DE3535749C2 - - Google Patents

Info

Publication number
DE3535749C2
DE3535749C2 DE3535749A DE3535749A DE3535749C2 DE 3535749 C2 DE3535749 C2 DE 3535749C2 DE 3535749 A DE3535749 A DE 3535749A DE 3535749 A DE3535749 A DE 3535749A DE 3535749 C2 DE3535749 C2 DE 3535749C2
Authority
DE
Germany
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE3535749A
Other versions
DE3535749A1 (de
Inventor
Bernd Dipl.-Ing. 7072 Heubach De Spruck
Siegfried 7082 Oberkochen De Gerber
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Carl Zeiss AG
Original Assignee
Carl Zeiss AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Carl Zeiss AG filed Critical Carl Zeiss AG
Priority to DE19853535749 priority Critical patent/DE3535749A1/de
Priority to US06/845,964 priority patent/US4714823A/en
Publication of DE3535749A1 publication Critical patent/DE3535749A1/de
Application granted granted Critical
Publication of DE3535749C2 publication Critical patent/DE3535749C2/de
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Microscoopes, Condenser (AREA)
DE19853535749 1985-04-12 1985-10-07 Einrichtung zur helligkeitsregelung in mikroskopen Granted DE3535749A1 (de)

Priority Applications (2)

Application Number Priority Date Filing Date Title
DE19853535749 DE3535749A1 (de) 1985-04-12 1985-10-07 Einrichtung zur helligkeitsregelung in mikroskopen
US06/845,964 US4714823A (en) 1985-04-12 1986-03-31 Attenuator for extraneous light fluctuations in a microscope with automatic brightness control

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE3513146 1985-04-12
DE19853535749 DE3535749A1 (de) 1985-04-12 1985-10-07 Einrichtung zur helligkeitsregelung in mikroskopen

Publications (2)

Publication Number Publication Date
DE3535749A1 DE3535749A1 (de) 1986-10-16
DE3535749C2 true DE3535749C2 (de) 1987-02-26

Family

ID=25831254

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19853535749 Granted DE3535749A1 (de) 1985-04-12 1985-10-07 Einrichtung zur helligkeitsregelung in mikroskopen

Country Status (2)

Country Link
US (1) US4714823A (de)
DE (1) DE3535749A1 (de)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3918990A1 (de) * 1989-06-10 1990-12-13 Zeiss Carl Fa Mikroskop mit bildhelligkeitsabgleich
DE4142925A1 (de) * 1991-12-24 1993-07-01 Leica Mikroskopie & Syst Verfahren und einrichtung zur helligkeits- und/oder farbtemperaturregelung fuer ein mikroskopisches beleuchtungssystem
MX9200720A (es) * 1992-02-21 1993-09-01 Invest Y Centro Mejoras a microscopio metalografico util para la caracterizacion de dados de estirado de conductores.
CH689703A5 (de) * 1994-05-18 1999-08-31 Zeiss Carl Fa Photomikroskop.
KR100296335B1 (ko) * 1995-12-28 2001-11-22 이중구 자동광량조절기능을가지는칼라영상현미경
US6738558B2 (en) 1996-10-24 2004-05-18 Leica Microsystems Wetzlar Gmbh Microscope with a proximity sensor
DE19643558C1 (de) * 1996-10-24 1998-04-09 Leica Mikroskopie & Syst Mikroskop mit einem Annäherungssensor
WO1999021042A2 (en) * 1997-10-17 1999-04-29 Accumed International, Inc. High-precision computer-aided microscope system
DE10257521B4 (de) 2002-12-10 2017-03-30 Leica Microsystems Cms Gmbh Auflichtmikroskop
DE102004033967B3 (de) * 2004-07-14 2005-12-15 Leica Microsystems Wetzlar Gmbh Mikroskop mit Bildhelligkeitsabgleich
DE102005059337A1 (de) 2005-12-08 2007-06-21 Carl Zeiss Jena Gmbh Blendeneinrichtung
US9086737B2 (en) * 2006-06-15 2015-07-21 Apple Inc. Dynamically controlled keyboard
US8373355B2 (en) * 2006-11-09 2013-02-12 Apple Inc. Brightness control of a status indicator light
US8138687B2 (en) * 2009-06-30 2012-03-20 Apple Inc. Multicolor lighting system
US8400626B2 (en) 2010-06-10 2013-03-19 Apple Inc. Ambient light sensor
US11085901B2 (en) * 2014-08-19 2021-08-10 Dan Slater Acoustical microscope
US11002890B1 (en) * 2017-11-28 2021-05-11 Facebook Technologies, Llc Optical layers for fresnel surfaces
US11835382B2 (en) 2021-03-02 2023-12-05 Apple Inc. Handheld electronic device

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1224835B (de) * 1960-06-18 1966-09-15 Gossen & Co Gmbh P Verfahren zur automatischen Beleuchtungs-reglung und nach diesem Verfahren arbeitender automatischer Beleuchtungsregler
US3872302A (en) * 1974-03-20 1975-03-18 Ni Tec Image intensifier system with reticle brightness control
US4024428A (en) * 1975-05-19 1977-05-17 Optical Associates, Incorporated Radiation-sensitive control circuit for driving lamp at various power levels
US4487486A (en) * 1981-07-28 1984-12-11 Olympus Optical Co., Ltd. Vertical illuminator for microscope
DE3221804A1 (de) * 1982-06-07 1983-12-08 Leisegang Feinmechanik-Optik Gmbh & Co Kg, 1000 Berlin Beleuchtungseinrichtung
US4555620A (en) * 1983-01-11 1985-11-26 Bausch & Lomb Incorporated Automatic illumination control for multi-objective optical instruments such as microscopes

Also Published As

Publication number Publication date
DE3535749A1 (de) 1986-10-16
US4714823A (en) 1987-12-22

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Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
D2 Grant after examination
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee