MX9200720A - Mejoras a microscopio metalografico util para la caracterizacion de dados de estirado de conductores. - Google Patents

Mejoras a microscopio metalografico util para la caracterizacion de dados de estirado de conductores.

Info

Publication number
MX9200720A
MX9200720A MX9200720A MX9200720A MX9200720A MX 9200720 A MX9200720 A MX 9200720A MX 9200720 A MX9200720 A MX 9200720A MX 9200720 A MX9200720 A MX 9200720A MX 9200720 A MX9200720 A MX 9200720A
Authority
MX
Mexico
Prior art keywords
incorporation
modifications
characterization
microscope
metalographic
Prior art date
Application number
MX9200720A
Other languages
English (en)
Inventor
Daniel Aguilera Longoria
Daniel Cardenas Garcia
Fernando Luengas Ruiz
Original Assignee
Invest Y Centro
Desarrollo Condumex S A De Cv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Invest Y Centro, Desarrollo Condumex S A De Cv filed Critical Invest Y Centro
Priority to MX9200720A priority Critical patent/MX9200720A/es
Priority to ES92309890T priority patent/ES2100303T3/es
Priority to DE69216808T priority patent/DE69216808T2/de
Priority to EP92309890A priority patent/EP0557648B1/en
Priority to JP4340942A priority patent/JP2964372B2/ja
Priority to BR9205102A priority patent/BR9205102A/pt
Priority to CA002085911A priority patent/CA2085911C/en
Publication of MX9200720A publication Critical patent/MX9200720A/es
Priority to US08/280,557 priority patent/US5457571A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/04—Measuring microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/0016—Technical microscopes, e.g. for inspection or measuring in industrial production processes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Microscoopes, Condenser (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

La presente invención se relaciona con mejoras a un miscroscopio metalográfico, convencional al cual se le han hecho modificaciones a sus partes principales como lo son el cuerpo, platina y al sistema de iluminación integrado por dos subsistemas, las modificaciones a las partes principales se caracterizan por ser las siguientes: Incorporación de un circuito electrónico para el control, monitoreo, selección y ajuste de intensidad luminosa; Modificación de las fuentes de iluminación; Incorporación de un sistema colimador para la iluminación diascópica; Integración de escalas lineales a los ejes horizontal y vertical de la platina; Incorporación de la fuente de alimentación de la cámara de video en el cuerpo del microscopio; Cableado interno para alimentación de la cámara, suministro de señal de sincronía y salida de video; Mediante estas modificaciones se permite obtener una caracterización ideal de los dados de estirado.
MX9200720A 1992-02-21 1992-02-21 Mejoras a microscopio metalografico util para la caracterizacion de dados de estirado de conductores. MX9200720A (es)

Priority Applications (8)

Application Number Priority Date Filing Date Title
MX9200720A MX9200720A (es) 1992-02-21 1992-02-21 Mejoras a microscopio metalografico util para la caracterizacion de dados de estirado de conductores.
ES92309890T ES2100303T3 (es) 1992-02-21 1992-10-28 Microscopio metalografico para la caracterizacion de matrices de estirado de conductores.
DE69216808T DE69216808T2 (de) 1992-02-21 1992-10-28 Metallographisches Mikroskop zur Untersuchung von Zugdüsen für Leiter
EP92309890A EP0557648B1 (en) 1992-02-21 1992-10-28 Metallographic microscope for the characterization of conductors drawing dies
JP4340942A JP2964372B2 (ja) 1992-02-21 1992-11-30 引き抜き加工用ダイに有用な金属組織顕微鏡
BR9205102A BR9205102A (pt) 1992-02-21 1992-12-18 Aperfeicoamento em um microscopio metalografico util para a caracterizacao de matrizes de estiramento de condutores
CA002085911A CA2085911C (en) 1992-02-21 1992-12-21 Metallographic microscope useful for the characterization of conductors drawing dies
US08/280,557 US5457571A (en) 1992-02-21 1994-07-26 Metallographic microscope useful for the characterization of conductors drawing dies

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
MX9200720A MX9200720A (es) 1992-02-21 1992-02-21 Mejoras a microscopio metalografico util para la caracterizacion de dados de estirado de conductores.

Publications (1)

Publication Number Publication Date
MX9200720A true MX9200720A (es) 1993-09-01

Family

ID=19743783

Family Applications (1)

Application Number Title Priority Date Filing Date
MX9200720A MX9200720A (es) 1992-02-21 1992-02-21 Mejoras a microscopio metalografico util para la caracterizacion de dados de estirado de conductores.

Country Status (8)

Country Link
US (1) US5457571A (es)
EP (1) EP0557648B1 (es)
JP (1) JP2964372B2 (es)
BR (1) BR9205102A (es)
CA (1) CA2085911C (es)
DE (1) DE69216808T2 (es)
ES (1) ES2100303T3 (es)
MX (1) MX9200720A (es)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001521182A (ja) * 1997-10-17 2001-11-06 アキュメッド インターナショナル インコーポレイテッド 高精度コンピュータ利用顕微鏡装置
JP2005321453A (ja) * 2004-05-06 2005-11-17 Olympus Corp 顕微鏡用蛍光照明装置
CN100371762C (zh) * 2005-02-25 2008-02-27 宝钢集团上海梅山有限公司 一种数码金相显微图像放大倍率的标定方法

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US977842A (en) * 1910-07-14 1910-12-06 Albert Sauveur Magnetic specimen-holder for microscopes.
US3551019A (en) * 1967-11-21 1970-12-29 Zeiss Stiftung Universal microscope
US3633991A (en) * 1969-10-01 1972-01-11 Morris Miller Metallurgical microscopes with mirror stages
CH518562A (de) * 1970-02-24 1972-01-31 Zeiss Carl Fa Verfahren und Vorrichtung zur automatischen Fokussierung von Mikroskopen
US4027942A (en) * 1975-12-16 1977-06-07 Kogaku Ltd. Micrometer microscope with binocular viewing
US4285568A (en) * 1979-08-13 1981-08-25 Alan Elgart Microscope stage
US4555620A (en) * 1983-01-11 1985-11-26 Bausch & Lomb Incorporated Automatic illumination control for multi-objective optical instruments such as microscopes
DE3312779A1 (de) * 1983-04-09 1984-10-11 Fa. Carl Zeiss, 7920 Heidenheim Verfahren zur einblendung eines vergleichsstandards in das bild eines mikroskops
JPH0662305B2 (ja) * 1983-12-29 1994-08-17 オ−ストラリア国 テクネチウム−９９ｍ−標識放射医薬の製造
JPS60258513A (ja) * 1984-06-05 1985-12-20 Olympus Optical Co Ltd 測光顕微鏡システム
DE3535749C2 (de) * 1985-04-12 1987-02-26 Fa. Carl Zeiss, 7920 Heidenheim Einrichtung zur Helligkeitsregelung in Mikroskopen
DE3521047C1 (de) * 1985-06-12 1986-09-04 C. Reichert Optische Werke Ag, Wien Mikroskop
US4971445A (en) * 1987-05-12 1990-11-20 Olympus Optical Co., Ltd. Fine surface profile measuring apparatus
JPH0245734A (ja) * 1988-08-05 1990-02-15 Mitsubishi Heavy Ind Ltd 自動組織解析処理装置
DE3828381C2 (de) * 1988-08-20 1997-09-11 Zeiss Carl Fa Verfahren und Einrichtung zur automatischen Fokussierung eines optischen Systems
JPH0249012A (ja) * 1989-07-14 1990-02-19 Toray Ind Inc 新規グラフト共重合体の製造方法
US5112129A (en) * 1990-03-02 1992-05-12 Kla Instruments Corporation Method of image enhancement for the coherence probe microscope with applications to integrated circuit metrology

Also Published As

Publication number Publication date
BR9205102A (pt) 1993-08-24
DE69216808T2 (de) 1997-08-07
CA2085911C (en) 2001-10-16
ES2100303T3 (es) 1997-06-16
DE69216808D1 (de) 1997-02-27
EP0557648B1 (en) 1997-01-15
US5457571A (en) 1995-10-10
CA2085911A1 (en) 1993-08-22
EP0557648A1 (en) 1993-09-01
JPH05280924A (ja) 1993-10-29
JP2964372B2 (ja) 1999-10-18

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