DE3381019D1 - Messen eines elektrischen signals mit pikosekundenaufloesung. - Google Patents

Messen eines elektrischen signals mit pikosekundenaufloesung.

Info

Publication number
DE3381019D1
DE3381019D1 DE8383900821T DE3381019T DE3381019D1 DE 3381019 D1 DE3381019 D1 DE 3381019D1 DE 8383900821 T DE8383900821 T DE 8383900821T DE 3381019 T DE3381019 T DE 3381019T DE 3381019 D1 DE3381019 D1 DE 3381019D1
Authority
DE
Germany
Prior art keywords
measuring
electrical signal
picosecond resolution
picosecond
resolution
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE8383900821T
Other languages
English (en)
Inventor
Janis A Valdmanis
Gerard Mourou
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
University of Rochester
Original Assignee
University of Rochester
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by University of Rochester filed Critical University of Rochester
Application granted granted Critical
Publication of DE3381019D1 publication Critical patent/DE3381019D1/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/02—Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/20—Cathode-ray oscilloscopes
    • G01R13/22—Circuits therefor
    • G01R13/34—Circuits for representing a single waveform by sampling, e.g. for very high frequencies
    • G01R13/347—Circuits for representing a single waveform by sampling, e.g. for very high frequencies using electro-optic elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/24—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices
    • G01R15/241—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption
    • G01R15/242—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption based on the Pockels effect, i.e. linear electro-optic effect

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
  • Optical Modulation, Optical Deflection, Nonlinear Optics, Optical Demodulation, Optical Logic Elements (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
DE8383900821T 1982-02-12 1983-01-21 Messen eines elektrischen signals mit pikosekundenaufloesung. Expired - Fee Related DE3381019D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US06/348,127 US4446425A (en) 1982-02-12 1982-02-12 Measurement of electrical signals with picosecond resolution
PCT/US1983/000100 WO1983002829A1 (en) 1982-02-12 1983-01-21 Measurement of electrical signals with picosecond resolution

Publications (1)

Publication Number Publication Date
DE3381019D1 true DE3381019D1 (de) 1990-02-01

Family

ID=23366755

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8383900821T Expired - Fee Related DE3381019D1 (de) 1982-02-12 1983-01-21 Messen eines elektrischen signals mit pikosekundenaufloesung.

Country Status (5)

Country Link
US (1) US4446425A (de)
EP (1) EP0101493B1 (de)
JP (1) JP2521656B2 (de)
DE (1) DE3381019D1 (de)
WO (1) WO1983002829A1 (de)

Families Citing this family (84)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4603293A (en) * 1984-03-27 1986-07-29 University Of Rochester Measurement of electrical signals with subpicosecond resolution
US4618819A (en) * 1984-03-27 1986-10-21 The University Of Rochester Measurement of electrical signals with subpicosecond resolution
US4681449A (en) * 1984-09-07 1987-07-21 Stanford University High speed testing of electronic circuits by electro-optic sampling
FR2574943B1 (fr) * 1984-12-18 1987-05-22 Thomson Csf Systeme analyseur de transitoires
US5053696A (en) * 1985-03-08 1991-10-01 The University Of Rochester Electro-electron oscilloscope
EP0197196A1 (de) * 1985-03-08 1986-10-15 The University Of Rochester Elektro-elektronenoptisches Oszilloskop zur Zeitauflösung elektrischer Wellenzüge im Picosekundenbereich
US4734576A (en) * 1986-05-01 1988-03-29 Tektronix, Inc. Electro-optic sampler
US4742577A (en) * 1986-06-09 1988-05-03 American Telephone And Telegraph Company, At&T Bell Laboratories Device and method for signal transmission and optical communications
US4786858A (en) * 1986-12-18 1988-11-22 Xerox Corporation Liquid crystal electrostatic voltmeter
US4910458A (en) * 1987-03-24 1990-03-20 Princeton Applied Research Corp. Electro-optic sampling system with dedicated electro-optic crystal and removable sample carrier
US4843586A (en) * 1987-04-28 1989-06-27 Hewlett-Packard Company Distributed sampling of electrical and optical signals using coded switched electrode travelling wave modulators
JPS63292495A (ja) * 1987-05-25 1988-11-29 Agency Of Ind Science & Technol 光−電気ハイブリット型連想記憶装置
JPH0695109B2 (ja) * 1987-05-30 1994-11-24 浜松ホトニクス株式会社 電圧検出装置
JP2527965B2 (ja) * 1987-05-31 1996-08-28 浜松ホトニクス株式会社 電圧検出装置
US4996475A (en) * 1987-05-31 1991-02-26 Hamamatsu Photonics Kabushiki Kaisha Electro-optic voltage detector having a transparent electrode
JP2571385B2 (ja) * 1987-05-31 1997-01-16 浜松ホトニクス株式会社 電圧検出装置
JPH0695111B2 (ja) * 1987-06-05 1994-11-24 浜松ホトニクス株式会社 電圧検出装置
US4857836A (en) * 1987-06-09 1989-08-15 Siemens Aktiengesellschaft Mechanical probe for optical measurement of electrical signals
JPH067240B2 (ja) * 1987-06-10 1994-01-26 浜松ホトニクス株式会社 光学的連想記憶装置
JPS63308572A (ja) * 1987-06-10 1988-12-15 Hamamatsu Photonics Kk 電圧検出装置
JPH0695113B2 (ja) * 1987-06-10 1994-11-24 浜松ホトニクス株式会社 電圧検出装置
US5526298A (en) * 1987-06-10 1996-06-11 Hamamatsu Photonics K.K. Optical associative memory
US5272434A (en) * 1987-06-20 1993-12-21 Schlumberger Technologies, Inc. Method and apparatus for electro-optically testing circuits
FR2633055B2 (fr) * 1987-07-31 1991-01-04 Schlumberger Ind Sa Perfectionnements aux testeurs de circuits
FR2621699B1 (fr) * 1987-07-31 1990-03-09 Schlumberger Ind Sa Perfectionnements aux testeurs de circuits
JPH0830720B2 (ja) * 1987-06-30 1996-03-27 浜松ホトニクス株式会社 電圧検出装置
EP0299432B1 (de) * 1987-07-13 1994-06-08 Hamamatsu Photonics K.K. Anordnung eines Spannungsdetektors
JPH0695114B2 (ja) * 1987-07-13 1994-11-24 浜松ホトニクス株式会社 電圧検出装置
EP0299465B1 (de) * 1987-07-14 1993-09-29 Hamamatsu Photonics K.K. Einrichtung zum Abtasten, Analysieren und Anzeigen eines elektrischen Signals
JPS6446659A (en) * 1987-08-17 1989-02-21 Hamamatsu Photonics Kk Voltage detector
JP2582588B2 (ja) * 1987-09-18 1997-02-19 浜松ホトニクス株式会社 多チャンネル電圧検出装置
JP2564148B2 (ja) * 1987-10-13 1996-12-18 浜松ホトニクス株式会社 電圧検出装置
US4975635A (en) * 1987-11-05 1990-12-04 Hironori Takahashi Voltage detector using a sampling type high-speed photodetector
JPH01121765A (ja) * 1987-11-05 1989-05-15 Hamamatsu Photonics Kk 電圧検出装置
US4851767A (en) * 1988-01-15 1989-07-25 International Business Machines Corporation Detachable high-speed opto-electronic sampling probe
JPH01259266A (ja) * 1988-04-08 1989-10-16 Hamamatsu Photonics Kk 電圧測定装置
US4891580A (en) * 1988-04-29 1990-01-02 American Telephone And Telegraph Co., At&T Bell Laboratories Electro-optic measurements of voltage waveforms on electrical conductors
JPH0769351B2 (ja) * 1988-05-30 1995-07-26 浜松ホトニクス株式会社 電気信号観測装置
JP2598458B2 (ja) * 1988-05-31 1997-04-09 浜松ホトニクス株式会社 電気信号観測装置
JPH01320473A (ja) * 1988-06-22 1989-12-26 Anritsu Corp 電気光学効果素子及びそれを用いた電気信号波形測定装置
US4873485A (en) * 1988-07-13 1989-10-10 The University Of Rochester Electro-optic signal measurement
US4875006A (en) * 1988-09-01 1989-10-17 Photon Dynamics, Inc. Ultra-high-speed digital test system using electro-optic signal sampling
US5095262A (en) * 1988-09-01 1992-03-10 Photon Dynamics, Inc. Electro-optic sampling system clock and stimulus pattern generator
JP2631138B2 (ja) * 1988-10-05 1997-07-16 浜松ホトニクス株式会社 電圧測定装置
US5142224A (en) * 1988-12-13 1992-08-25 Comsat Non-destructive semiconductor wafer probing system using laser pulses to generate and detect millimeter wave signals
DK0392830T3 (da) * 1989-04-12 1994-10-24 Hamamatsu Photonics Kk Fremgangsmåde og apparat til detektering af spænding
US4910454A (en) * 1989-05-23 1990-03-20 The University Of Rochester System for electrical signal sampling with ultrashort optical pulses
US4978910A (en) * 1989-06-26 1990-12-18 At&T Bell Laboratories Electrooptic apparatus for the measurement of ultrashort electrical signals
JP2556910B2 (ja) * 1989-11-30 1996-11-27 浜松ホトニクス株式会社 光強度変化検出装置
US5010250A (en) * 1990-01-09 1991-04-23 The University Of Rochester System for surface temperature measurement with picosecond time resolution
JP2986503B2 (ja) * 1990-03-09 1999-12-06 株式会社日立製作所 光方式直流電圧変成器
US5126661A (en) * 1990-10-18 1992-06-30 At&T Bell Laboratories Optical probing method and apparatus
JP2655748B2 (ja) * 1990-10-25 1997-09-24 浜松ホトニクス株式会社 電気波形測定方法及び装置
JP2742473B2 (ja) * 1991-03-26 1998-04-22 浜松ホトニクス株式会社 高速電圧測定装置
FR2680248B1 (fr) * 1991-08-09 1993-10-08 Slimane Loualiche Procede et systeme de mesure de signaux electrique a haute frequence par effet electro-optique.
GB2331149B (en) * 1991-11-20 1999-09-22 Marconi Gec Ltd An electrostatic voltage sensor
EP0559274A3 (en) * 1992-03-03 1994-06-29 Philips Nv Probe apparatus and method for measuring high-frequency signals
US5592101A (en) * 1992-07-24 1997-01-07 Hamamatsu Photonics K.K. Electro-optic apparatus for measuring an electric field of a sample
JP3167189B2 (ja) * 1992-08-31 2001-05-21 浜松ホトニクス株式会社 電圧測定装置
US5406194A (en) * 1992-09-21 1995-04-11 At&T Corp. Alx Ga1-x as probe for use in electro-optic sampling
JPH06265574A (ja) * 1993-03-15 1994-09-22 Hamamatsu Photonics Kk Ｅ−ｏプローブ
JP3323572B2 (ja) * 1993-03-15 2002-09-09 浜松ホトニクス株式会社 電圧測定装置のｅ−ｏプローブ位置決め方法
US5412330A (en) * 1993-06-16 1995-05-02 Tektronix, Inc. Optical module for an optically based measurement system
JPH0798329A (ja) * 1993-09-28 1995-04-11 Hamamatsu Photonics Kk Ｅ−ｏプローブ
JP3352239B2 (ja) * 1994-08-19 2002-12-03 浜松ホトニクス株式会社 電圧測定装置
JP3352543B2 (ja) * 1994-09-29 2002-12-03 浜松ホトニクス株式会社 電圧測定装置
JP2810976B2 (ja) * 1994-11-28 1998-10-15 工業技術院長 電気信号測定方法および装置
JP3500216B2 (ja) * 1995-02-07 2004-02-23 浜松ホトニクス株式会社 電圧測定装置
JP3500215B2 (ja) * 1995-02-07 2004-02-23 浜松ホトニクス株式会社 電圧測定装置
US5614834A (en) * 1995-03-15 1997-03-25 The United States Of America As Represented By The Secretary Of The Air Force Sampling receivers
US5952818A (en) * 1996-05-31 1999-09-14 Rensselaer Polytechnic Institute Electro-optical sensing apparatus and method for characterizing free-space electromagnetic radiation
WO1997045747A1 (en) * 1996-05-31 1997-12-04 Rensselaer Polytechnic Institute Electro-optical and magneto-optical sensing apparatus and method for characterizing free-space electromagnetic radiation
US5822103A (en) * 1996-12-19 1998-10-13 Massachusetts Institute Of Technology Signal generation using optical pulses
US5955875A (en) * 1997-01-31 1999-09-21 Massachusetts Institute Of Technology Linearized optical sampler
JPH11108962A (ja) * 1997-10-06 1999-04-23 Ando Electric Co Ltd 電気光学サンプリング装置
US6118396A (en) * 1997-12-24 2000-09-12 Massachusetts Institute Of Technology Optically sampling, demultiplexing, and A/D converting system with improved speed
FR2779528B1 (fr) 1998-06-05 2000-07-07 Commissariat Energie Atomique Echantillonneur electrique pour echantillonnage non simultane
DE19931268B4 (de) * 1998-07-07 2005-09-15 Advantest Corp. Optische Abtastvorrichtung
US6903891B1 (en) * 2003-11-24 2005-06-07 Seagate Technology Llc Photoconductive optical write driver for magnetic recording
US7551703B2 (en) * 2006-01-30 2009-06-23 Mcewan Technologies, Llc Rate locked loop radar timing system
US7446699B2 (en) * 2006-03-10 2008-11-04 Mcewan Thomas Edward Error corrector for radar timing systems
US20100038825A1 (en) * 2006-12-21 2010-02-18 Mcdonald Joel P Methods of forming microchannels by ultrafast pulsed laser direct-write processing
CN102879723B (zh) * 2012-09-26 2015-06-10 北京工业大学 一种电光晶体压电振铃效应测量装置及其测量方法
WO2018164110A1 (ja) * 2017-03-06 2018-09-13 国立大学法人大阪大学 電磁波測定装置および電磁波測定方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3304428A (en) * 1964-12-18 1967-02-14 Sylvania Electric Prod Transmission line light modulator
US3532891A (en) * 1967-12-26 1970-10-06 Trw Inc Means for stabilization of transverse pockels' cells
US3614451A (en) * 1968-08-19 1971-10-19 Ibm Sampling system utilizing electrooptic techniques
CH513413A (de) * 1970-02-25 1971-09-30 Bbc Brown Boveri & Cie Verfahren zur elektronischen Auswertung modulierter Lichtbündel
US3653742A (en) * 1970-06-24 1972-04-04 Itek Corp Electro-optic variable fresnel zone plate
US4016563A (en) * 1975-05-27 1977-04-05 Hughes Aircraft Company Method and apparatus for acousto-optic pulse compression
US4163205A (en) * 1978-01-26 1979-07-31 Barrow Daniel Acousto-optical device for removing bubble pulse from reflected sonar signal

Also Published As

Publication number Publication date
WO1983002829A1 (en) 1983-08-18
JP2521656B2 (ja) 1996-08-07
EP0101493A1 (de) 1984-02-29
JPS59500186A (ja) 1984-02-02
EP0101493A4 (de) 1984-06-14
US4446425A (en) 1984-05-01
EP0101493B1 (de) 1989-12-27

Similar Documents

Publication Publication Date Title
DE3381019D1 (de) Messen eines elektrischen signals mit pikosekundenaufloesung.
DE59008200D1 (de) Elektrische Messeinrichtung für die Laufzeitmessung eines elektrischen Signals.
AU507744B2 (en) Brownout signal indicator
DE3585441D1 (de) Infarktdetektor durch messung der koerpersignale.
AU503830B2 (en) Opto-electronic position measuring transducer
AU507870B2 (en) Geophysical signal measurement
JPS5332604A (en) Circuit for detecting receiving signal
JPS5295935A (en) Amplifier circuit for detecting signal
AU508894B2 (en) Peak signal detection
JPS5661858A (en) Signal detecting circuit
FR2518332B1 (fr) Circuit pour detecter la sequence de generation de signaux
NL8007081A (nl) Signaaldetectieschakeling.
GB2033180B (en) Signal detecting circuit
JPS5498199A (en) Signal fault detecting
GB2029588B (en) Detectors for detecting the presence of an electrical signal with predetermined characteristics
FR2492533B1 (fr) Generateur de signal de detection de position
AT360588B (de) Schaltungsanordnung zur detektion von stoer- signalen
AU510177B2 (en) Tone signal detecting circuit
NL184646C (nl) Signaalmeetapparaat.
DE3574909D1 (de) Geraet zum messen von schwachen stroemen mit hohem dynamikbereich.
ATE49060T1 (de) Messen eines elektrischen signals mit pikosekundenaufloesung.
IE771248L (en) Measuring electrical signals
HU181919B (en) Circuit arrangement for detecting fault of the coded standard signals
GB1558270A (en) Signal measuring circuit
SU617726A1 (ru) Измерительный ртутный зонд

Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee