FR2680248B1 - Procede et systeme de mesure de signaux electrique a haute frequence par effet electro-optique. - Google Patents

Procede et systeme de mesure de signaux electrique a haute frequence par effet electro-optique.

Info

Publication number
FR2680248B1
FR2680248B1 FR9110164A FR9110164A FR2680248B1 FR 2680248 B1 FR2680248 B1 FR 2680248B1 FR 9110164 A FR9110164 A FR 9110164A FR 9110164 A FR9110164 A FR 9110164A FR 2680248 B1 FR2680248 B1 FR 2680248B1
Authority
FR
France
Prior art keywords
electro
high frequency
electric signals
frequency electric
optical effect
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR9110164A
Other languages
English (en)
Other versions
FR2680248A1 (fr
Inventor
Slimane Loualiche
Fabrice Clerot
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to FR9110164A priority Critical patent/FR2680248B1/fr
Priority to US07/922,207 priority patent/US5256968A/en
Priority to DE4226220A priority patent/DE4226220A1/de
Priority to JP4232695A priority patent/JPH05264609A/ja
Publication of FR2680248A1 publication Critical patent/FR2680248A1/fr
Application granted granted Critical
Publication of FR2680248B1 publication Critical patent/FR2680248B1/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/24—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices
    • G01R15/241—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Electromagnetism (AREA)
  • Toxicology (AREA)
  • General Engineering & Computer Science (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Measurement Of Current Or Voltage (AREA)
FR9110164A 1991-08-09 1991-08-09 Procede et systeme de mesure de signaux electrique a haute frequence par effet electro-optique. Expired - Fee Related FR2680248B1 (fr)

Priority Applications (4)

Application Number Priority Date Filing Date Title
FR9110164A FR2680248B1 (fr) 1991-08-09 1991-08-09 Procede et systeme de mesure de signaux electrique a haute frequence par effet electro-optique.
US07/922,207 US5256968A (en) 1991-08-09 1992-07-30 Measurement of high-frequency electrical signals by electro-optical effect
DE4226220A DE4226220A1 (de) 1991-08-09 1992-08-07 Verfahren und system zur messung von elektrischen hochfrequenz- und breitbandfrequenz-signalen durch elektro-optischen effekt
JP4232695A JPH05264609A (ja) 1991-08-09 1992-08-10 高周波電気信号のエレクトロオプティカル効果による測定方法およびシステム

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR9110164A FR2680248B1 (fr) 1991-08-09 1991-08-09 Procede et systeme de mesure de signaux electrique a haute frequence par effet electro-optique.

Publications (2)

Publication Number Publication Date
FR2680248A1 FR2680248A1 (fr) 1993-02-12
FR2680248B1 true FR2680248B1 (fr) 1993-10-08

Family

ID=9416085

Family Applications (1)

Application Number Title Priority Date Filing Date
FR9110164A Expired - Fee Related FR2680248B1 (fr) 1991-08-09 1991-08-09 Procede et systeme de mesure de signaux electrique a haute frequence par effet electro-optique.

Country Status (4)

Country Link
US (1) US5256968A (fr)
JP (1) JPH05264609A (fr)
DE (1) DE4226220A1 (fr)
FR (1) FR2680248B1 (fr)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3307723B2 (ja) * 1993-07-27 2002-07-24 浜松ホトニクス株式会社 位相差検出方法、位相差検出回路、および位相差検出装置
JP3352239B2 (ja) * 1994-08-19 2002-12-03 浜松ホトニクス株式会社 電圧測定装置
EP0702236A3 (fr) * 1994-09-19 1996-06-05 Hamamatsu Photonics Kk Dispositif de mesure de tension
US5952818A (en) * 1996-05-31 1999-09-14 Rensselaer Polytechnic Institute Electro-optical sensing apparatus and method for characterizing free-space electromagnetic radiation
CA2255762C (fr) * 1996-05-31 2002-06-25 Rensselaer Polytechnic Institute Dispositif electro-optique et magneto-optique et procede pour deceler le rayonnement electromagnetique dans l'espace libre
JP3406491B2 (ja) * 1997-10-06 2003-05-12 安藤電気株式会社 電気光学サンプリングオシロスコープ
JP2002214050A (ja) * 2000-12-01 2002-07-31 Agilent Technol Inc 光サンプリング装置
DE10297037B4 (de) * 2001-07-02 2008-01-17 Advantest Corp. Ausbreitungsmessvorrichtung und Ausbreitungsmessverfahren
US6826207B2 (en) * 2001-12-17 2004-11-30 Peleton Photonic Systems Inc. Multi-wavelength laser source based on two optical laser beat signal and method
US7295584B2 (en) * 2001-12-17 2007-11-13 Peleton Photonic Systems System and method for generating multi-wavelength laser source using highly nonlinear fiber
US7563022B2 (en) * 2003-11-28 2009-07-21 Ontario Power Generation Inc. Methods and apparatus for inspecting reactor pressure tubes
CN103969573B (zh) * 2014-05-23 2016-08-17 国家电网公司 一种电力调度控制板维修检测平台
CN105576495B (zh) * 2016-03-14 2019-01-29 中国科学院武汉物理与数学研究所 基于楔角电光晶体的剩余幅度调制稳定装置
JP6940839B2 (ja) * 2017-03-06 2021-09-29 国立大学法人大阪大学 電磁波測定装置および電磁波測定方法
CN110412538B (zh) * 2019-01-29 2021-06-04 苏州溯光科技信息有限公司 线性扫频激光源及激光雷达

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4446425A (en) * 1982-02-12 1984-05-01 The University Of Rochester Measurement of electrical signals with picosecond resolution
JPS5918923A (ja) * 1982-07-23 1984-01-31 Toshiba Corp 複屈折測定装置
US4618819A (en) * 1984-03-27 1986-10-21 The University Of Rochester Measurement of electrical signals with subpicosecond resolution
US4891580A (en) * 1988-04-29 1990-01-02 American Telephone And Telegraph Co., At&T Bell Laboratories Electro-optic measurements of voltage waveforms on electrical conductors
FR2634560B1 (fr) * 1988-07-19 1990-11-30 France Etat Armement Systemes de mesure electro-optiques pour l'analyse frequentielle de signaux a tres large bande

Also Published As

Publication number Publication date
DE4226220A1 (de) 1993-04-01
JPH05264609A (ja) 1993-10-12
FR2680248A1 (fr) 1993-02-12
US5256968A (en) 1993-10-26

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