DE3680033D1 - Integrierte halbleiterschaltung mit einer schaltfunktion der betriebsarten einer internen schaltung. - Google Patents

Integrierte halbleiterschaltung mit einer schaltfunktion der betriebsarten einer internen schaltung.

Info

Publication number
DE3680033D1
DE3680033D1 DE8686303565T DE3680033T DE3680033D1 DE 3680033 D1 DE3680033 D1 DE 3680033D1 DE 8686303565 T DE8686303565 T DE 8686303565T DE 3680033 T DE3680033 T DE 3680033T DE 3680033 D1 DE3680033 D1 DE 3680033D1
Authority
DE
Germany
Prior art keywords
circuit
potential
internal circuit
operating modes
switching function
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE8686303565T
Other languages
English (en)
Inventor
Yoshihiro Takemae
Shigeki Nozaki
Masao Nakano
Kimiaki Sato
Nobumi C O Fujitsu Daig Kodama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Application granted granted Critical
Publication of DE3680033D1 publication Critical patent/DE3680033D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31701—Arrangements for setting the Unit Under Test [UUT] in a test mode
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C17/00—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/46—Test trigger logic
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/267—Reconfiguring circuits for testing, e.g. LSSD, partitioning

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Tests Of Electronic Circuits (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Dram (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Semiconductor Integrated Circuits (AREA)
DE8686303565T 1985-05-11 1986-05-09 Integrierte halbleiterschaltung mit einer schaltfunktion der betriebsarten einer internen schaltung. Expired - Lifetime DE3680033D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60098890A JPS61258399A (ja) 1985-05-11 1985-05-11 半導体集積回路装置

Publications (1)

Publication Number Publication Date
DE3680033D1 true DE3680033D1 (de) 1991-08-08

Family

ID=14231728

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8686303565T Expired - Lifetime DE3680033D1 (de) 1985-05-11 1986-05-09 Integrierte halbleiterschaltung mit einer schaltfunktion der betriebsarten einer internen schaltung.

Country Status (5)

Country Link
US (1) US4742486A (de)
EP (1) EP0205258B1 (de)
JP (1) JPS61258399A (de)
KR (1) KR900001492B1 (de)
DE (1) DE3680033D1 (de)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5293598A (en) * 1986-07-30 1994-03-08 Mitsubishi Denki Kabushiki Kaisha Random access memory with a plurality of amplifier groups
JPS6337894A (ja) * 1986-07-30 1988-02-18 Mitsubishi Electric Corp ランダムアクセスメモリ
JPS6337269A (ja) * 1986-08-01 1988-02-17 Fujitsu Ltd モ−ド選定回路
US4807191A (en) * 1988-01-04 1989-02-21 Motorola, Inc. Redundancy for a block-architecture memory
JPH01276489A (ja) * 1988-04-27 1989-11-07 Mitsubishi Electric Corp ダイナミック型半導体記憶装置のモード切換方式
US5012180A (en) * 1988-05-17 1991-04-30 Zilog, Inc. System for testing internal nodes
JPH02181677A (ja) * 1989-01-06 1990-07-16 Sharp Corp Ｌｓｉのテストモード切替方式
JPH02206087A (ja) * 1989-02-03 1990-08-15 Mitsubishi Electric Corp 半導体記憶装置
JP2582439B2 (ja) * 1989-07-11 1997-02-19 富士通株式会社 書き込み可能な半導体記憶装置
JPH0743399B2 (ja) * 1990-08-15 1995-05-15 富士通株式会社 半導体回路
JPH04119600A (ja) * 1990-09-10 1992-04-21 Mitsubishi Electric Corp テストモード機能内蔵ダイナミックランダムアクセスメモリ装置
US5363383A (en) * 1991-01-11 1994-11-08 Zilog, Inc. Circuit for generating a mode control signal
JP3282188B2 (ja) * 1991-06-27 2002-05-13 日本電気株式会社 半導体メモリ装置
KR950014099B1 (ko) * 1992-06-12 1995-11-21 가부시기가이샤 도시바 반도체 기억장치
DE4434792C1 (de) * 1994-09-29 1996-05-23 Telefunken Microelectron Integrierte, in einem ersten und einem zweiten Betriebsmodus betreibbare Schaltungsanordnung
DE10158406A1 (de) * 2001-11-29 2003-06-12 Knorr Bremse Systeme Verfahren und Prüfeinrichtung zum Entdecken von Adressierungsfehlern in Steuergeräten
KR100428792B1 (ko) * 2002-04-30 2004-04-28 삼성전자주식회사 패드의 언더슈트 또는 오버슈트되는 입력 전압에 안정적인전압 측정장치
US9015394B2 (en) * 2012-06-22 2015-04-21 Lenovo Enterprise Solutions (Singapore) Pte. Ltd. Chip select (‘CS’) multiplication in a serial peripheral interface (‘SPI’) system
CN110941218B (zh) * 2019-12-10 2021-02-26 北京振兴计量测试研究所 一种can总线控制器测试方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5396740A (en) * 1977-02-04 1978-08-24 Hitachi Ltd Test system
DE3030852A1 (de) * 1980-08-14 1982-03-11 Siemens AG, 1000 Berlin und 8000 München Schaltungsanordnung fuer die pruefung von speicherzellen programmierbarer mos-integrierter halbleiterspeicher
US4552292A (en) * 1982-11-12 1985-11-12 General Electric Company Heat exchanger
JPS59198596A (ja) * 1983-04-22 1984-11-10 Hitachi Micro Comput Eng Ltd 検査回路
DE3318564A1 (de) * 1983-05-20 1984-11-22 Siemens AG, 1000 Berlin und 8000 München Integrierte digitale mos-halbleiterschaltung
KR900002664B1 (ko) * 1985-08-16 1990-04-21 가부시끼가이샤 히다찌세이사꾸쇼 시리얼 데이터 기억 반도체 메모리

Also Published As

Publication number Publication date
JPS61258399A (ja) 1986-11-15
US4742486A (en) 1988-05-03
EP0205258B1 (de) 1991-07-03
KR860009420A (ko) 1986-12-22
KR900001492B1 (ko) 1990-03-12
EP0205258A3 (en) 1989-02-15
EP0205258A2 (de) 1986-12-17
JPH0412854B2 (de) 1992-03-05

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition