FR2621699B1 - Perfectionnements aux testeurs de circuits - Google Patents

Perfectionnements aux testeurs de circuits

Info

Publication number
FR2621699B1
FR2621699B1 FR8710870A FR8710870A FR2621699B1 FR 2621699 B1 FR2621699 B1 FR 2621699B1 FR 8710870 A FR8710870 A FR 8710870A FR 8710870 A FR8710870 A FR 8710870A FR 2621699 B1 FR2621699 B1 FR 2621699B1
Authority
FR
France
Prior art keywords
circuit testers
testers
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR8710870A
Other languages
English (en)
Other versions
FR2621699A1 (fr
Inventor
Paul Meyrueix
Gerard Tremblay
Jean-Paul Vernhes
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Schlumberger SA
Original Assignee
Schlumberger SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Schlumberger SA filed Critical Schlumberger SA
Priority to FR8710870A priority Critical patent/FR2621699B1/fr
Priority to FR888808230A priority patent/FR2633055B2/fr
Priority to EP88401901A priority patent/EP0306359B1/fr
Priority to DE3853389T priority patent/DE3853389T2/de
Priority to CA 573410 priority patent/CA1330360C/fr
Priority to KR1019880009662A priority patent/KR890002671A/ko
Priority to JP63192597A priority patent/JP2843572B2/ja
Publication of FR2621699A1 publication Critical patent/FR2621699A1/fr
Application granted granted Critical
Publication of FR2621699B1 publication Critical patent/FR2621699B1/fr
Priority to US07/630,421 priority patent/US5272434A/en
Priority to US08/115,489 priority patent/US5394098A/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Electromagnetism (AREA)
  • Toxicology (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
FR8710870A 1987-06-20 1987-07-31 Perfectionnements aux testeurs de circuits Expired - Fee Related FR2621699B1 (fr)

Priority Applications (9)

Application Number Priority Date Filing Date Title
FR8710870A FR2621699B1 (fr) 1987-07-31 1987-07-31 Perfectionnements aux testeurs de circuits
FR888808230A FR2633055B2 (fr) 1987-07-31 1988-06-20 Perfectionnements aux testeurs de circuits
DE3853389T DE3853389T2 (de) 1987-07-31 1988-07-22 Vorrichtung zur Prüfüng einer Schaltung.
EP88401901A EP0306359B1 (fr) 1987-07-31 1988-07-22 Dispositif pour un test d'un circuit
CA 573410 CA1330360C (fr) 1987-07-31 1988-07-29 Testeur de circuits
KR1019880009662A KR890002671A (ko) 1987-07-31 1988-07-30 개량된 회로 시험기
JP63192597A JP2843572B2 (ja) 1987-07-31 1988-08-01 印刷回路のような回路を試験する装置
US07/630,421 US5272434A (en) 1987-06-20 1990-12-18 Method and apparatus for electro-optically testing circuits
US08/115,489 US5394098A (en) 1987-07-31 1993-09-01 Apparatus including electro-optical material for use in testing a circuit having voltage-bearing elements proximate a surface of a body

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8710870A FR2621699B1 (fr) 1987-07-31 1987-07-31 Perfectionnements aux testeurs de circuits

Publications (2)

Publication Number Publication Date
FR2621699A1 FR2621699A1 (fr) 1989-04-14
FR2621699B1 true FR2621699B1 (fr) 1990-03-09

Family

ID=9353758

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8710870A Expired - Fee Related FR2621699B1 (fr) 1987-06-20 1987-07-31 Perfectionnements aux testeurs de circuits

Country Status (1)

Country Link
FR (1) FR2621699B1 (fr)

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4147979A (en) * 1975-04-16 1979-04-03 Siemens Aktiengesellschaft Movable probe carrying optical waveguides with electro-optic or magneto-optic material for measuring electric or magnetic fields
US4242635A (en) * 1979-01-26 1980-12-30 The United States Of America As Represented By The Secretary Of The Air Force Apparatus and method for integrated circuit test analysis
US4446425A (en) * 1982-02-12 1984-05-01 The University Of Rochester Measurement of electrical signals with picosecond resolution
US4618819A (en) * 1984-03-27 1986-10-21 The University Of Rochester Measurement of electrical signals with subpicosecond resolution

Also Published As

Publication number Publication date
FR2621699A1 (fr) 1989-04-14

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Legal Events

Date Code Title Description
ST Notification of lapse
ST Notification of lapse
ST Notification of lapse