FR2680248B1 - Procede et systeme de mesure de signaux electrique a haute frequence par effet electro-optique. - Google Patents
Procede et systeme de mesure de signaux electrique a haute frequence par effet electro-optique.Info
- Publication number
- FR2680248B1 FR2680248B1 FR9110164A FR9110164A FR2680248B1 FR 2680248 B1 FR2680248 B1 FR 2680248B1 FR 9110164 A FR9110164 A FR 9110164A FR 9110164 A FR9110164 A FR 9110164A FR 2680248 B1 FR2680248 B1 FR 2680248B1
- Authority
- FR
- France
- Prior art keywords
- electro
- high frequency
- electric signals
- frequency electric
- optical effect
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/302—Contactless testing
- G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
- G01R15/24—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices
- G01R15/241—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Electromagnetism (AREA)
- Toxicology (AREA)
- General Engineering & Computer Science (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Spectrometry And Color Measurement (AREA)
- Measurement Of Current Or Voltage (AREA)
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR9110164A FR2680248B1 (fr) | 1991-08-09 | 1991-08-09 | Procede et systeme de mesure de signaux electrique a haute frequence par effet electro-optique. |
US07/922,207 US5256968A (en) | 1991-08-09 | 1992-07-30 | Measurement of high-frequency electrical signals by electro-optical effect |
DE4226220A DE4226220A1 (de) | 1991-08-09 | 1992-08-07 | Verfahren und system zur messung von elektrischen hochfrequenz- und breitbandfrequenz-signalen durch elektro-optischen effekt |
JP4232695A JPH05264609A (ja) | 1991-08-09 | 1992-08-10 | 高周波電気信号のエレクトロオプティカル効果による測定方法およびシステム |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR9110164A FR2680248B1 (fr) | 1991-08-09 | 1991-08-09 | Procede et systeme de mesure de signaux electrique a haute frequence par effet electro-optique. |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2680248A1 FR2680248A1 (fr) | 1993-02-12 |
FR2680248B1 true FR2680248B1 (fr) | 1993-10-08 |
Family
ID=9416085
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR9110164A Expired - Fee Related FR2680248B1 (fr) | 1991-08-09 | 1991-08-09 | Procede et systeme de mesure de signaux electrique a haute frequence par effet electro-optique. |
Country Status (4)
Country | Link |
---|---|
US (1) | US5256968A (fr) |
JP (1) | JPH05264609A (fr) |
DE (1) | DE4226220A1 (fr) |
FR (1) | FR2680248B1 (fr) |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3307723B2 (ja) * | 1993-07-27 | 2002-07-24 | 浜松ホトニクス株式会社 | 位相差検出方法、位相差検出回路、および位相差検出装置 |
JP3352239B2 (ja) * | 1994-08-19 | 2002-12-03 | 浜松ホトニクス株式会社 | 電圧測定装置 |
EP0702236A3 (fr) * | 1994-09-19 | 1996-06-05 | Hamamatsu Photonics Kk | Dispositif de mesure de tension |
US5952818A (en) * | 1996-05-31 | 1999-09-14 | Rensselaer Polytechnic Institute | Electro-optical sensing apparatus and method for characterizing free-space electromagnetic radiation |
CA2255762C (fr) * | 1996-05-31 | 2002-06-25 | Rensselaer Polytechnic Institute | Dispositif electro-optique et magneto-optique et procede pour deceler le rayonnement electromagnetique dans l'espace libre |
JP3406491B2 (ja) * | 1997-10-06 | 2003-05-12 | 安藤電気株式会社 | 電気光学サンプリングオシロスコープ |
JP2002214050A (ja) * | 2000-12-01 | 2002-07-31 | Agilent Technol Inc | 光サンプリング装置 |
DE10297037B4 (de) * | 2001-07-02 | 2008-01-17 | Advantest Corp. | Ausbreitungsmessvorrichtung und Ausbreitungsmessverfahren |
US6826207B2 (en) * | 2001-12-17 | 2004-11-30 | Peleton Photonic Systems Inc. | Multi-wavelength laser source based on two optical laser beat signal and method |
US7295584B2 (en) * | 2001-12-17 | 2007-11-13 | Peleton Photonic Systems | System and method for generating multi-wavelength laser source using highly nonlinear fiber |
US7563022B2 (en) * | 2003-11-28 | 2009-07-21 | Ontario Power Generation Inc. | Methods and apparatus for inspecting reactor pressure tubes |
CN103969573B (zh) * | 2014-05-23 | 2016-08-17 | 国家电网公司 | 一种电力调度控制板维修检测平台 |
CN105576495B (zh) * | 2016-03-14 | 2019-01-29 | 中国科学院武汉物理与数学研究所 | 基于楔角电光晶体的剩余幅度调制稳定装置 |
JP6940839B2 (ja) * | 2017-03-06 | 2021-09-29 | 国立大学法人大阪大学 | 電磁波測定装置および電磁波測定方法 |
CN110412538B (zh) * | 2019-01-29 | 2021-06-04 | 苏州溯光科技信息有限公司 | 线性扫频激光源及激光雷达 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4446425A (en) * | 1982-02-12 | 1984-05-01 | The University Of Rochester | Measurement of electrical signals with picosecond resolution |
JPS5918923A (ja) * | 1982-07-23 | 1984-01-31 | Toshiba Corp | 複屈折測定装置 |
US4618819A (en) * | 1984-03-27 | 1986-10-21 | The University Of Rochester | Measurement of electrical signals with subpicosecond resolution |
US4891580A (en) * | 1988-04-29 | 1990-01-02 | American Telephone And Telegraph Co., At&T Bell Laboratories | Electro-optic measurements of voltage waveforms on electrical conductors |
FR2634560B1 (fr) * | 1988-07-19 | 1990-11-30 | France Etat Armement | Systemes de mesure electro-optiques pour l'analyse frequentielle de signaux a tres large bande |
-
1991
- 1991-08-09 FR FR9110164A patent/FR2680248B1/fr not_active Expired - Fee Related
-
1992
- 1992-07-30 US US07/922,207 patent/US5256968A/en not_active Expired - Fee Related
- 1992-08-07 DE DE4226220A patent/DE4226220A1/de not_active Withdrawn
- 1992-08-10 JP JP4232695A patent/JPH05264609A/ja not_active Withdrawn
Also Published As
Publication number | Publication date |
---|---|
DE4226220A1 (de) | 1993-04-01 |
JPH05264609A (ja) | 1993-10-12 |
FR2680248A1 (fr) | 1993-02-12 |
US5256968A (en) | 1993-10-26 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
CL | Concession to grant licences | ||
ST | Notification of lapse |