KR890007380U - 트랜지스터의 축적시간 테스트회로 - Google Patents

트랜지스터의 축적시간 테스트회로

Info

Publication number
KR890007380U
KR890007380U KR2019870015923U KR870015923U KR890007380U KR 890007380 U KR890007380 U KR 890007380U KR 2019870015923 U KR2019870015923 U KR 2019870015923U KR 870015923 U KR870015923 U KR 870015923U KR 890007380 U KR890007380 U KR 890007380U
Authority
KR
South Korea
Prior art keywords
test circuit
accumulation time
time test
transistor
transistor accumulation
Prior art date
Application number
KR2019870015923U
Other languages
English (en)
Other versions
KR890009281Y1 (ko
Inventor
류근배
Original Assignee
삼성전자주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 삼성전자주식회사 filed Critical 삼성전자주식회사
Priority to KR2019870015923U priority Critical patent/KR890009281Y1/ko
Publication of KR890007380U publication Critical patent/KR890007380U/ko
Application granted granted Critical
Publication of KR890009281Y1 publication Critical patent/KR890009281Y1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
KR2019870015923U 1987-09-18 1987-09-18 트랜지스터의 축적시간 테스트회로 KR890009281Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019870015923U KR890009281Y1 (ko) 1987-09-18 1987-09-18 트랜지스터의 축적시간 테스트회로

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019870015923U KR890009281Y1 (ko) 1987-09-18 1987-09-18 트랜지스터의 축적시간 테스트회로

Publications (2)

Publication Number Publication Date
KR890007380U true KR890007380U (ko) 1989-05-16
KR890009281Y1 KR890009281Y1 (ko) 1989-12-20

Family

ID=19268089

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019870015923U KR890009281Y1 (ko) 1987-09-18 1987-09-18 트랜지스터의 축적시간 테스트회로

Country Status (1)

Country Link
KR (1) KR890009281Y1 (ko)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100446390B1 (ko) * 1997-12-22 2004-12-03 비오이 하이디스 테크놀로지 주식회사 액정표시소자의트랜지스터의동작체크회로

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100446390B1 (ko) * 1997-12-22 2004-12-03 비오이 하이디스 테크놀로지 주식회사 액정표시소자의트랜지스터의동작체크회로

Also Published As

Publication number Publication date
KR890009281Y1 (ko) 1989-12-20

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Legal Events

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Payment date: 19970829

Year of fee payment: 9

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