuyuki Kanagawa Jp Tanaka
Yoshiaki Yokohama Kanagawa Jp Arai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Ohka Kogyo Co Ltd
Original Assignee
Tokyo Ohka Kogyo Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Ohka Kogyo Co Ltd filed Critical Tokyo Ohka Kogyo Co Ltd
Publication of DE3720017A1 publication Critical patent/DE3720017A1/de
Application granted granted Critical
Publication of DE3720017C2 publication Critical patent/DE3720017C2/de
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004—Photosensitive materials
    • G03F7/025—Non-macromolecular photopolymerisable compounds having carbon-to-carbon triple bonds, e.g. acetylenic compounds
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004—Photosensitive materials
    • G03F7/09—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers
    • G03F7/091—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers characterised by antireflection means or light filtering or absorbing means, e.g. anti-halation, contrast enhancement
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004—Photosensitive materials
    • G03F7/04—Chromates

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Architecture (AREA)
  • Structural Engineering (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Materials For Photolithography (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
DE19873720017 1986-06-16 1987-06-16 Positivresistzusammensetzung Granted DE3720017A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61138143A JP2614847B2 (ja) 1986-06-16 1986-06-16 ポジ型感光性組成物

Publications (2)

Publication Number Publication Date
DE3720017A1 DE3720017A1 (de) 1987-12-17
DE3720017C2 true DE3720017C2 (US06350818-20020226-C00041.png) 1990-04-26

Family

ID=15215010

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19873720017 Granted DE3720017A1 (de) 1986-06-16 1987-06-16 Positivresistzusammensetzung

Country Status (5)

Country Link
US (1) US4882260A (US06350818-20020226-C00041.png)
JP (1) JP2614847B2 (US06350818-20020226-C00041.png)
KR (1) KR900002362B1 (US06350818-20020226-C00041.png)
DE (1) DE3720017A1 (US06350818-20020226-C00041.png)
GB (1) GB2193003B (US06350818-20020226-C00041.png)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2534872B2 (ja) * 1987-06-25 1996-09-18 住友化学工業株式会社 フォトレジスト組成物
US5164279A (en) * 1988-06-06 1992-11-17 Shipley Company Inc. Positive dye photoresist compositions with 4,6-bis(azophenyl)resorcinol
US4983492A (en) * 1988-06-06 1991-01-08 Shipley Company Inc. Positive dye photoresist compositions with 2,4-bis(phenylazo)resorcinol
JP2640137B2 (ja) * 1989-02-28 1997-08-13 富士写真フイルム株式会社 ポジ型フオトレジスト組成物
JP2619050B2 (ja) * 1989-03-27 1997-06-11 東京応化工業株式会社 ポジ型感光性組成物
US5362598A (en) * 1989-04-10 1994-11-08 Sumitomo Chemical Co., Ltd. Quinone diazide photoresist composition containing alkali-soluble resin and an ultraviolet ray absorbing dye
US5225312A (en) * 1990-05-24 1993-07-06 Morton International, Inc. Positive photoresist containing dyes
DE69131529T2 (de) * 1990-05-29 2000-01-20 Sumitomo Bakelite Co Positiv arbeitende lichtempfindliche Harzzusammensetzung
JPH0437851A (ja) * 1990-06-04 1992-02-07 Mitsubishi Kasei Corp ポジ型フォトレジスト組成物
US5108870A (en) * 1990-08-02 1992-04-28 Morton International, Inc. Positive-working photoresist composition containing purified broadband dye and process of using
US5294680A (en) * 1992-07-24 1994-03-15 International Business Machines Corporation Polymeric dyes for antireflective coatings
US6280910B1 (en) 1992-11-23 2001-08-28 Pioneer Electronic Corporation Photoresist for optical disc and method of preparing optical disc utilizing photoresist
US5731385A (en) * 1993-12-16 1998-03-24 International Business Machines Corporation Polymeric dyes for antireflective coatings
US5458537A (en) * 1994-01-18 1995-10-17 Hired Hand Manufacturing, Inc. Switch apparatus for power winch
KR0172794B1 (ko) * 1995-12-29 1999-03-30 김주용 반도체 소자의 미세패턴 형성방법
TW473653B (en) 1997-05-27 2002-01-21 Clariant Japan Kk Composition for anti-reflective film or photo absorption film and compound used therein
TW457403B (en) 1998-07-03 2001-10-01 Clariant Int Ltd Composition for forming a radiation absorbing coating containing blocked isocyanate compound and anti-reflective coating formed therefrom
KR100533362B1 (ko) * 2000-04-19 2005-12-06 주식회사 하이닉스반도체 레지스트 플로우 공정용 포토레지스트 조성물 및 이를이용한 콘택홀의 형성방법
TWI421638B (zh) * 2011-05-11 2014-01-01 Chi Mei Corp 正型感光性樹脂組成物及使用該組成物形成圖案的方法
TWI435176B (zh) * 2011-06-22 2014-04-21 Chi Mei Corp 正型感光性樹脂組成物及使用該組成物形成圖案的方法

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1447011A1 (de) * 1963-07-12 1969-01-02 Kalle Ag Mit o-Naphtholchinondiaziden vorsensibilisierte Druckplatten
GB1052699A (US06350818-20020226-C00041.png) * 1963-12-03
DE2847878A1 (de) * 1978-11-04 1980-05-22 Hoechst Ag Lichtempfindliches gemisch
JPS6046422B2 (ja) * 1978-12-07 1985-10-16 東京応化工業株式会社 新規なフオトレジスト組成物
JPS56153338A (en) * 1980-04-28 1981-11-27 Japan Synthetic Rubber Co Ltd Photoresist composition
JPS56147146A (en) * 1980-04-18 1981-11-14 Fujitsu Ltd Photoetching method
AU8021782A (en) * 1981-02-20 1982-08-26 Polychrome Corp. Non-silver positive working radiation sensitive compositions
US4370405A (en) * 1981-03-30 1983-01-25 Hewlett-Packard Company Multilayer photoresist process utilizing an absorbant dye
US4377631A (en) * 1981-06-22 1983-03-22 Philip A. Hunt Chemical Corporation Positive novolak photoresist compositions
DE3144499A1 (de) * 1981-11-09 1983-05-19 Hoechst Ag, 6230 Frankfurt Lichtempfindliches gemisch und daraus hergestelltes lichtempfindliches kopiermaterial
DE3144480A1 (de) * 1981-11-09 1983-05-19 Hoechst Ag, 6230 Frankfurt Lichtempfindliches gemisch und daraus hergestelltes lichtempfindliches kopiermaterial
JPS58174941A (ja) * 1982-04-08 1983-10-14 Tokyo Ohka Kogyo Co Ltd 新規な吸光剤及びそれを含有するホトレジスト組成物
JPS59142538A (ja) * 1983-02-04 1984-08-15 Tokyo Ohka Kogyo Co Ltd 感光性組成物
JPS6088941A (ja) * 1983-10-21 1985-05-18 Nagase Kasei Kogyo Kk フオトレジスト組成物
US4551409A (en) * 1983-11-07 1985-11-05 Shipley Company Inc. Photoresist composition of cocondensed naphthol and phenol with formaldehyde in admixture with positive o-quinone diazide or negative azide
JPS60220931A (ja) * 1984-03-06 1985-11-05 Tokyo Ohka Kogyo Co Ltd 感光性樹脂用下地材料
GB8414867D0 (en) * 1984-06-11 1984-07-18 Minnesota Mining & Mfg Pre-press proofing system
US4596763A (en) * 1984-10-01 1986-06-24 American Hoechst Corporation Positive photoresist processing with mid U-V range exposure
JPS6198344A (ja) * 1984-10-19 1986-05-16 Fuji Photo Film Co Ltd 新規なフオトレジスト組成物
US4626492A (en) * 1985-06-04 1986-12-02 Olin Hunt Specialty Products, Inc. Positive-working o-quinone diazide photoresist composition containing a dye and a trihydroxybenzophenone compound
JPH0654384B2 (ja) * 1985-08-09 1994-07-20 東京応化工業株式会社 ポジ型ホトレジスト組成物
DE3606266A1 (de) * 1986-02-27 1987-09-03 Basf Ag Lichtempfindliches aufzeichnungselement

Also Published As

Publication number Publication date
GB2193003B (en) 1990-01-04
JPS62295044A (ja) 1987-12-22
GB8714038D0 (en) 1987-07-22
KR880000824A (ko) 1988-03-29
JP2614847B2 (ja) 1997-05-28
GB2193003A (en) 1988-01-27
KR900002362B1 (ko) 1990-04-12
US4882260A (en) 1989-11-21
DE3720017A1 (de) 1987-12-17

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Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
D2 Grant after examination
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee